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Jun 1992

Volume 1, Issue 2, pp. 173-245


Lead Zirconate–Lead Titanate (PbZrO3–PbTiO3) Thin Film Prepared by the Sol‐gel Process by AES

Michael J. Bozack

Surf. Sci. Spectra 1, 173 (1992); http://dx.doi.org/10.1116/1.1247688 (5 pages)

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An Auger spectrum of the lead zirconate titanate ferroelectric thin film PbZrO3–PbTiO3 (PZT) is presented. The film was prepared by the sol‐gel process on a sputtered Pt substrate. PZT is currently under investigation for use in nonvolatile semiconductor memories. Random access memory based on PZT rests upon the ability of ferroelectric material to possess two distinct polarizations which can remain in either state without an electric power supply.
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81.65.-b Surface treatments
77.55.-g Dielectric thin films
81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)

Lead Zirconate–Lead Titanate (PbZrO3–PbTiO3) Thin Film Prepared by the Sol‐gel Process by XPS

Michael J. Bozack

Surf. Sci. Spectra 1, 178 (1992); http://dx.doi.org/10.1116/1.1247689 (5 pages) | Cited 1 time

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An XPS spectrum of the lead zirconate titanate ferroelectric thin film PbZrO3–PbTiO3 (PZT) is presented. The film was prepared by the sol‐gel process on a sputtered Pt substrate. PZT is currently under investigation for nonvolatile ferroelectric memory applications requiring polarization reversal.
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81.65.-b Surface treatments
77.55.-g Dielectric thin films
81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)

Characterization with XPS of a Thin Film of B2O2 Deposited on a Ag Substrate

Yajun Wang and Michael Trenary

Surf. Sci. Spectra 1, 183 (1992); http://dx.doi.org/10.1116/1.1247690 (5 pages)

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XPS spectra are presented for a thin film of a suboxide of boron formed by condensing B2O2(g) on a clean Ag foil substrate. Spectroscopic characterization of boron suboxides are important as these compounds may exist as surface intermediates in the oxidation of solid boron and of boron compounds. The B2O2(g) source consists of a Knudsen cell in which B(s) and B2O3(s) are heated to 1123 K. Mass spectroscopic analysis confirms that only B2O2(g) effuses from the source. The condensed B2O2 film has a B 1s binding energy of 192.55 eV which allows this boron suboxide to be distinguished from the principal boron oxide B2O3, which has a binding energy of 193.5‐194.0 eV [W. C. Foo, J. S. Ozcomert, and M. Trenary, Surf. Sci. 255, 245 (1991)].
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81.65.-b Surface treatments
77.55.-g Dielectric thin films
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

A Polycrystalline Diamond Film by XPS

Richard P. Vasquez

Surf. Sci. Spectra 1, 188 (1992); http://dx.doi.org/10.1116/1.1247691 (4 pages) | Cited 1 time

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High resolution XPS measurements of the C 1s, including energy losses and the valence band regions, are presented for a polycrystalline diamond film. These spectra are useful for comparison to the graphite and C60 forms of carbon.
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81.65.-b Surface treatments

P55X Pitch‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 192 (1992); http://dx.doi.org/10.1116/1.1247692 (6 pages)

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An Amoco P55X pitched‐based carbon fiber surface was analyzed with both core level and valence band XPS. Compared to Du Pont pitch‐based carbon fibers with different modulus and Hercules PAN‐based carbon fibers, the P55X fiber had more oxygen content on the surface than the higher modulus, pitch‐based carbon fibers (e.g., Du Pont E‐120 and E‐75 fibers), but less than the lower modulus pitch based carbon fiber (Du Pont E‐35) and PAN‐based carbon fibers (Hercules AU4 and AS4). [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] The P55X fiber also had a fairly good graphitic structure in both the surface and the bulk as evidenced by both XPS and XRD. No nitrogen was found on this P55X fiber nor on the other pitch‐based carbon fiber surfaces, but it was found on the PAN‐based fibers. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra and could be well interpreted by X–α calculations with model compounds. In this work, the valence band spectrum showed that there were at least two different types of oxygen species on the P55X fiber surface. The two well separated O 2s features in the P55X fiber valence band spectrum were both more significant than those in the E‐75 fiber valence band spectrum, but less than those in the E‐35 fiber valence band.
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81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

