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Jan 2011

Volume 29, Issue 1, Articles (01xxxx)

Issue Cover Spotlight Figure

J. Vac. Sci. Technol. A 29, 010801 (2011); http://dx.doi.org/10.1116/1.3517478 (25 pages)

V. M. Donnelly, J. Guha, and L. Stafford
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Effect of vacuum ultraviolet and ultraviolet irradiation on mobile charges in the bandgap of low-k-porous organosilicate dielectrics

H. Sinha, M. T. Nichols, A. Sehgal, M. Tomoyasu, N. M. Russell, G. A. Antonelli, Y. Nishi, and J. L. Shohet

J. Vac. Sci. Technol. A 29, 010601 (2011); http://dx.doi.org/10.1116/1.3520433 (4 pages) | Cited 5 times

Online Publication Date: 3 January 2011

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Capacitance-voltage (C-V) measurements are used to determine the effect of vacuum ultraviolet (VUV) and ultraviolet irradiation on mobile charges in porous low-k organosilicate (SiCOH) dielectrics. Hysteresis in the C-V characteristics shows that VUV irradiation increases the number of mobile charges in the dielectric. This is because VUV photons excite the trapped electrons from defect states to make them mobile carriers. Conversely UV reverses this effect by reducing the mobile charges through photoemission of free electrons and repopulation of trap states. Thus UV irradiation can be used to improve the electrical properties of plasma-processed dielectrics that are subjected to VUV irradiation.
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73.61.Ph Polymers; organic compounds
77.55.Bh Low-permittivity dielectric films
73.50.Gr Charge carriers: generation, recombination, lifetime, trapping, mean free paths
72.40.+w Photoconduction and photovoltaic effects
79.60.Fr Polymers; organic compounds
71.55.Ht Other nonmetals
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Critical review: Plasma-surface reactions and the spinning wall method

V. M. Donnelly, J. Guha, and L. Stafford

J. Vac. Sci. Technol. A 29, 010801 (2011); http://dx.doi.org/10.1116/1.3517478 (25 pages) | Cited 6 times

Online Publication Date: 3 January 2011

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This article reviews methods for studying reactions of atoms and small molecules on substrates and chamber walls that are immersed in a plasma, a relatively unexplored, yet very important area of plasma science and technology. Emphasis is placed on the “spinning wall” technique. With this method, a cylindrical section of the wall of the plasma reactor is rotated, and the surface is periodically exposed to the plasma and then to a differentially pumped mass spectrometer, to an Auger electron spectrometer, and, optionally, to a beam of additional reactants or surface coatings. Reactants impinging on the surface can stick and react over time scales that are comparable to the substrate rotation period, which can be varied from ∼ 0.5 to 40 ms. Langmuir–Hinshelwood reaction probabilities can be derived from a measurement of the absolute desorption product yields as a function of the substrate rotation frequency. Auger electron spectroscopy allows the plasma-immersed surface to be monitored during plasma operation. This measurement is critical, since wall “conditioning” in the plasma changes the reaction probabilities. Mass spectrometer cracking patterns are used to identify simple desorption products such as Cl2, O2, ClO, and ClO2. Desorption products also produce a measurable pressure rise in the second differentially pumped chamber that can be used to obtain absolute desorption yields. The surface can also be coated with films that can be deposited by sputtering a target in the plasma or by evaporating material from a Knudsen cell in the differentially pumped wall chamber. Here, the authors review this new spinning wall technique in detail, describing both experimental issues and data analysis methods and interpretations. The authors have used the spinning wall method to study the recombination of Cl and O on plasma-conditioned anodized aluminum and stainless steel surfaces. In oxygen or chlorine plasmas, these surfaces become coated with a layer containing Si, Al, and O, due to slow erosion of the reactor materials, in addition to Cl in chlorine plasmas. Similar, low recombination probabilities were found for Cl and O on anodized Al versus stainless steel surfaces, consistent with the similar chemical composition of the layer that forms on these surfaces after long exposure to the plasma. In chlorine plasmas, weakly adsorbed Cl2 was found to inhibit Cl recombination, hence the Cl recombination probability decreases with increasing Cl2-to-Cl number density ratios in the plasma. In mixed Cl2/O2 plasmas, Cl and O recombine to form Cl2 and O2 with probabilities that are similar to those in pure chlorine or oxygen plasmas, but in addition, ClO and ClO2 form on the surface and desorb from the wall. These and other results, including the catalytic enhancement of O recombination by monolayer amounts of Cu, are reviewed.
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52.40.Hf Plasma-material interactions; boundary layer effects
52.77.Dq Plasma-based ion implantation and deposition
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Formation of pyrite (FeS2) thin films by thermal sulfurization of dc magnetron sputtered iron

