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Dec 2006

Volume 13, Issue 1, pp. 1-165


Silica-supported Ag-Au Bimetallic Nanosystems by XPS

Davide Barreca, Alberto Gasparotto, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 13, 1 (2006); http://dx.doi.org/10.1116/11.20060302 (8 pages)

Online Publication Date: 8 May 2007

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Bimetallic Ag-Au/SiO2 nanosystems were synthesized by sequential deposition of Au and Ag on silica substrates via rf-sputtering. Sample preparation was accomplished at 60 °C from Ar plasmas, using a constant sputtering time for gold (10 min), followed by silver deposition at different times (5-20 min) in order to vary the Ag/Au ratio as well as the total metal content. A proper choice of the synthesis conditions allowed us to obtain a controlled dispersion of silica-supported bimetallic nanoparticles with tailored size and shape, as evidenced by X-ray Photoelectron Spectroscopy (XPS), X-ray Excited Auger Electron Spectroscopy (XE-AES), Transmission Electron Microscopy (TEM), Selected Area Electron Diffraction (SAED), and optical absorption spectroscopy. This work is devoted to the XPS and XE-AES characterization of a representative Ag-Au/SiO2 specimen with an average nanoparticle size of 9 ± 5 nm. In particular, detailed scans for the C 1s, O 1s, Si 2s, Au 4f, Ag 3d, and Ag MNN regions and related data are presented and discussed. © 2007 American Vacuum Society.
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79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.15.Cd Deposition by sputtering
61.46.Df Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
01.30.Kj Handbooks, dictionaries, tables, and data compilations

ZnO:Er(III) Nanosystems Analyzed by XPS

Lidia Armelao, Davide Barreca, Gregorio Bottaro, Alberto Gasparotto, Daniele Leonarduzzi, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 13, 9 (2006); http://dx.doi.org/10.1116/11.20060301 (8 pages) | Cited 1 time

Online Publication Date: 31 May 2007

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ZnO:Er(III) nanosystems were synthesized by a combined rf-sputtering/sol-gel (SG) approach. In particular, the adopted route consists in the rf-sputtering of erbium (guest) onto as-prepared zinc oxide xerogels (host) obtained via sol-gel, followed by ex-situ heat treatments in air (300-600 °C, 1-5 h). The obtained samples were analyzed by glancing incidence x-ray diffraction (GIXRD), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS) and x-ray photoelectron spectroscopy (XPS), for a detailed investigation of their microstructure, surface morphology and chemical composition. The present work focuses on the XPS analysis of a selected ZnO:Er specimen, annealed at 400 °C for 5 h. Besides the wide scan spectrum, detailed spectra for the Zn 2p3/2, Zn 3p, Er 4d, O ls and C 1s regions and related data are presented and discussed. © 2007 American Vacuum Society.
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81.05.Dz II-VI semiconductors
81.07.De Nanotubes
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
68.35.B- Structure of clean surfaces (and surface reconstruction)
01.30.Kj Handbooks, dictionaries, tables, and data compilations

Nanostructured CeO2 Powders by XPS

Marta Maria Natile and Antonella Glisenti

Surf. Sci. Spectra 13, 17 (2006); http://dx.doi.org/10.1116/11.20060401 (14 pages)

Online Publication Date: 5 July 2007

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Two different synthetic routes were used to synthesize three nanostructured cerium (IV) oxide powders: Two samples were obtained by precipitation from a basic solution of cerium nitrate and treated at 523 and 923 K, respectively, the third one was prepared by a microwave-assisted heating hydrolysis method and treated at 523 K. Compared with the first method, microwave synthesis has the advantage of very short reaction times and produces small particles with a narrower particle size distribution. All of these advantages can be attributed to the fast and homogeneous microwave heating which gives rise to a rapid and more simultaneous nucleation and ready dissolution of the gel. The present work focuses on the XPS analysis: The influence of the heat treatment and the preparation procedure on the surface properties are deeply investigated. Besides the wide scan spectrum, detailed spectra for the Ce 3d, Ce 4d, O 1s, and C 1s regions and related data are presented and discussed. © 2007 American Vacuum Society.
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61.46.Df Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.40.Gh Other heat and thermomechanical treatments
64.75.-g Phase equilibria
01.30.Kj Handbooks, dictionaries, tables, and data compilations

