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Dec 2004

Volume 11, Issue 1, pp. 1-134


N2 Annealing Effect on Thermal Ta2O5 Layers on Si Studied by XPS

E. Atanassova, G. Tyuliev, A. Paskaleva, D. Spassov, and K. Kostov

Surf. Sci. Spectra 11, 1 (2004); http://dx.doi.org/10.1116/11.20040701 (25 pages)

Online Publication Date: 4 May 2005

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The effect of nitrogen annealing at 1123 K for 30 min on the structural characteristics of thin (15 nm) Ta2O5 layers on Si was examined by x-ray photoelectron spectroscopy (XPS). The results indicate that the stoichiometric Ta2O5 detected at the surface of as-deposited films is reduced to suboxides at the interface with Si. Si-O bonds in the form of SiO2 exist in a small quantity through the whole thickness of the films. The existence of excess Si was established in the interfacial transition region. The annealing improves the stoichiometry and microstructure of both the bulk oxide and the interfacial region, which manifests as a reduced amount of suboxides. The interfacial region is a composite oxide of suboxides of Ta and Si before and after N2 treatment but the annealing process reduces the excess Si and decreases the width of the interface. Thus, a trend to more abrupt interface is observed. © 2005 American Vacuum Society.
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82.45.Mp Thin layers, films, monolayers, membranes
68.55.-a Thin film structure and morphology
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Silica-Supported Erbium-based Nanosystems: An XPS Characterization

Lidia Armelao, Davide Barreca, Gregorio Bottaro, Alberto Gasparotto, Daniele Leonarduzzi, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 11, 26 (2004); http://dx.doi.org/10.1116/11.20050102 (7 pages) | Cited 1 time

Online Publication Date: 14 June 2005

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Silica-supported Er(III)-based nanocomposites were prepared by RF-sputtering from an Ar plasma. Depositions were carried out using an erbium target as a metal source and amorphous silica slides as growth surface. The substrate temperature was kept at 60 °C throughout each experiment. Attention was mainly devoted to the use of mild plasma conditions and to a proper choice of RF power, total pressure and deposition time in order to obtain a careful control of the deposited metal amount. Specimen characterization was performed by glancing-incidence x-ray diffraction (GIXRD), x-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) to investigate the structural, compositional and morphological properties of the obtained samples and their interrelations with the synthesis conditions. This study is dedicated to an XPS characterization of the principal core levels (Er, Si, O) of an Er(III)/SiO2 specimen obtained under selected conditions, leading to an incomplete silica coverage. This feature enabled investigation of the chemical state of both the deposited erbium-based particles and the supporting substrate. To this aim, detailed scans for the Er 4d, Si 2p, O ls, and C 1s regions and related data are presented and discussed. © 2005 American Vacuum Society.
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81.07.-b Nanoscale materials and structures: fabrication and characterization
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Core Level Spectra of Hafnium and Hafnium Nitride (HfN0.9) by XPS

A. Arranz and C. Palacio

Surf. Sci. Spectra 11, 33 (2004); http://dx.doi.org/10.1116/11.20050103 (10 pages)

Online Publication Date: 13 July 2005

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The principal core level XPS spectra of hafnium and hafnium nitride (HfN0.9) samples are presented comparatively. The hafnium nitride thin film has been grown by 3 keV nitrogen implantation up to saturation of metallic hafnium. © 2005 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
79.60.Bm Clean metal, semiconductor, and insulator surfaces
61.72.up Other materials
61.80.Jh Ion radiation effects
01.30.Kj Handbooks, dictionaries, tables, and data compilations

Fuchs-Kliewer Phonon Spectrum of Co3O4(110) by High Resolution Electron Energy Loss Spectroscopy

E. M. Marsh, S. C. Petitto, and M. A. Langell

Surf. Sci. Spectra 11, 43 (2004); http://dx.doi.org/10.1116/11.20041102 (9 pages)