R. J. Soukup, P. Prabukanthan, N. J. Ianno, A. Sarkar, C. A. Kamler, and D. G. Sekora

J. Vac. Sci. Technol. A 29, 011001 (2011); http://dx.doi.org/10.1116/1.3517739 (5 pages) | Cited 2 times

Online Publication Date: 3 January 2011

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Iron films deposited by direct current magnetron sputtering onto glass substrates were converted into FeS2 films by thermal sulfurization. Experiments were carried out to optimize the sulfurization process, and the formation of FeS2 thin films was investigated under different annealing temperatures and times. High quality FeS2 films were fabricated using this process, and single phase pyrite films were obtained after sulfurization in a sulfur and nitrogen atmosphere at 450 °C for 1 h. Film crystallinity and phase identification were determined by using x-ray diffraction. The cubic phase pyrite films prepared were p-type, and scanning electron microscopy studies exhibited a homogeneous surface of pyrite. The authors have found that the best Ohmic contact for their pyrite thin films, using inexpensive metals, was Ni. The following were chosen for the study: Al, Mo, Fe, and Ni, and the one that led to the lowest resistance, 333 Ω, was Ni.
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68.55.ag Semiconductors
81.15.Cd Deposition by sputtering
73.40.Ns Metal-nonmetal contacts
73.61.Le Other inorganic semiconductors

Flow of binary gas mixtures through small sampling orifices

Rainer Johnsen and B. K. Chatterjee

J. Vac. Sci. Technol. A 29, 011002 (2011); http://dx.doi.org/10.1116/1.3520637 (6 pages)

Online Publication Date: 3 January 2011

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Species-dependent density changes in binary gas mixtures flowing through a small thin orifice (thickness ∼ 10% of diameter) have been studied experimentally using an ion drift tube, covering a limited range of the transition regime from molecular to hydrodynamic flow. The observed density changes are found to depend strongly on the mass ratio of the two flowing gases. A semiempirical formula that estimates the density changes has been derived by fitting the experimental data.
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47.45.Dt Free molecular flows
47.11.-j Computational methods in fluid dynamics

Synchrotron photoemission studies on reconstructed strained surfaces

Hidong Kim, Huiting Li, Ganbat Duvjir, and Jae M. Seo

J. Vac. Sci. Technol. A 29, 011003 (2011); http://dx.doi.org/10.1116/1.3520639 (5 pages)

Online Publication Date: 3 January 2011

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Recently, based on scanning tunneling microscopy studies of the reconstructed Si(5 5 12)−2×1 surface, it has been suggested that its unit cell simply consists of four kinds of one-dimensional (1D) structures: π-bonded (π) chain, honeycomb (H) chain, tetramer (T) row, and dimer-adatom (D-A) row. In the present study, by angle-resolved ultraviolet photoelectron spectroscopy, it has been found out that the Si(5 5 12)−2×1 surface has two kinds of surface states, one with a negligible dispersion originating from row structures (T/D-A) and the other with a strong dispersion originating from chain structures (π/H). Also, the Si 2p core-level spectrum shows at least two kinds of surface components, one with 0.23 eV higher binding energy originating from upward-relaxed surface atoms and subsurface atoms, and the other with 0.52 eV lower binding energy originating from downward-relaxed surface atoms. It can be realized that these spectroscopic results quantitively match with the structural model of Si(5 5 12)−2×1 having four kinds of 1D structures.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
73.20.At Surface states, band structure, electron density of states
71.20.Mq Elemental semiconductors
71.15.Nc Total energy and cohesive energy calculations

Structure and properties of ZrN coatings deposited by high power impulse magnetron sputtering technology

Y. P. Purandare, A. P. Ehiasarian, and P. Eh. Hovsepian

J. Vac. Sci. Technol. A 29, 011004 (2011); http://dx.doi.org/10.1116/1.3520640 (6 pages)

Online Publication Date: 3 January 2011

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Monolayer ZrN coatings were deposited exclusively by the novel high power impulse magnetron sputtering (HIPIMS) technology in an industrial scale physical vapour deposition (PVD) machine (HTC-1000-4 target system). Coatings were deposited on 1 μm polished M2 high speed steel, on 304L stainless steel (SS), and on Si (100) specimens. Prior to deposition, HIPIMS plasma sustained on a zirconium (Zr) target was utilized to pretreat the specimens. Coatings were deposited at 400 °C in a mixed N2 and Ar atmosphere using 2 magnetrons in HIPIMS mode and at three different substrate bias voltages (Ubias) keeping all other process parameters constant. The thicknesses of the coatings measured by the ball cratering technique were in the ranges of 1.84, 1.96, and 2.13 μm at bias voltages of −95, −75, and −65 V, respectively, where the difference in thickness can be attributed to the resputtering effect. X-ray diffraction experiments on SS specimens revealed a dominating 111 texture for all three coatings irrespective of the bias voltage. Cross-sectional transmission electron microscopy revealed extremely dense coating structures at all bias voltages, similar to the transition zone structure (zone T) reported by Thornton. The −95 bias voltage coatings appeared extremely smooth on the top and with no dome shaped structures often associated with low ion bombardment during deposition. HIPIMS pretreatment leads to high adhesion (LC) of the coatings to the substrate. A continuous ductile perforation of the coating was observed at progressive loads greater than 65 N; however, no spallation of the coating was observed up to loads of 100 N. High values of hardness (40.4 GPa), Young’s modulus (424 GPa), and compressive stress (10 GPa) were recorded for coatings deposited at −95 BV. The hardness and internal stress of the coating were found increasing with more negative bias voltages. All the coatings exhibited high dry sliding wear resistance (KC) in the range 6×10−15 m3 N−1 m−1. Cross-sectional transmission electron microscopy and atomic force microscopy analyses have been used to study the effect of ion bombardment obtained from HIPIMS on the structure of the coatings.
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68.55.jm Texture
68.60.Bs Mechanical and acoustical properties
81.15.Cd Deposition by sputtering
81.65.-b Surface treatments
81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
81.40.Jj Elasticity and anelasticity, stress-strain relations

