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J. Vac. Sci. Technol. B 28, C2A5 (2010); http://dx.doi.org/10.1116/1.3271173 (4 pages)

Field emission microscopy of Al-deposited carbon nanotubes: Emission stability improvement and image of an Al atom cluster

Yahachi Saito, Tomohiro Matsukawa, Koji Asaka, and Hitoshi Nakahara

Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan

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(Published online 19 March 2010)

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Aluminum (Al) was deposited on multiwall carbon nanotubes (MWNTs) with mean thicknesses ranging from 1 to 11 nm in vacuum, and the influence of deposited Al on field electron emission was investigated by field emission microscopy (FEM). Al deposition significantly suppressed the fluctuations of emission current after a simple conditioning process. Interestingly, FEM images revealing the atomic detail of an Al cluster with the cubo-octahedron structure were observed. The discussion on the spatial resolution in FEM for MWNTs suggests the probable observation of some atomic structures with a resolution of the order of 0.3 nm.

© 2010 American Vacuum Society

ACKNOWLEDGMENTS

The authors acknowledge the financial support from the Ministry of Education, Science, Sports and Culture (Grants-in-Aids for Scientific Research on Priority Areas, 19054007).

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS AND DISCUSSION
  4. CONCLUSION

KEYWORDS and PACS

PACS

  • 79.70.+q

    Field emission, ionization, evaporation, and desorption

  • 68.55.jd

    Thickness

  • 68.37.Vj

    Field emission and field-ion microscopy

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PUBLICATION DATA

ISSN

1071-1023 (print)  
1520-8567 (online)

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