Online Publication Date: 22 July 2005

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High resolution electron energy loss spectroscopy (HREELS) was used to obtain the Fuchs-Kliewer phonon spectrum of Co3O4(110). Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and low energy electron diffraction (LEED) provided information on sample integrity. The AES, XPS, and LEED specta confirm the cleanliness, composition, and the order of the Co3O4(110) surface. The HREEL spectra show the Fuchs-Kliewer phonon structure with peaks appearing at 26.8, 47.5, 71.1, and 84.7 meV (216, 383, 573, and 683 cm−1), which correspond to the four fundamental phonons. Multiple losses of the fundamental phonons are also present in the spectra. © 2005 American Vacuum Society.
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63.20.-e Phonons in crystal lattices
79.60.Bm Clean metal, semiconductor, and insulator surfaces
79.20.Fv Electron impact: Auger emission
79.20.Uv Electron energy loss spectroscopy
68.49.Jk Electron scattering from surfaces
01.30.Kj Handbooks, dictionaries, tables, and data compilations

Nanocrystalline Lanthanum Oxyfluoride Thin Films by XPS

Davide Barreca, Alberto Gasparotto, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 11, 52 (2004); http://dx.doi.org/10.1116/11.20050401 (7 pages)

Online Publication Date: 23 September 2005

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Nanocrystalline lanthanum oxyfluoride thin films were synthesized by chemical vapor deposition (CVD) using La(hfa)3⋅diglyme (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; diglyme=bis(2-metoxyethyl)ether) as precursor compound. The coatings were deposited on Si(100) and commercial silica slides in nitrogen+wet oxygen atmospheres, at temperatures between 200 and 500 °C, with particular attention to the structural and compositional evolution as a function of the synthesis conditions and growth surface. The obtained samples were characterized by glancing-incidence x-ray diffraction (GIXRD), secondary ion mass spectrometry (SIMS), x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM), for a detailed determination of their microstructure, chemical composition, and surface morphology. This work is dedicated to the XPS characterization of a representative LaOF thin film deposited on Si(100) at 500 °C. Besides the wide scan spectrum, detailed spectra for the La 3d, F 1s, O 1s, and C 1s regions and related data are presented and discussed. Both the F/La atomic ratio and La 3d peak shape and position point to the formation of stoichiometric LaOF thin films. Moreover, carbon contamination was merely limited to the outermost sample layers. © 2005 American Vacuum Society.
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81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
82.45.Aa Electrochemical synthesis
82.45.Mp Thin layers, films, monolayers, membranes
82.80.-d Chemical analysis and related physical methods of analysis

Potassium Permanganate by XPS

Masaoki Oku, Toetsu Shishido, and Shigemi Kohiki

Surf. Sci. Spectra 11, 59 (2004); http://dx.doi.org/10.1116/11.20050301 (7 pages)

Online Publication Date: 23 November 2005

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Potassium permanganate, KMnO4, is a d0 compound as TiO2. It has been shown that TiO2 has satellite peaks in the core level spectra due to many body effects in the photoemission process. It is interesting whether manganese compounds of d0 have the satellite peaks or not. This submission provides information that may be useful for the discussion of the photoemission process. The intrinsic satellite peaks are distinct from the inelastic scattering energy loss peaks. In this study, XPS core- and valence band-level spectra including the energy loss parts were taken for the in situ fractured surfaces KMnO4 crystals. The crystals grown from the aqueous solution were used because the sample is light sensitive. © 2005 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
73.20.At Surface states, band structure, electron density of states

Potassium Manganate by XPS

Masaoki Oku, Toetsu Shishido, and Shigemi Kohiki

Surf. Sci. Spectra 11, 66 (2004); http://dx.doi.org/10.1116/11.20050302 (7 pages)

Online Publication Date: 23 November 2005

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Potassium manganate, K2MnO4, has an electronic structure of d1. As it has one unpaired electron, it has exchange interaction between the core and valence electrons in the photoemission process. It is an interesting question whether manganese compounds of high oxidation number and strong covalent bonding exhibit satellite peaks in XPS spectra, or not. This submission provides information that may be useful for the discussion of the photoemission process. In this study, XPS core- and valence-band level spectra including the energy loss parts were taken for the in situ fractured surfaces of K2MnO4 crystals. Crystals grown from an aqueous solution and stocked in KOH solution were used because the sample is moisture sensitive. © 2005 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
73.20.At Surface states, band structure, electron density of states
71.70.Gm Exchange interactions

