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Dec 2010

Volume 17, Issue 1, pp. 1-114


Analysis of Coal by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Lei Pei, Guilin Jiang, Larry L. Baxter, and Matthew R. Linford

Surf. Sci. Spectra 17, 1 (2010); http://dx.doi.org/10.1116/11.20080402 (67 pages)

Online Publication Date: 7 November 2011

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Coal remains a primary fuel for power generation. Herein we present time-of-flight secondary ion mass spectra (ToF-SIMS data) taken with a Ga primary ion beam from ca. 30 coal specimens. These commercially different coal specimens were obtained from coal mining companies and/or power plants. They represent all major coal types used in power generation (bituminous coals, subbituminous coals, and lignites), and include low-rank materials (lignites and subbituminous coals), which are represented as a minor portion of the data. Often, inorganic ions (Na+, Al+, Si+, and K+) are pronounced in the spectra, overshadowing peaks from organic moieties. This reflects the high sensitivity of SIMS under our analysis conditions for these inorganic species. These results, including a previous, published chemometrics analysis of this data (L. Pei, G. Jiang, B. J. Tyler, L. L. Baxter, and M. R. Linford, Energy & Fuels 2008, 22, 1059), suggest that ToF-SIMS can be a useful method for coal analysis.
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82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
82.80.Rt Time of flight mass spectrometry
89.30.ag Coal

Ni3Al and NiAl by XPS

Naofumi Ohtsu, Akiko Nomura, and Toetsu Shishido

Surf. Sci. Spectra 17, 68 (2010); http://dx.doi.org/10.1116/11.20081001 (8 pages)

Online Publication Date: 23 November 2011

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Core- and valence-band levels XPS spectra of Ni3Al and NiAl including the energy loss parts were obtained for an in-situ fractured surface. Polycrystalline Ni3Al and NiAl were prepared by arc melting under argon atmosphere; this was followed by annealing at pressures less than 2.0 × 10−3 Pa.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.40.Gh Other heat and thermomechanical treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
73.20.At Surface states, band structure, electron density of states

ZnO/MgO Nanocomposites by Wet Impregnation: An XPS study

Fares Khairallah, Antonella Glisenti, Marta Maria Natile, and Alessandro Galenda

Surf. Sci. Spectra 17, 76 (2010); http://dx.doi.org/10.1116/11.20070803 (11 pages)

Online Publication Date: 6 January 2012

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Zinc oxide/magnesium oxide nanocomposite powders were prepared by wet impregnation of nanosized magnesia powders. The supporting magnesia was obtained by precipitation from a solution of magnesium nitrate. The samples are characterized by a nominal (i.e. calculated from the weighted amount of precursors) Zn/Mg atomic ratio of 0.01 (Accession #1189), 0.1 (Accession #1190), 0.25 (Accession #1191), and 0.5 (Accession #1192). The surface properties and the influence of the Zn/Mg atomic ratio are investigated by means of XPS (using a standard Al Kα). Besides the wide scan spectra, detailed spectra for the Mg 1s, Zn 2p3/2 and O 1s regions and related data are presented and discussed. XPS analysis confirms the presence of MgO and ZnO; the peak shapes are consistent with a more heterogeneous situation for the samples with lower Zn/Mg atomic ratios. The XPS Zn/Mg atomic ratio increases with increasing the nominal Zn/Mg atomic ratio reaching a plateau (of about 0.70) for the [Zn/Mg]nom = 0.25. The decrease of the O/(Mg+Zn) atomic ratio observed with increasing the Zn/Mg one (from 2.5 for [Zn/Mg]nom = 0.01 to 1.9 for [Zn/Mg]nom = 0.5) suggests a lower reactivity of ZnO with respect to atmosphere. This result is confirmed by the O 1s peak shape evolution.
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81.16.Be Chemical synthesis methods
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
79.60.Jv Interfaces; heterostructures; nanostructures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.07.Wx Nanopowders