Rolling contact fatigue in high vacuum using ion plated nickel-copper-silver solid lubrication

Mike Danyluk and Anoop Dhingra

J. Vac. Sci. Technol. A 29, 011005 (2011); http://dx.doi.org/10.1116/1.3520641 (10 pages) | Cited 1 time

Online Publication Date: 3 January 2011

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Ion plated, nickel-copper-silver coated steel ball bearings that were tested in rolling contact fatigue (RCF) experiments in high vacuum are presented in this article. ANSI T5 ball bearings were coated with approximately 10 nm of nickel-copper followed by 100 nm of silver using a dc ion plating process. The balls were then tested for RCF in vacuum in the 10−7 Torr range at 130 Hz rotational speed and at 4.1 GPa Hertzian contact stress. The significance of this work is in the extension of RCF testing to an ultrahigh vacuum (UHV) application using silver as a lubricant instead of oil. The effects of pressure and voltage on the ion plating process were also investigated using scanning electron microscopy and RCF life testing in UHV. Test results with a ball size of 5/16 in. in UHV show that deposition at voltages greater than 2.5 kV shortens the RCF life and introduces a unique failure mode. Voltage and pressure fluctuations during the deposition process result in significant thickness monitor measurement errors as well. A regulator control scheme that minimizes the process pressure overshoot is also simulated.
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81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
81.15.Jj Ion and electron beam-assisted deposition; ion plating
81.65.-b Surface treatments
81.40.Pq Friction, lubrication, and wear
83.50.-v Deformation and flow
62.20.me Fatigue

Spatially resolved measurements of ion density and electron temperature in a dual-frequency capacitively coupled plasma by complete floating double probe technique

Xiang-Zhan Jiang, Yong-Xin Liu, Shuo Yang, Wen-Qi Lu, Zhen-Hua Bi, Xiao-Song Li, and You-Nian Wang

J. Vac. Sci. Technol. A 29, 011006 (2011); http://dx.doi.org/10.1116/1.3520644 (6 pages)

Online Publication Date: 3 January 2011

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Spatially resolved measurements of the ion density and electron temperature in a dual-frequency capacitively coupled Ar discharge plasma are performed with a newly developed complete floating double probe. Axial and radial distributions of the ion density and electron temperature under various high-frequency (HF) power and gas pressure were studied in detail. Both the ion density and the electron temperature increased with increasing HF power. With increasing gas pressure from 1.3 to 9.3 Pa, the radial profile of ion density below the driven electrode experienced a change from “bimodal” to “unimodal” shape, with better uniformity being achieved at the optimal pressure of about 5 Pa. In addition, changing the axial profile of ion density was also observed with the peak shift toward the powered electrode at higher pressures. The measured results showed satisfying consistency with that of improved two dimensional fluid simulations.
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52.80.Pi High-frequency and RF discharges
52.25.Tx Emission, absorption, and scattering of particles
52.65.-y Plasma simulation
52.40.Mj Particle beam interactions in plasmas

Design and fabrication of a novel microgripper with four-point contact fingers

Xiaohu Zheng, Ji-Kwan Kim, and Dong-Weon Lee

J. Vac. Sci. Technol. A 29, 011007 (2011); http://dx.doi.org/10.1116/1.3520645 (6 pages)

Online Publication Date: 3 January 2011

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A novel microgripper with four-point contact fingers is introduced. It consists of four fingers suspended on the diagonal lines of a square frame in the end of the main cantilever structure located on the silicon substrate. The initial gap between the tips is 20 μm and can be decreased depending on the fabrication techniques. Lightly doped silicon works as the electric-thermal resistor to make the fingers deflect according to the different expansions between the metal layer covered on the top surface and the silicon substrate. The V-grooved pattern on the finger surface could help the finger to generate a larger vertical displacement. The finger tip could move from a “closed” position to an open one by regulating the driven voltage so as to grip and elevate the micro-object. A mathematical model of heat transfer is built up to analyze the temperature contribution of the finger. The displacement and temperature distribution on the finger was simulated by using finite element method software. Then the key fabrication process and its working performance were experimentally evaluated. A satisfactory match between experimental test and finite element simulations was obtained. The results indicate that the new microgripper has a good performance and further potential application in micromanipulation.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
81.16.Rf Micro- and nanoscale pattern formation
06.60.Sx Positioning and alignment; manipulating, remote handling
02.70.Dh Finite-element and Galerkin methods

Correlation of plasma characteristics to etch rate and via sidewall angle in a deep reactive ion etch system using Langmuir probe and optical emission spectroscopy