X-ray Photoelectron Spectroscopy Studies of Oxidized and Reduced CeO2(111) Surfaces

Mark Engelhard, Samina Azad, C.H.F. Peden, and S. Thevuthasan

Surf. Sci. Spectra 11, 73 (2004); http://dx.doi.org/10.1116/11.20050201 (9 pages) | Cited 5 times

Online Publication Date: 28 November 2005

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We have studied the electronic structure of oxidized and reduced CeO2(111) surfaces using x-ray photoelectron spectroscopy (XPS). The 50 nm thick CeO2(111) film was grown on a YSZ(111) substrate using oxygen plasma assisted molecular beam epitaxy (OPA-MBE). This film has been characterized using in situ (RHEED) reflection high energy electron diffraction and ex situ x-ray diffraction (XRD), high resolution transmission electron microscopy (HRTEM), and Rutherford backscattering spectroscopy (RBS). The lattice mismatch between CeO2(111) and YSZ(111) is less than 5% and yields a flat surface that is comprised of an equivalent number of Ce4+ and O2− ions. Oxidation with O2 at 773 K under UHV conditions was sufficient to fully oxidize the CeO2(111). Surface reduction was carried out by annealing in UHV at 973 K. Ceria is a technologically important metal oxide with many interesting catalytic properties. The most common use of ceria is in the treatement of automobile exhaust gases, primarily due to its oxygen strorage capacity (OSC), which allows reduction of NO as well as oxidation of CO in the catalytic converter. In a reducing atmosphere cerium ions shift from Ce4+ to Ce3+ whereas under oxidizing conditions they shift from Ce3+ to Ce4+, and the charge compensation is facilitated by oxygen vacancies that are produced on the reduced surface. In this study we have have used x-ray photoelectron spectroscopy (XPS) to investigate the electronic states of in situ oxidized and reduced CeO2(111). © 2005 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.65.Mq Oxidation
68.37.Lp Transmission electron microscopy (TEM)
68.49.Sf Ion scattering from surfaces (charge transfer, sputtering, SIMS)
81.40.Gh Other heat and thermomechanical treatments
82.45.Jn Surface structure, reactivity and catalysis
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
61.72.J- Point defects and defect clusters
73.20.-r Electron states at surfaces and interfaces

X-ray Photoelectron Spectroscopy Studies of Oxidized and Reduced Ce0.8Zr0.2O2(111) Surfaces

Samina Azad, Mark Engelhard, C.H.F. Peden, and S. Thevuthasan

Surf. Sci. Spectra 11, 82 (2004); http://dx.doi.org/10.1116/11.20050202 (9 pages)

Online Publication Date: 28 November 2005

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We have studied the electronic structure of oxidized and reduced Ce0.8Zr0.2O2(111) using x-ray photoelectron spectroscopy (XPS). The 50 nm thick Ce0.8Zr0.2O2(111) film was grown on a YSZ(111) substrate using oxygen plasma assisted molecular beam epitaxy (OPA-MBE). This film has been characterized using in situ reflection high energy electron diffraction (RHEED) and ex situ x-ray diffraction (XRD), high energy resolution transmission electron spectroscopy (HRTEM) and Rutherford backscattering spectroscopy (RBS). The surface of the Ce0.8Zr0.2O2(111) film used in this study is found to be unreconstructed and exhibits the structure of bulk CeO2(111) where Zr atoms occupy the lattice sites of Ce in the fluorite structure of ceria. The extent of surface reduction as a result of vacuum annealing has been reported here in addition to the electronic structure of the defect-free Ce0.8Zr0.2O2(111) surface. © 2005 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.65.Mq Oxidation
68.37.Lp Transmission electron microscopy (TEM)
68.49.Sf Ion scattering from surfaces (charge transfer, sputtering, SIMS)
81.40.Gh Other heat and thermomechanical treatments
73.20.-r Electron states at surfaces and interfaces
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Analysis of Straw by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 91 (2004); http://dx.doi.org/10.1116/11.20040801 (6 pages)

Online Publication Date: 29 December 2005

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Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Straw is an example of an agricultural residue (byproduct of food and feed production) of potential interest for biomass combustion. The XPS spectra of straw provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion; ash chemistry analysis — an elemental analysis of the ash content, expressed as oxides (which does not imply that they occur as oxides in the fuel). These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
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89.30.-g Fossil fuels and nuclear power
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
82.60.Cx Enthalpies of combustion, reaction, and formation

