Survey of fractured SrTiO3 surfaces: From the micrometer to nanometer scale

Chien, TeYu; Guisinger, Nathan P.; Freeland, John W.

doi:doi:10.1116/1.3420395

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Journal of Vacuum Science & Technology B / Volume 28 / Issue 4 / PAPERS FROM THE 37th ANNUAL CONFERENCE ON THE PHYSICS AND CHEMISTRY OF SEMICONDUCTOR INTERFACES / Epitaxial Oxides

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J. Vac. Sci. Technol. B 28, C5A11 (2010); http://dx.doi.org/10.1116/1.3420395 (3 pages)

Survey of fractured SrTiO₃ surfaces: From the micrometer to nanometer scale

TeYu Chien¹, Nathan P. Guisinger², and John W. Freeland¹

¹Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
²Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439

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(Published online 6 July 2010)

Abstract

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Cross-sectional scanning tunneling microscopy was utilized to study fractured perovskite oxide surfaces. It was found that for the non-cleavable perovskite oxide, SrTiO₃, atomically flat terraces could be routinely created with a controlled fracturing procedure. Optical, scanning electron and scanning tunneling microscopies, and a profilometer were used to obtain information from submillimeter to submicrometer scales of the fractured surface topography.

ACKNOWLEDGMENT

Work at Argonne, including the Center for Nanoscale Materials, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

Article Outline

INTRODUCTION
EXPERIMENTAL AND RESULTS
DISCUSSION
SUMMARY

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KEYWORDS and PACS

Keywords

fracture, optical microscopy, scanning electron microscopy, scanning tunnelling microscopy, strontium compounds, surface topography, SrTiO3, Niobium

PACS

68.35.bt

Other materials
81.40.Np

Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
62.20.mm

Fracture

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History

Received 11 March 2010
Accepted 5 April 2010
Published online 6 July 2010

Digital Object Identifier

http://dx.doi.org/10.1116/1.3420395

PUBLICATION DATA

ISSN

1071-1023 (print)

1520-8567 (online)

Publisher

American Vacuum Society

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