S. P. Koirala, I. Awaah, S. L. Burkett, and M. H. Gordon

J. Vac. Sci. Technol. A 29, 011008 (2011); http://dx.doi.org/10.1116/1.3520646 (6 pages)

Online Publication Date: 3 January 2011

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A Langmuir probe and optical emission spectroscopy were used in a deep reactive ion etch system to correlate plasma parameters (atomic fluorine and argon emission, electron density, ion density, and electron average energy) with the etch rate and via sidewall angle. All data were obtained for coil powers ranging from 200 to 800 W, platen powers ranging from 7 to 16 W, and pressure ranging from 3.8 to 62 mTorr with constant SF6 and Ar flow rates of 112 and 18 SCCM (SCCM denotes cubic centimeter per minute at STP), respectively. Results indicate that there is a correlation with etch rate for all plasma parameters except for argon emission. For argon emission, the etch rate exhibits a double-valued relation where the etch rate can either increase or decrease with increasing argon emission intensity due to changes in pressure which affect the energy coupling efficiency. As expected, the etch rate increases for measured increases in fluorine emission, electron density, and ion density. The etch rate, however, decreases with increasing average electron energy due to collision processes. In contrast, no correlation is observed between any of the measured plasma parameters with sidewall angle. The last result is consistent with the idea that sidewall angle is primarily controlled by the passivation cycle as opposed to the etching cycle, where all the authors’ data were obtained.
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52.77.Bn Etching and cleaning
52.70.Kz Optical (ultraviolet, visible, infrared) measurements
52.70.Ds Electric and magnetic measurements
52.25.-b Plasma properties
52.20.Hv Atomic, molecular, ion, and heavy-particle collisions

Direct growth of hexagonal InN films on 6H-SiC by radio-frequency metal-organic molecular-beam epitaxy

Wei-Chun Chen, Shou-Yi Kuo, Chien-Nan Hsiao, and Din Ping Tsai

J. Vac. Sci. Technol. A 29, 011009 (2011); http://dx.doi.org/10.1116/1.3528538 (4 pages)

Online Publication Date: 4 January 2011

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Wurtzite InN films were prepared on a 6H-SiC substrate by a self-designed plasma-assisted metal-organic molecular-beam epitaxy system without a buffer layer. In this article, the authors investigate the structural and optical properties of InN films grown on a 6H-SiC substrate. The crystallinity and microstructure of the thin film were further characterized by x-ray diffraction (XRD), field-emission scanning-electron microscopy, and transmission-electron microscopy. Electrical and optical properties were evaluated by Hall and photoluminescence (PL) measurements. XRD results indicate that InN film grown at 500 °C is epitaxially grown along the c-axis orientation. The two-dimensional growth mode is clearly shown in scanning-electron microscope images. Room-temperature PL spectra show that the emission peak is located at ∼ 0.83 eV due to the Burstein–Moss effect. In addition, the crystalline InN samples crack and peel away from the substrate at elevated growth temperature. This phenomenon may be attributed to lattice mismatch and grain coalescence while increasing the growth temperature. The narrow window of the growth temperature plays an important role in engineering the InN epitaxial growth.
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81.05.Ea III-V semiconductors
81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy
78.66.Fd III-V semiconductors
73.61.Ey III-V semiconductors
68.60.Bs Mechanical and acoustical properties
61.66.Fn Inorganic compounds

Aspects of fast load lock designs in vacuum manufacturing equipment

M. D. Bijker, R. C. M. Bosch, and A. Conrad

J. Vac. Sci. Technol. A 29, 011010 (2011); http://dx.doi.org/10.1116/1.3528543 (7 pages)

Online Publication Date: 4 January 2011

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In order to increase throughput on vacuum deposition tools, fast load locking strategies are essential. In this article, an overview of fast two pumpdown strategies is discussed. Both a solution based on a turbo pump as well as a new type of booster pump is reviewed. A detailed theoretical description is given, dealing with pump speed calculations at continuous flow, free molecular flow, and the transition pressure region, which is very important to determine the final load lock pumpdown time.
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07.30.Cy Vacuum pumps
81.15.-z Methods of deposition of films and coatings; film growth and epitaxy
42.79.Wc Optical coatings

On the stability of capacitance-diaphragm gauges with ceramic membranes

K. Jousten and Simon Naef

J. Vac. Sci. Technol. A 29, 011011 (2011); http://dx.doi.org/10.1116/1.3529023 (7 pages)

Online Publication Date: 4 January 2011

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Capacitance-diaphragm gauges with ceramic membranes or diaphragms have been on the market for about 15 years. The long-term stability of these devices with full scales from 13 Pa to 133 kPa has been tested in the past decade by the calibration of gauges used by the manufacturer as reference gauges on the production line. These reference gauges were calibrated annually on a primary standard. It was found that the reproducibility of these devices depends on their full scale. For 13 Pa, the annual reproducibility near full scale varied between 0.02% and 0.04%, and for full scales of 133 Pa and higher, it varied between 0.005% and 0.03% of full scale. The reproducibility of the ceramic capacitance-diaphragm gauges for full scales of 133 Pa and 1.3 kPa was significantly lower than the uncertainty of a primary standard applying the static-expansion method.
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07.30.Dz Vacuum gauges
06.20.fb Standards and calibration

