You are not logged in to this journal. Log In
J. Vac. Sci. Technol. B 28, 371 (2010); http://dx.doi.org/10.1116/1.3359608 (5 pages)
Two step optimized process for scanning tunneling microscopy tip fabrication
(Published online 23 March 2010)
© 2010 American Vacuum Society
ACKNOWLEDGMENTS
Article Outline
- INTRODUCTION
- EXPERIMENT
- Etching
- Cleaning
- STM
- RESULTS
- Etching types
- In situ annealing
- STM imaging
- DISCUSSION
- CONCLUSION
KEYWORDS and PACS
Keywords
etching, optimisation, scanning tunnelling microscopy, Material names: W, Au, Si
RELATED DATABASES
Accepted 8 February 2010
Published online 23 March 2010
For access to citing articles, you need to log in.
Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



This Publication
Scitation
SPIN
Scitopia
Google Scholar
PubMed