La0.6Sr0.4Co0.8Fe0.2O3-δ and Fe2O3/La0.6Sr0.4Co0.8Fe0.2O3-δ Powders: XPS Characterization

Alessandro Galenda, Marta Maria Natile, and Antonella Glisenti

Surf. Sci. Spectra 13, 31 (2006); http://dx.doi.org/10.1116/11.20060602 (17 pages) | Cited 1 time

Online Publication Date: 5 July 2007

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Perovskite based oxides have been attracting great interest because of the possible applications in several technological fields such as energy production and gas sensing. The present work focuses on the XPS analysis of three perovskite-based powders: the first is a nanosized La0.6Sr0.4Co0.8Fe0.2O3-δ (LaSrCoFeO) system; the other two are Fe2O3/LaSrCoFeO nanocomposite powders which differ in the amount of deposited Fe2O3. The nanosized LaSrCoFeO perovskite was obtained by the Pechini method and treated at 1173 K for 26 h. Nanocomposite Fe2O3/LaSrCoFeO powder samples (Fe2O3/LaSrCoFeO = 1:9 and 1:1 wt) were obtained by wet impregnation. © 2007 American Vacuum Society.
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81.07.Wx Nanopowders
61.46.Df Structure of nanocrystals and nanoparticles ("colloidal" quantum dots but not gate-isolated embedded quantum dots)
79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.40.Gh Other heat and thermomechanical treatments
01.30.Kj Handbooks, dictionaries, tables, and data compilations

Core Level XPS Spectra of Silicon Dioxide Using Zirconium and Magnesium Radiations

A. R. Chourasia

Surf. Sci. Spectra 13, 48 (2006); http://dx.doi.org/10.1116/11.20060603 (10 pages)

Online Publication Date: 1 August 2007

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Core levels of silicon and oxygen in silicon dioxide have been studied by x-ray photoelectron spectroscopy. For this purpose zirconium Lalpha (energy = 2042.4 eV) and magnesium Kalpha (energy = 1253.6 eV) radiations have been employed. The XPS data in the silicon 1s, 2s, 2p, and Auger KLL, and oxygen 1s, and Auger KLL regions are presented. The spectral data have not been corrected for the charging effect. The data set will serve as a source of valuable information for analyzing spectra associated with silicon and oxygen in silicon dioxide. © 2006 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
79.20.Fv Electron impact: Auger emission

XPS Study of MgO Nanopowders Obtained by Different Preparation Procedures

Fares Khairallah and Antonella Glisenti

Surf. Sci. Spectra 13, 58 (2006); http://dx.doi.org/10.1116/11.20060601 (14 pages)

Online Publication Date: 7 August 2007

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Three different samples of nanoscale magnesium oxide were synthesized using an “aqueous wet chemical method” and a “surfactant method”. In the first case, MgO was obtained by gelation/precipitation from a solution containing Mg2+ while in the surfactant method a micellar liquid is created by adding the Mg2+ solution to the surfactant. In this last case two different surfactants have been used: Brij 56 and Triton 100-x. In this work, the influence of the preparation procedure on the surface properties is investigated by XPS. Besides the wide scan spectrum, detailed spectra for the Mg 1s, Mg 2p, O 1s and C is regions and related data are presented and discussed. The XPS analysis shows the presence of magnesium carbonate in the outermost layers. Carbonate species are more evident in the samples obtained by the surfactant method whereas no significant differences can be observed by using different surfactants. Moreover, in all the nanopowders, both MgO and Mg(OH)2 are evident. © 2007 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.16.Be Chemical synthesis methods
81.07.Bc Nanocrystalline materials

UO2 (111) Single Crystal: Comparison of Stoichiometric and Defective Surfaces by XPS

Sanjaya D. Senanayake and Hicham Idriss

Surf. Sci. Spectra 13, 72 (2006); http://dx.doi.org/10.1116/11.20050601 (9 pages)