Combination of compact nonevaporable getter and small ion pumps for ultrahigh vacuum systems

C. D. Park, S. M. Chung, and Paolo Manini

J. Vac. Sci. Technol. A 29, 011012 (2011); http://dx.doi.org/10.1116/1.3529379 (7 pages) | Cited 1 time

Online Publication Date: 4 January 2011

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The rapid pumpdown of ultrahigh vacuum (UHV) systems, achieved with a very short and low temperature baking or even without baking, is appealing in a variety of research and industrial applications. The use of small volume, compact pumps delivering very high pumping speed is also attractive since it allows minimizing the overall size and weight of the vacuum system, simplifying its design. In the present article, the authors report the results of the pumping experiments carried out on a vacuum chamber pumped by a compact nonevaporable getter (NEG) pump (Capacitorr D 400-2® model, SAES Getters SpA, Italy) and by a small sputter ion pump (SIP). To measure the effective contribution of the NEG to the overall pumping, vacuum tests were carried out in a wide range of situations, with/without NEG pump, with/without baking, and changing the pumping speed of the SIP from 60 to 10 l/s (N2). Significantly lower pressures and faster pumping could be achieved using the NEG pump. Base pressures of low 10−11 mbar could be obtained in the authors’ experimental system with the compact NEG assisted by the 10 l/s SIPs after a 48 h bake-out. The results also show that the system with NEG reached 10−11 mbar after a very short (few hours) bake-out. The base pressure was 1×10−10 mbar with 60 l/s SIP alone after a 48 h bake-out, whereas it was 7.9×10−11 mbar when combined with the NEG, a better result after only 2 h bake-out. This is quite a remarkable decrease in the bake-out time of a UHV system. It is worthwhile to note that UHV could also be achieved with the NEG even in a fully unbaked system. The pressure of 8×10−9 mbar reached with the SIP alone dropped to 3.9×10−10 mbar after adding the NEG. The other interesting result of the NEG-based system is that the pressure increase is much slower when the SIP is switched off. This is also a good characteristic, required for portable vacuum devices, such as UHV suitcases and more generally for systems hosting sensitive materials or components, which can be affected by the pressure increase following a power interruption.
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07.30.Cy Vacuum pumps

Cleaning of GaN(math110) surfaces

Ch. Schulz, S. Kuhr, H. Geffers, Th. Schmidt, J. I. Flege, T. Aschenbrenner, D. Hommel, and J. Falta

J. Vac. Sci. Technol. A 29, 011013 (2011); http://dx.doi.org/10.1116/1.3520117 (6 pages)

Online Publication Date: 4 January 2011

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The cleaning of GaN(math110) surfaces was investigated by x-ray photoelectron spectroscopy, scanning tunneling microscopy, and low-energy electron diffraction. Two different two-step cleaning methods, performed under ultrahigh-vacuum conditions, were carried out and compared. The first cleaning step of both methods is thermal degassing. The second step is either the deposition of metallic gallium followed by redesorption or an exposure to active nitrogen from a radio frequency nitrogen plasma source. Upon storage in a glovebox (N2 atmosphere) and transfer to ultrahigh vacuum under dry nitrogen, carbon and oxygen were identified as the major contaminants. A significant decrease in oxygen and carbon was achieved by thermal degassing at 750 °C under ultrahigh-vacuum conditions. By applying a subsequent Ga deposition/redesorption or N2-plasma cleaning step, a further reduction in oxygen and carbon could be achieved. In comparison, the Ga deposition/redesorption cleaning showed a better performance in oxygen removal, whereas the N2 plasma exhibits a better efficiency in carbon removal. Furthermore scanning tunneling microscopy and low-energy electron diffraction investigations showed a drastic improvement of the morphology and atomic structure of the clean surfaces in contrast to the sample surfaces after N2 storage and transfer.
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81.65.Cf Surface cleaning, etching, patterning
68.35.B- Structure of clean surfaces (and surface reconstruction)
52.77.Bn Etching and cleaning
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Surface interactions of SO2 and passivation chemistry during etching of Si and SiO2 in SF6/O2 plasmas

Joshua M. Stillahn, Jianming Zhang, and Ellen R. Fisher

J. Vac. Sci. Technol. A 29, 011014 (2011); http://dx.doi.org/10.1116/1.3520126 (10 pages)

Online Publication Date: 4 January 2011

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A variety of materials can be etched in SF6/O2 plasmas. Here, the fate of SO2 at Si and SiO2 surfaces during etching in SF6/O2 plasmas has been explored using the imaging of radicals interacting with surfaces method. The scattering of SO2 at Si and SiO2 surfaces was measured as a function of both the applied rf power and O2 addition to the plasma. For both surfaces, the surface scattering coefficient (S) of SO2 during etching is near unity and is largely unaffected by changing plasma parameters such as power and O2 addition. Notably the etch rate of Si increases monotonically with power, whereas the etch rate of SiO2 appears insensitive to changes in plasma conditions. As a result, the etch selectivity closely follows the trends of the Si etch rate. Etch rates are compared to other fluorine-containing plasma systems such as NF3/O2 and C2F6/O2. Using mass spectral data and optical emission spectra to characterize the gas phase species combined with compositional analysis from x-ray photoelectron spectroscopy data, the formation and roles of SO2 in Si and SiO2 etching are discussed and correlated with etch rate and other gas phase species such as F, O, and SxOyFz.
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81.65.Rv Passivation
81.65.Cf Surface cleaning, etching, patterning
52.77.Bn Etching and cleaning
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Segregation and interlayer relaxation at the NiPd(111) surface

