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J. Vac. Sci. Technol. B 28, C2C13 (2010); http://dx.doi.org/10.1116/1.3360902 (3 pages)

In situ transmission electron microscopy observation of electron-beam-deposited Pt field emitter during field emission and field evaporation

K. Murakami1, N. Matsubara1, S. Ichikawa2, F. Wakaya1, and M. Takai1

1Center for Quantum Science and Technology under Extreme Conditions and Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan
2Institute for Nanoscience Design, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan

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(Published online 30 March 2010)

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An internal structure of Pt field emitters fabricated by electron-beam-induced deposition (EBID) was investigated by in situ transmission electron microscopy during field emission and field evaporation. The internal structure of Pt field emitters was unchanged during field emission with an emission current of less than 480 nA. On the contrary, the top of Pt field emitters was sharpened after field evaporation. The Pt nanocrystals also moved to the Pt tip top after field evaporation. These results indicate the possibility of the sharpening of Pt field emitters by field evaporation, which would improve the field emission properties of Pt field emitters fabricated by EBID.

© 2010 American Vacuum Society

ACKNOWLEDGMENTS

This work was partially supported by the Ministry of Education, Culture, Sports, Science and Technology of Japan, through a Grant-in-Aid for Young Scientists B (Grant No. 20410108) and a Grant-in-Aid for Scientific Research A (Grant No. 19206008).

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS AND DISCUSSION
  4. CONCLUSION

KEYWORDS and PACS

PACS

  • 79.70.+q

    Field emission, ionization, evaporation, and desorption

  • 81.07.Bc

    Nanocrystalline materials

  • 61.46.-w

    Structure of nanoscale materials

  • 07.78.+s

    Electron, positron, and ion microscopes; electron diffractometers

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PUBLICATION DATA

ISSN

1071-1023 (print)  
1520-8567 (online)

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