Online Publication Date: 4 September 2007

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This work undertakes a photoelectron study of the surface of a uranium dioxide(111) single crystal. The formation of a defected surface with argon ions sputtering can be identified as an n-type semiconductor, UO2-x phase. Annealing to high temperatures under an oxygen pressure of ∼5 × 10-6 Torr for 30 min or more yielded the hyper-stoichiometric p-type semiconductor, UO2+x phase. A shift in the core level line of U4+ ions is observed and attributed to a shift in the Fermi level from hyper-stoichiometric UO2+x to sub-stoichiometric UO2-x. © 2007 American Vacuum Society.
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68.47.Fg Semiconductor surfaces
61.66.Bi Elemental solids
61.66.Dk Alloys
73.20.At Surface states, band structure, electron density of states
79.60.Bm Clean metal, semiconductor, and insulator surfaces
79.20.Rf Atomic, molecular, and ion beam impact and interactions with surfaces
61.72.Cc Kinetics of defect formation and annealing

Silica-Based Thin Films by PE-CVD: An XPS Characterization

Davide Barreca, Alberto Gasparotto, Chiara Maccato, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 13, 81 (2006); http://dx.doi.org/10.1116/11.10061007 (6 pages)

Online Publication Date: 24 September 2007

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Hybrid silica-based (SiOxCyHz) thin films were deposited via plasma enhanced-chemical vapor deposition (PE-CVD) on SiO2, Si(100) and Cu substrates starting from tetramethoxysilane (TMOS) as precursor compound. Depositions were performed from Ar/TMOS plasmas in the absence of oxidizing gases at temperatures as low as 60 °C. In particular, the dependence of the system composition, structure, morphology and optical properties on the applied rf-power (from 20 to 80 W) was investigated in detail. This work is devoted to the XPS (x-ray photoelectron spectroscopy) characterization of a representative SiOxCyHz thin film supported on Si(l00) and synthesized at 80 W, with particular regard to the origin of the organic residuals incorporated in the obtained hybrid material. © 2007 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
68.55.A- Nucleation and growth
68.55.-a Thin film structure and morphology

Cerium (III) Fluoride Thin Films by XPS

Davide Barreca, Alberto Gasparotto, Chiara Maccato, Cinzia Maragno, and Eugenio Tondello

Surf. Sci. Spectra 13, 87 (2006); http://dx.doi.org/10.1116/11.20070202 (7 pages)

Online Publication Date: 29 October 2007

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Nanocrystalline cerium fluoride thin films were synthesized by chemical vapor deposition (CVD) using Ce(hfa)3⋅diglyme (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; diglyme=bis (2-metoxyethyl)ether) as precursor compound on Si(100) under N2+O2 atmosphere. The obtained samples were analyzed by glancing-incidence x-ray diffraction (GIXRD), x-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM), for a thorough characterization of their microstructure, chemical composition, and morphology. This work is specifically dedicated to the XPS characterization of a representative CeF3 thin film deposited at 350 °C. Besides the wide scan spectrum, detailed spectra for the Ce 3d, F 1s, O 1s, and C 1s regions and related data are presented and discussed. Both the F/Ce atomic ratio and Ce 3d peak shape and position point out to the formation of CeF3 films, in agreement with the structural characterization. Moreover, carbon contamination is merely limited to the outermost sample layers. © 2007 American Vacuum Society.
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81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
81.07.Bc Nanocrystalline materials
79.60.-i Photoemission and photoelectron spectra
68.55.-a Thin film structure and morphology

Cr2O3 Thin Films on Ag(111) by XPS

W.A.A. Priyantha and George D. Waddill

Surf. Sci. Spectra 13, 94 (2006); http://dx.doi.org/10.1116/11.20050901 (6 pages)

Online Publication Date: 29 October 2007

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Cr2O3 (0001) films are grown on Ag(111) by repeated cycles of 0.5 ML deposition of Cr followed by annealing in O2 at 240 °C for 5 min at 10-5 Torr. The spectra shown are for a 15 Å thick Cr2O3 film. © 2007 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
68.55.-a Thin film structure and morphology
68.55.A- Nucleation and growth