G. N. Derry, R. Wan, F. Strauch, and C. English

J. Vac. Sci. Technol. A 29, 011015 (2011); http://dx.doi.org/10.1116/1.3520434 (4 pages)

Online Publication Date: 4 January 2011

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The composition and structure of the NiPd(111) alloy surface are measured using low energy electron diffraction (LEED). The diffracted intensities are analyzed using tensor-LEED methods with the average t-matrix approximation. The major composition results of the study are that the surface is enriched in palladium (≈80% Pd) while the second layer is enriched in nickel (≈28% Pd). No significant structural changes were found, with all measured interlayer displacements being smaller than the corresponding measurement uncertainties. Comparisons of these results are made with literature for other NiPd low-index surfaces, for the well-studied NiPt(111) surface, and with the growing body of theoretical literature for NiPd alloy surfaces.
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68.35.Dv Composition, segregation; defects and impurities
68.35.bd Metals and alloys

Effect of inlet guide vanes and sharp blades on the performance of a turbomolecular pump

G. A. Bird

J. Vac. Sci. Technol. A 29, 011016 (2011); http://dx.doi.org/10.1116/1.3521313 (6 pages)

Online Publication Date: 4 January 2011

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The direct simulation Monte Carlo method is applied to a two-dimensional representation of the flow through a turbomolecular pump. It is shown that a conventional pump with a rotor as the first stage produces a significant disturbance in the vacuum chamber upstream of the pump. This disturbance can be prevented, without any adverse effect on the performance of the pump, by the addition of inlet guide vanes, similar to a stator, upstream of the rotor. In addition, it is shown that the compression ratio across the early stages that are in near free-molecule flow is significantly improved if the blades have sharp leading edges. The calculations required runs of just several hours on an ordinary PC.
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07.30.Cy Vacuum pumps
47.45.-n Rarefied gas dynamics

Recouping etch rates in pulsed inductively coupled plasmas

Ankur Agarwal, Phillip J. Stout, Samer Banna, Shahid Rauf, and Ken Collins

J. Vac. Sci. Technol. A 29, 011017 (2011); http://dx.doi.org/10.1116/1.3521315 (12 pages) | Cited 2 times

Online Publication Date: 4 January 2011

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Pulsed rf plasmas are increasingly being employed for plasma etching at future technological nodes. Although the plasma uniformity usually improves with pulsing, the lower time-averaged power decreases the etch rate and the lower throughput is undesirable. It is therefore important to evaluate different strategies to restore higher etch rates while retaining the advantages of pulsed plasmas. In this work, the impact of varying pulsing modes in an inductively coupled plasma on plasma characteristics and feature profile evolution are discussed using the results from a two-dimensional reactor scale plasma model coupled to a Monte Carlo based feature profile model. Results are discussed for poly-Si etching in an Ar/Cl2 gas mixture. The consequences of source-only and bias-only pulsing modes on discharge characteristics, ion energy distributions (IEDs) to the wafer, and feature profile evolution are discussed. Although the etch depth rates were found to be higher for source-only pulsing compared to the synchronized (source and bias) pulsing mode, the higher ion energies in the afterglow period during source-only pulsing may also increase ion bombardment damage. Compensation of power may allow for increased etch depth rates while retaining the benefits of synchronized pulsing. Further, power compensation level can be varied to achieve fine tuning of the IEDs to the wafer.
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81.65.Cf Surface cleaning, etching, patterning
52.77.Bn Etching and cleaning
52.40.Mj Particle beam interactions in plasmas
52.80.Hc Glow; corona

DC reactive magnetron sputtering, annealing, and characterization of CuAlO2 thin films

Blake L. Stevens, Cathleen A. Hoel, Carolyn Swanborg, Yang Tang, Chuanle Zhou, Matthew Grayson, Kenneth R. Poeppelmeier, and Scott A. Barnett

J. Vac. Sci. Technol. A 29, 011018 (2011); http://dx.doi.org/10.1116/1.3525640 (7 pages)

Online Publication Date: 4 January 2011

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CuAlOx thin films were prepared at three substrate temperatures (TS = 60, 300, and 600 °C) and two oxygen partial pressures (PO2 = 0.5 and 2 mTorr) via dc reactive magnetron sputtering from Cu–Al 50–50 at. % alloy targets and subsequent annealing. As-deposited films with PO2 = 0.5 mTorr were oxygen deficient; although the delafossite structure formed upon annealing, electrical properties were poor. Films deposited with PO2 = 2 mTorr transformed into the delafossite structure and exhibited p-type conductivity after annealing under N2 at temperatures TA ≥ 750 °C. Conductivity generally increased with increasing TS and decreasing TA. A special case of PO2 = 2 mTorr and low TS (60 °C) resulted in a partially crystalline oxide phase that transformed into the delafossite structure at TA = 700 °C and yielded the highest conductivity of 1.8 S cm−1. In general, a TA near the phase formation boundary led to an increase in conductivity. Low-temperature hydrothermal annealing was also investigated and shown to produce mixed phase films exhibiting the delafossite structure along with CuO, AlOOH, and Al2O3.
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68.55.ag Semiconductors
73.61.Le Other inorganic semiconductors
81.15.Cd Deposition by sputtering
81.40.Ef Cold working, work hardening; annealing, post-deformation annealing, quenching, tempering recovery, and crystallization
72.80.Jc Other crystalline inorganic semiconductors

