Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition

Murakami, K.; Matsuo, T.; Wakaya, F.; Takai, M.

doi:doi:10.1116/1.3333440

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Journal of Vacuum Science & Technology B / Volume 28 / Issue 2 / PAPERS FROM THE 22nd INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE / Fundamental

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J. Vac. Sci. Technol. B 28, C2A9 (2010); http://dx.doi.org/10.1116/1.3333440 (4 pages)

Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition

K. Murakami¹, T. Matsuo², F. Wakaya³, and M. Takai³

¹Center for Quantum Science and Technology under Extreme Conditions, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
²Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
³Center for Quantum Science and Technology under Extreme Conditions, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan and Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan

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(Published online 19 March 2010)

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Fringelike electron emission patterns emitted from Pt field emitters fabricated by focused-ion-beam-induced deposition (FIBID) were investigated by field-emission microscopy and in situ field-ion microscopy (FIM). The FIM image with electron emission sites showed adjacent two emission sites within a diameter of a Pt nanocrystal. These results indicate that the origin of fringelike electron emission patterns of Pt field emitters fabricated by FIBID are the electron wave interference induced by electrons emitted from adjacent two electron emission sites within a Pt nanocrystal.

ACKNOWLEDGMENTS

This work was partially supported by the Ministry of Education, Culture, Sports, Science and Technology of Japan, through a Grant-in-Aid for Young Scientists B (Grant No. 20410108) and a Grant-in-Aid for Scientific Research A (Grant No. 19206008).

Article Outline

INTRODUCTION
EXPERIMENT
RESULTS AND DISCUSSION
CONCLUSIONS

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KEYWORDS and PACS

Keywords

electromagnetic wave interference, electron field emission, field emission ion microscopy, nanostructured materials, nanotechnology, platinum, Pt, C, Ga, C5H5Pt(CH3)3

PACS

79.70.+q

Field emission, ionization, evaporation, and desorption
81.16.-c

Methods of micro- and nanofabrication and processing
61.46.Df

Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)

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History

Received 28 October 2009
Accepted 1 February 2010
Published online 19 March 2010

Digital Object Identifier

http://dx.doi.org/10.1116/1.3333440

PUBLICATION DATA

ISSN

1071-1023 (print)

1520-8567 (online)

Publisher

American Vacuum Society

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