Cleaved Natural Orpiment (As2S3) by XPS

Claire Corkhill, Paul L. Wincott, and David J. Vaughan

Surf. Sci. Spectra 13, 100 (2006); http://dx.doi.org/10.1116/11.20061001 (9 pages)

Online Publication Date: 28 December 2007

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Orpiment (As2S3) is an arsenic ore mineral formed in low temperature hydrothermal veins and hotsprings, and commonly associated with other arsenic minerals such as realgar (AsS). It is of significance environmentally in areas affected by acid mine drainage where oxidation causes both the generation of acid and the release of arsenic in surface water and groundwater. The sample studied here is a natural crystal from Twin Creeks Mine, Nevada, which was fractured along the [010] cleavage plane under a dry nitrogen atmosphere before XPS analysis. General survey and high resolution spectra were collected using a Kratos Axis Ultra spectrometer under normal operating conditions. Adventitious carbon was used for energy referencing. Charge corrected binding energies for the photoelectrons emitted from orpiment (S 2s, S 2p, As 3p, As 3d, O 1s and C 1s) are reported. These binding energies are of use in experiments characterising the surface chemistry of orpiment providing insights into the reactivity of the mineral. © 2007 American Vacuum Society.
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91.60.Mk Optical properties
79.60.-i Photoemission and photoelectron spectra
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
61.50.Lt Crystal binding; cohesive energy

Cleaved Natural Realgar (AsS) by XPS

Claire Corkhill, Paul L. Wincott, and David J. Vaughan

Surf. Sci. Spectra 13, 109 (2006); http://dx.doi.org/10.1116/11.20061002 (8 pages)

Online Publication Date: 28 December 2007

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Realgar (AsS) is an arsenic ore mineral formed in low temperature hydrothermal veins and hotsprings, and commonly associated with other arsenic minerals such as orpiment (As2S3). It is of significance environmentally in areas affected by acid mine drainage where oxidation causes both the generation of acid and the release of arsenic in surface water and groundwater. The sample studied here is a natural crystal from The Realgar Mine, Shimen, China, which was fractured along the [010] cleavage plane under a dry nitrogen atmosphere before XPS analysis. General survey and high resolution spectra were collected using a Kratos Axis Ultra spectrometer under normal operating conditions. Adventitious carbon was used for energy referencing. Charge corrected binding energies for the photoelectrons emitted from realgar (S 2s, S 2p, As 3p, As 3d, O 1s and C 1s) are reported. These binding energies are of use in experiments characterising the surface chemistry of realgar providing insights into the reactivity of the mineral. © 2007 American Vacuum Society.
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79.60.-i Photoemission and photoelectron spectra
61.50.Lt Crystal binding; cohesive energy

Polyolefin Homopolymer and Copolymer Spectra by ToF-SIMS

David W. Abmayr

Surf. Sci. Spectra 13, 117 (2006); http://dx.doi.org/10.1116/11.20030803 (49 pages)

Online Publication Date: 28 December 2007

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Time-of-flight secondary ion mass spectrometry spectra (positive ion) of 25 different polymers are presented. The presented spectra are primarily semicrystalline thermoplastic polyolefins and elastomeric polyolefins, but include several other commonly used homopolymers and copolymers. The spectra data set includes: high-density polyethylene, polypropylene, ethylene-propylene rubber, poly 1-butene, ethylene-butene copolymer, poly 4-methyl 1-pentene, poly 1-hexene, ethylene-vinyl acetate copolymer, polyisobutylene, butyl rubber, brominated polyisobutylene 4-methylstyrene rubber, ethylene-methyl acrylate copolymer, polybutadiene, polyisoprene, natural rubber, polychloroprene, polystyrene, styrene-butadiene rubber, and poly 4-methylstyrene, polyethylene glycol, polyethylene terephthalate, and polytetrafluoroethylene. These spectra can be used for the comparitive identification of unknown polymers. © 2007 American Vacuum Society.
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82.80.Rt Time of flight mass spectrometry
83.80.Tc Polymer blends
83.80.Va Elastomeric polymers
82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
82.35.Jk Copolymers, phase transitions, structure
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