Work function of fluorine doped tin oxide

M. G. Helander, M. T. Greiner, Z. B. Wang, W. M. Tang, and Z. H. Lu

J. Vac. Sci. Technol. A 29, 011019 (2011); http://dx.doi.org/10.1116/1.3525641 (4 pages) | Cited 1 time

Online Publication Date: 5 January 2011

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Fluorine doped tin oxide (FTO) is a commonly used transparent conducting oxide in optoelectronic device applications. The work function of FTO is commonly cited as 4.4 eV, which is incommensurate with recent device performance results. Using x-ray photoelectron spectroscopy, the authors measured the work function of commercial FTO to be 5.0±0.1 eV. UV ozone treatment was found to increase the work function by ∼ 0.1 eV due to surface band bending. The origins of the much lower work function previously reported are also discussed and are found to be a result of carbon contamination and UV induced work function lowering.
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73.30.+y Surface double layers, Schottky barriers, and work functions
79.60.Bm Clean metal, semiconductor, and insulator surfaces
78.66.Nk Insulators
81.40.Lm Deformation, plasticity, and creep
78.40.Ha Other nonmetallic inorganics

Temperature threshold for nanorod structuring of metal and oxide films grown by glancing angle deposition

Derya Deniz and Robert J. Lad

J. Vac. Sci. Technol. A 29, 011020 (2011); http://dx.doi.org/10.1116/1.3525882 (6 pages) | Cited 1 time

Online Publication Date: 5 January 2011

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Thin films of tin (Sn), aluminum (Al), gold (Au), ruthenium (Ru), tungsten (W), ruthenium dioxide (RuO2), tin dioxide (SnO2), and tungsten trioxide (WO3) were grown by glancing angle deposition (GLAD) to determine the nanostructuring temperature threshold, ΘT, above which adatom surface diffusion becomes large enough such that nanorod morphology is no longer formed during growth. The threshold was found to be lower in metals compared to oxides. Films were grown using both dc and pulsed dc magnetron sputtering with continuous substrate rotation over the temperature range from 291 to 866 K. Film morphologies, structures, and compositions were characterized by high resolution scanning electron microscopy, x-ray diffraction, and x-ray photoelectron spectroscopy. Films were also grown in a conventional configuration for comparison. For elemental metals, nanorod structuring occurs for films with melting points higher than that of Al (933 K) when grown at room temperature with a rotation rate of ∼ 5 rpm, corresponding to a value of ΘT ≈ 0.33±0.01. For the oxide films, a value of ΘT ≈ 0.5 was found, above which GLAD nanorod structuring does not occur. The existence of a nanostructuring temperature threshold in both metal and oxide GLAD films can be attributed to greater adatom mobilities as temperature is increased resulting in nonkinetically limited film nucleation and growth processes.
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61.46.Km Structure of nanowires and nanorods (long, free or loosely attached, quantum wires and quantum rods, but not gate-isolated embedded quantum wires)
68.55.-a Thin film structure and morphology
81.15.Cd Deposition by sputtering
64.70.dj Melting of specific substances
79.60.Bm Clean metal, semiconductor, and insulator surfaces
79.60.Dp Adsorbed layers and thin films

Morphology and reconstructions of polar CdTe(111)A,B surfaces by scanning tunneling microscopy

C. K. Egan, Q. Z. Jiang, and A. W. Brinkman

J. Vac. Sci. Technol. A 29, 011021 (2011); http://dx.doi.org/10.1116/1.3525914 (8 pages)

Online Publication Date: 5 January 2011

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The morphology and reconstructions of clean CdTe(111)A and CdTe(111)B surfaces have been studied by scanning tunneling microscopy. The (111)A surface is highly ordered and has a (2×2) reconstruction with a cadmium vacancy structure. The CdTe(111)B surface shows a large amount of disorder with small ordered domains having a c(8×4) reconstruction. This consists of chains of atoms in a two layer structure sitting upon the bulk terminated surface. These chains extend in any of the 〈211〉 surface directions. A number of other surface structures were observed, but these showed little long-range ordering. For both surfaces, a certain amount of faceting on {311} planes was observed. This faceting suggests that the surface energy for the {111} surfaces is quite large.
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68.35.bg Semiconductors
65.40.gp Surface energy

Gate coupling and carrier distribution in silicon nanowire/nanoribbon transistors operated in electrolyte

