• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

You are not logged in You are not logged in to this journal. Log In

J. Vac. Sci. Technol. B 29, 011001 (2011); http://dx.doi.org/10.1116/1.3521489 (6 pages)

Plasma etching of polydimethylsiloxane: Effects from process gas composition and dc self-bias voltage

Geir Bjørnsen1 and Jaan Roots2

1Faculty of Science and Engineering, Vestfold University College, P.O. Box 2243, N-3103 Tønsberg, Norway
2Department of Chemistry, University of Oslo, P.O. Box 1033, Blindern, N-0315 Oslo, Norway

View MapView Map

(Published online 4 January 2011)

Full Text: Read Online (HTML) | Download PDF | Rent Article | Buy PDF (US$28) | View Cart
Films made of polydimethylsiloxane elastomers have been etched using reactive ion etching. The elastomers are etched using different mixtures of CF4, SF6, and O2 as process gases. The etch rate and profile of the etched area are measured as function of the process pressure for different process gas compositions. At low pressure the highest etch rate is achieved in SF6+O2 plasma. At high pressure the highest etch rate is achieved in CF4+SF6+O2 plasma. The profile of the etched surface is strongly dependent on the process gas composition and the dc bias voltage in the plasma.

© 2011 American Vacuum Society

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS AND DISCUSSION
    1. Pressure dependence of the dc bias
    2. Etch rate of the pure PDMS elastomer
    3. Etch profiles
    4. Comparison with Sylgard-184
  4. CONCLUSION

KEYWORDS and PACS

PACS

  • 81.65.Cf

    Surface cleaning, etching, patterning

  • 61.41.+e

    Polymers, elastomers, and plastics

  • 62.50.-p

    High-pressure effects in solids and liquids

  • 52.77.Bn

    Etching and cleaning

RELATED DATABASES

To view database links for this article, you need to log in.

PUBLICATION DATA

ISSN

1071-1023 (print)  
1520-8567 (online)

For access to fully linked references, you need to log in.

Figures (12) Tables (1)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)


Close

close