E‐35 Pitch‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 198 (1992); http://dx.doi.org/10.1116/1.1247693 (6 pages)

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Both XPS core level and valence band spectra were obtained from Du Pont E‐35 pitch‐based carbon fiber surface. The XPS data showed that the E‐35 fiber had more oxygen on the surface than the higher modulus pitch‐based carbon fibers (e.g., Du Pont E‐120 and E‐75, and Amoco P55X carbon fibers), but less than the PAN‐based carbon fibers (Hercules AU4 and AS4). [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] The E‐35 fiber also had a fairly good graphitic structure in both the surface and the bulk as evidenced by both XPS and XRD. No nitrogen was found on this E‐35 fiber and other pitch‐based carbon fiber surfaces, but it was found on PAN‐based fibers. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra, and could be well interpreted by X–α calculations with model compounds. In this work, the valence band spectrum showed that there were at least two different types of oxygen species on the E‐35 fiber surface. The two well separated O 2s features in the E‐35 fiber valence band spectrum were both more significant than those in the E‐75 fiber valence band spectrum.
Show PACS
81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

E‐75 Pitch‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 204 (1992); http://dx.doi.org/10.1116/1.1247639 (6 pages)

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Both XPS core level and valence band spectra were obtained from Du Pont E‐75 pitch‐based carbon fiber surface. The XPS data showed that the E‐75 fiber had more oxygen content on the surface than the Du Pont higher modulus pitch‐based carbon fiber (E‐120), but less than the lower modulus pitch‐based carbon fibers (Amoco P55X fiber and Du Pont E‐35 fiber) and the PAN‐based carbon fibers (Hercules AU4 and AS4). [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] The E‐75 fiber also had a graphitic structure in both the surface and the bulk as evidenced by both XPS and XRD. No nitrogen was found on this E‐75 fiber and other pitch‐based carbon fiber surfaces, but it was found on PAN‐based fibers. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra and could be well interpreted by X–α calculations with model compounds.
Show PACS
81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

E‐120 Pitch‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie, Tiejun Wang, Michael A. Rooke, and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 210 (1992); http://dx.doi.org/10.1116/1.1247640 (6 pages) | Cited 2 times

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Both XPS core level and valence band spectra were obtained from an E‐120 high modulus pitch‐based carbon fiber surface. The XPS data show that the E‐120 fiber had the least oxygen content on the surface compared to various other pitch‐based (e.g., E‐35, E‐75,P‐55X, etc.) and PAN based carbon fibers (e.g., AU4, TypeII, etc.). [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] E‐120 also had the most graphitic structure in both the surface and the bulk among these fiber samples as evidenced by both XPS and XRD. No nitrogen was found on E‐120 and other pitch‐based carbon fiber surfaces but it was found on PAN‐based fibers. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that XPS valence band spectra were more sensitive to chemical environment on the fiber surface than core level spectra and could well be interpreted by X–α calculations with model components.
Show PACS
81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Type II PAN‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 216 (1992); http://dx.doi.org/10.1116/1.1247641 (6 pages)

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Courtauds type II PAN‐based carbon fiber surface was analyzed with both core level and valence band XPS. Compared to Du Pont and Amoco pitch‐based carbon fibers with different moduli, the Courtauds type II PAN‐based fiber had much more oxidized components on the surface [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] The type II fiber had a much less graphitic structure in both the surface and the bulk than the pitch‐based fibers as evidenced by both the XPS and XRD. It also had a notable nitrogen content on its surface but less than the Hercules AU4‐12k and AS4‐6k PAN‐based fibers. However, no nitrogen was found on any of the pitch‐based carbon fibers measured in our laboratory. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra and could well be interpreted by X–α calculations with model compounds. In this work, the valence band spectrum showed that there were nitrogen and different types of oxygen species on the type II fiber surface.
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81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

