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Dec 2013

Volume 20, Issue 1 (partial)


Single Crystalline Oxygen-free Titanium Nitride by XPS

Dominik Jaeger and Jörg Patscheider

Surf. Sci. Spectra 20, 1 (2013); http://dx.doi.org/10.1116/11.20121107 (8 pages)

Online Publication Date: 5 March 2013

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X-ray photoelectron spectroscopy (XPS) spectra are presented, which are obtained from an oxygen-free single crystalline (sc-) titanium nitride (TiN) sample. The investigated film has been grown on a magnesium oxide (MgO) single crystal with the (001) orientation. Unbalanced Reactive Magnetron Sputter deposition was used to deposit the TiN film in an argon/nitrogen atmosphere at 5 × 10−3 mbar and a temperature of 800 °C. The sample has been transferred in situ from the deposition chamber to the XPS device in order to prevent surface oxidation of the sample. Atomic force microscopy (AFM), X-ray diffraction (XRD), Rutherford backscattering (RBS) and angle resolved (AR-) XPS have been used to characterize the sample in detail. This work is dedicated to the XPS characterization of a representative oxygen-free sc-TiN sample. Detailed scans are presented and discussed for the Ti 2p, O 1s, N 1s, Ti 2s, valence band and Ti LMM regions. The spectra contain shake-ups, surface and bulk plasmons, that can be separated and quantified by the presented evaluation procedure.
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81.15.Cd Deposition by sputtering
82.80.Yc Rutherford backscattering (RBS), and other methods of chemical analysis
61.05.cp X-ray diffraction
73.20.At Surface states, band structure, electron density of states
73.20.Mf Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)
79.60.Dp Adsorbed layers and thin films

Fluorine-Doped Iron Oxide Nanomaterials by Plasma Enhanced-CVD: An XPS Study

Giorgio Carraro, Alberto Gasparotto, Chiara Maccato, and Davide Barreca

Surf. Sci. Spectra 20, 9 (2013); http://dx.doi.org/10.1116/11.20130101 (8 pages)

Online Publication Date: 24 April 2013

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In this work, we report on a single-step Plasma Enhanced-Chemical Vapor Deposition (PE-CVD) process for the synthesis of iron(III) oxide based nanomaterials. A key feature of the adopted fabrication strategy is the use of a fluorinated Fe(II) β-diketonate diamine precursor, enabling a homogeneous Fe2O3 in-situ doping and resulting in a tunable fluorine content as a function of deposition temperature. To this regard, a detailed study of the nature and amount of fluorine-containing moieties is strongly required in view of the process optimization. Specifically, X-ray Photoelectron Spectroscopy (XPS) analysis represents a strategic tool to evaluate the system chemical composition, and also to evidence the presence of fluorine in different chemical states, such as lattice fluorine (F-Fe) and traces of precursor residuals (CFx) at the system surface. In the present study, spectroscopic data are presented and discussed in detail for a representative Fe2O3 specimen.
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81.16.-c Methods of micro- and nanofabrication and processing
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
61.72.up Other materials
52.77.Dq Plasma-based ion implantation and deposition
79.60.Jv Interfaces; heterostructures; nanostructures

Coprecipitated Transition Metal Ferrites Investigated by XPS

Stefano Diodati and Silvia Gross

Surf. Sci. Spectra 20, 17 (2013); http://dx.doi.org/10.1116/11.20121106 (18 pages)

Online Publication Date: 23 May 2013

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In the present contribution, four transition metal ferrites, namely the manganese perovskite MnFeO3 and the nickel, cobalt and zinc spinels NiFe2O4, CoFe2O4, and ZnFe2O4, were investigated through XPS (X-ray Photoelectron Spectroscopy). The synthesis route for the analyzed materials involved the precipitation of metal oxalates from an aqueous solution of metallic salts and oxalic acid. The precipitate was then isolated and calcined at 900 °C in order to obtain the crystalline ferrite powders. Along with survey scans of the analyzed samples, detailed spectra of the O 1s, C 1s, Fe 2p and M 2p (where M = Mn, Ni, Co, Zn depending on the compound in question) regions were collected. The data resulting from these analyses is discussed.
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81.05.Je Ceramics and refractories (including borides, carbides, hydrides, nitrides, oxides, and silicides)
81.20.Ev Powder processing: powder metallurgy, compaction, sintering, mechanical alloying, and granulation
81.10.Dn Growth from solutions
81.10.Fq Growth from melts; zone melting and refining
81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
81.40.Gh Other heat and thermomechanical treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Ht Disordered structures
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