Si Chen and Shi-Li Zhang

J. Vac. Sci. Technol. A 29, 011022 (2011); http://dx.doi.org/10.1116/1.3528215 (7 pages) | Cited 2 times

Online Publication Date: 5 January 2011

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The transfer characteristics of back-gate silicon nanowire/nanoribbon (NW/NR) transistors measured in electrolyte exhibit a significantly higher on-current and a steeper subthreshold behavior than measured in air. Simulation results show that the gate capacitance for a NW/NR of a trapezoidal cross-section immersed in water is significantly higher than that exposed to air. Electrostatics simulations further show that for NWs/NRs with small widths, carriers are mainly accumulated at the two side-edges when they are immersed in water. Even the top surface of the NWs/NRs sees more accumulated carriers than the bottom one does; the latter is in fact located closest to the back-gate. These observations suggest that the interface properties at the side-edges and the top surface are crucial for NW/NR transistors to achieve high sensitivity when performing real-time sensing experiments in electrolyte. Finally, the sensitivity of back-gate NW/NR field-effect transistors to charge changes in electrolyte is found to have a weak dependence on the NW/NR width when the doping concentration is below 1017 cm−3. For higher NW/NR doping concentrations, narrower NWs/NRs are more sensitive.
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85.30.Tv Field effect devices

Reactive ion etching of tellurite and chalcogenide waveguides using hydrogen, methane, and argon

K. T. Vu and S. J. Madden

J. Vac. Sci. Technol. A 29, 011023 (2011); http://dx.doi.org/10.1116/1.3528248 (6 pages)

Online Publication Date: 5 January 2011

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The authors report in detail on the reactive plasma etching properties of tellurium and demonstrate a high quality etching process using hydrogen, methane, and argon. Very low loss planar ridge waveguides are demonstrated. Optical losses in tellurium dioxide waveguides below 0.1 dB/cm in most of the near infrared region of the electromagnetic spectrum and at 1550 nm have been achieved—the lowest ever reported by more than an order of magnitude and clearly suitable for planar integrated devices. The etch process is also shown to be suitable for chalcogenide glasses which may be of importance in applications such as phase change memory devices and nonlinear integrated optics.
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81.65.Cf Surface cleaning, etching, patterning
52.77.Bn Etching and cleaning
73.61.Jc Amorphous semiconductors; glasses
78.66.Jg Amorphous semiconductors; glasses
42.79.Gn Optical waveguides and couplers

Study of plasma dynamics in a modulated pulsed power magnetron discharge using a time-resolved Langmuir probe

L. Meng, A. N. Cloud, S. Jung, and D. N. Ruzic

J. Vac. Sci. Technol. A 29, 011024 (2011); http://dx.doi.org/10.1116/1.3528940 (7 pages) | Cited 1 time

Online Publication Date: 5 January 2011

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Modulated pulse power (MPP) technology is a derivative of high power pulsed magnetron sputtering that allows unprecedented user control over the growth process, although the critical time-dependent plasma properties during the power pulse have not been studied until now. Using a MPP plasma generator, pulses of custom voltage waveforms were generated and applied to the cathode of a 36 cm diameter circular planar magnetron. The I-V characteristics of the pulses are separable into distinct discharge stages. A time-resolved triple Langmuir probe was introduced to measure the temporal evolution of the plasma. Typical electron density of 5×1017 m−3 and electron temperature of 10 eV during the pulse were calculated from measured parameters. Plasma behaviors were observed to closely depend on the pulse waveforms. Various parameters, including pulse current, pulse frequency, pressure, and distance from the target, also affected the electron density and temperature, providing degrees of freedom to optimize the sputtering processes. The effects of each parameter on the pulsed plasma dynamics are discussed and then attributed to mechanisms of electron impact ionization, gas heating, and magnetic confinement.
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52.25.-b Plasma properties
52.50.-b Plasma production and heating
52.55.-s Magnetic confinement and equilibrium
52.70.Ds Electric and magnetic measurements

Plasma thinned nanopost arrays for DNA electrophoresis

Jia Ou, Mark N. Joswiak, Samuel J. Carpenter, and Kevin D. Dorfman

J. Vac. Sci. Technol. A 29, 011025 (2011); http://dx.doi.org/10.1116/1.3531693 (5 pages)

Online Publication Date: 5 January 2011

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Separating long DNA in a microfabricated post array requires (tens of) thousands of posts in the separation channel. Moving from microposts to nanoposts is thus a fabrication challenge owing to the large area that needs to be nanopatterned. The authors implemented an oxygen plasma etching method in conjunction with conventional optical photolithography and deep trench etching that led to centimeter-long microchannels containing either 360 or 460 nm diameter posts in a hexagonal array with a 3 μm spacing. Separations of the XhoI λ-DNA digest in the device indicate that these sparse nanopost arrays are an improvement over the equivalent micropost array with only a marginal increase in fabrication cost. The fabrication method described here is broadly applicable to biological microfluidic and nanofluidic platforms that require nanoscale features with micrometer-scale spacing.
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85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices
07.10.Cm Micromechanical devices and systems
87.85.Ox Biomedical instrumentation and transducers, including micro-electro-mechanical systems (MEMS)
87.80.Ek Mechanical and micromechanical techniques
47.85.Np Fluidics
87.85.Va Micromachining
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