AU4 PAN‐based Carbon Fiber by Core Level and Valence Band XPS

Yaoming Xie and Peter M. A. Sherwood

Surf. Sci. Spectra 1, 222 (1992); http://dx.doi.org/10.1116/1.1247642 (6 pages)

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Hercules AU4 PAN‐based carbon fiber surface was analyzed with both core level and valence band XPS. Compared to Du Pont and Amoco’s pitch‐based carbon fibers with different modulus, the AU4 fiber had more oxidized components on the surface than the pitch‐based carbon fibers. [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 417 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] The AU4 PAN‐based fiber had a much less graphitic structure in both the surface and the bulk than the pitch‐based fibers as evidenced by both XPS and XRD. It also had a small amount of nitrogen in its structure, but no nitrogen was found on the pitch‐based carbon fiber surfaces. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)], showed that the XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra and could be well interpreted by X–α calculations with model compounds. In this work, the valence band spectrum showed that there were nitrogen and at least two different types of oxygen species on the AU4 fiber surface.
Show PACS
79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Solution Cast Silicone on Glass Substrate by XPS

Michael Ackeret

Surf. Sci. Spectra 1, 228 (1992); http://dx.doi.org/10.1116/1.1247643 (5 pages)

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X‐ray photoelectron spectroscopy was used to examine a film of silicone evaporated onto a 13 mm diameter glass substrate. The material was dissolved into toluene, deposited onto the glass substrate, then the toluene was allowed to evaporate. Data were collected, stored and processed with a Hewlett‐Packard model 5950B ESCA. Measured atomic percentages very closely matched the expected stoichiometry at three different electron take off angles, indicating homogeneity.
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79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

X‐ray Photoelectron Study of TiN

A. R. Chourasia and D. R. Chopra

Surf. Sci. Spectra 1, 233 (1992); http://dx.doi.org/10.1116/1.1247644 (5 pages)

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Thin films of TiN were deposited from TiCl4, NH3, and H2 in a lamp heated single wafer ‘‘warm wall’’ low pressure chemical vapor deposition reactor. The deposition was carried out on a TiSi2/Si sample. The thickness of the films is estimated to be 100 nm. The films were analyzed by x‐ray diffraction, Rutherford backscattering spectroscopy, and x‐ray photoelectron spectroscopy. The XPS data in Ti 2p, N 1s, Ti L3M23V, and Ti L3M23M23 regions are presented.
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81.65.-b Surface treatments
68.55.-a Thin film structure and morphology

Highly Oriented Pyrolytic Graphite by XPS

Richard P. Vasquez

Surf. Sci. Spectra 1, 238 (1992); http://dx.doi.org/10.1116/1.1247695 (4 pages) | Cited 1 time

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High resolution XPS measurements of the C 1s, including energy losses, and the valence band regions are presented for freshly cleaved highly oriented pyrolytic graphite. These spectra are useful for comparison to the diamond and C60 forms of carbon.
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81.65.-b Surface treatments

Epitaxial C60 Film on Si(111) by XPS

Richard P. Vasquez, Ruth A. Brain, David Ross, and Nai‐Chang Yeh

Surf. Sci. Spectra 1, 242 (1992); http://dx.doi.org/10.1116/1.1247645 (4 pages) | Cited 3 times

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High resolution XPS measurements of the C 1s, including energy losses, and the valence band regions are presented for a high quality epitaxial film (average grain size ∼70 nm) of C60 on a Si (111) substrate. Similar films have also been characterized with x‐ray diffraction and transmission electron microscopy.
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81.65.-b Surface treatments
68.55.-a Thin film structure and morphology
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