Analysis of Grain Screenings by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 97 (2004); http://dx.doi.org/10.1116/11.20040802 (8 pages)

Online Publication Date: 30 December 2005

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Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Grain screenings are an example of an agricultural residue (byproduct of food and feed production) of potential interest for biomass combustion. The XPS spectra of grain screenings provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion; ash chemistry analysis — an elemental analysis of the ash content, expressed as oxides (which does not imply that they occur as oxides in the fuel). These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
01.30.Kj Handbooks, dictionaries, tables, and data compilations
84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
82.33.Vx Reactions in flames, combustion, and explosions
82.60.Cx Enthalpies of combustion, reaction, and formation

Analysis of Sugar Beet Pulp by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 105 (2004); http://dx.doi.org/10.1116/11.20040803 (7 pages)

Online Publication Date: 30 December 2005

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Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Sugar beet pulp is an example of an agricultural residue (byproduct of food and feed production) of potential interest for biomass combustion. The XPS spectra of sugar beet pulp provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion. These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
01.30.Kj Handbooks, dictionaries, tables, and data compilations
84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
82.33.Vx Reactions in flames, combustion, and explosions
82.60.Cx Enthalpies of combustion, reaction, and formation

Analysis of Shea Nut Shells by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 112 (2004); http://dx.doi.org/10.1116/11.20040804 (7 pages)

Online Publication Date: 30 December 2005

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Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Shea nut shells are an example of an agricultural residue (byproduct of food and feed production) of potential interest for biomass combustion. The XPS spectra of shea nut shells provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion; ash chemistry analysis — an elemental analysis of the ash content, expressed as oxides (which does not imply that they occur as oxides in the fuel). These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
01.30.Kj Handbooks, dictionaries, tables, and data compilations
82.60.Cx Enthalpies of combustion, reaction, and formation
84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
82.33.Vx Reactions in flames, combustion, and explosions

Analysis of Sunflower Shells by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 119 (2004); http://dx.doi.org/10.1116/11.20040805 (8 pages)

Online Publication Date: 30 December 2005

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Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Sunflower shells are an example of an agricultural residue (byproduct of food and feed production) of potential interest for biomass combustion. The XPS spectra of sunflower shells provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion; ash chemistry analysis — an elemental analysis of the ash content, expressed as oxides (which does not imply that they occur as oxides in the fuel). These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
01.30.Kj Handbooks, dictionaries, tables, and data compilations
84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
82.33.Vx Reactions in flames, combustion, and explosions
82.60.Cx Enthalpies of combustion, reaction, and formation

Analysis of Sawdust by X-ray Photoelectron Spectroscopy

Guilin Jiang, Ghaleb A. Husseini, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 11, 127 (2004); http://dx.doi.org/10.1116/11.20040806 (8 pages)

Online Publication Date: 30 December 2005

Full Text: | Download PDF

Show Abstract
Determining the chemical structure and composition of biomass fuels using x-ray photoelectron spectroscopy (XPS) can provide fundamental knowledge of their structures that is useful in understanding and predicting their combustion behavior. Sawdust is an example of a forest product residue (byproduct of paper and lumber production) of potential interest for biomass combustion. The XPS spectra of sawdust provide both its elemental composition and indications of its bonding. Traditional fuel analyses of this fuel are also provided. These include: ultimate analysis — the elemental composition of the overall fuel (C, H, N, S, and O); chlorine analysis — reported here as part of the ultimate analysis but formally a separate procedure; proximate analysis — the proximate composition of the fuel (moisture, fixed carbon, volatiles, and ash); heating value — the specific heat of combustion; ash chemistry analysis — an elemental analysis of the ash content, expressed as oxides (which does not imply that they occur as oxides in the fuel). These data are summarized with the XPS spectra. © 2005 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
01.30.Kj Handbooks, dictionaries, tables, and data compilations
84.60.Rb Thermoelectric, electrogasdynamic and other direct energy conversion
82.60.Cx Enthalpies of combustion, reaction, and formation
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