Gas Phase Deposition of Trichloro(1H,1H,2H,2H-perfluorooctyl)silane on Silicon Dioxide, by XPS

Michael V. Lee, Ghaleb Husseini, Ken Sautter, and Matthew R. Linford

Surf. Sci. Spectra 17, 87 (2010); http://dx.doi.org/10.1116/11.20071103 (6 pages)

Online Publication Date: 7 February 2012

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Monolayers of trichloro(lH,1H,2H,2H-perfluorooctyl)silane, Cl3SiCH2CH2(CF2)5CF3, were deposited via chemical vapor deposition onto the native oxide layer on silicon after plasma-cleaning. The samples have high hydrophobicity, and provide a valuable comparison to perfluorinated alkyl silane layers obtained by liquid deposition. Gas-phase deposition of perfluorinated alkyl silanes is a useful means for reducing stiction in micro- and nano-electromechanical systems, which have narrow spaces that can trap bubbles and prevent liquid-based silane passivation.
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81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
52.77.Bn Etching and cleaning
68.03.Cd Surface tension and related phenomena
79.60.Fr Polymers; organic compounds

CuO/ZnO Nanocomposites Investigated by X-ray Photoelectron and X-ray Excited Auger Electron Spectroscopies

Quentin Simon, Davide Barreca, and Alberto Gasparotto

Surf. Sci. Spectra 17, 93 (2010); http://dx.doi.org/10.1116/11.20111002 (9 pages)

Online Publication Date: 13 February 2012

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Supported CuO/ZnO nanocomposites were prepared by a novel bottom-up approach, consisting of: i) deposition of columnar ZnO arrays on Si(100) by Plasma Enhanced-Chemical Vapor Deposition (PE-CVD) using a Zn(II) bis(ketoiminate) precursor; ii) Radio Frequency (RF)-sputtering of Cu in Ar atmospheres. Finally, ex-situ annealing was performed in air at 400 °C to promote a complete copper oxidation. The CuO/ZnO nanocomposites were characterised by Glancing Incidence X-ray Diffraction (GIXRD), Transmission Electron Microscopy (TEM), Field Emission-Scanning Electron Microscopy (FE-SEM) and Energy Dispersive X-ray Spectroscopy (EDXS), providing important information on their chemical, morphological and structural properties. In this contribution, a detailed investigation of a representative sample by X-ray Photoelectron (XPS) and X-ray Excited Auger Electron (XE-AES) Spectroscopies is presented, with particular attention to the analysis of O 1s, Zn 2p3/2 and Cu 2p core levels, as well as zinc and copper Auger signals.
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81.07.Bc Nanocrystalline materials
82.80.Ej X-ray, Mössbauer, and other γ-ray spectroscopic analysis methods
61.46.Hk Nanocrystals
79.20.Fv Electron impact: Auger emission
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Jv Interfaces; heterostructures; nanostructures

Diblock and Triblock Fluorinated Copolymers: An ARXPS Study

Antonella Glisenti, Marta Maria Natile, Alessandro Galenda, Elisa Martinelli, and Giancarlo Galli

Surf. Sci. Spectra 17, 102 (2010); http://dx.doi.org/10.1116/11.20070701 (13 pages)

Online Publication Date: 21 February 2012

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In this contribution we prepared (by TEMPO-mediated radical polymerization) two triblock copolymers (poly(S-b-SF8-b-SP3) and poly(S-b-SP3-b-SF8)) of the A-B-C and A-C-B types composed of hydrophobic styrene (A), hydrophobic/lipophobic fluorinated styrene (B), and hydrophilic PEG-modified styrene (C) polymer blocks with greatly varied degrees of polymerization. A diblock copolymer (poly(S-b-SF8)) was used for comparison. The resulting surface structure and organization of the polymer films were investigated by x-ray photoelectron spectroscopy at different angles (70°, 50°, and 20° being the angle between the analyzer axis and the specimen normal). Besides the wide scan spectra, detailed spectra for the C 1s, F 1s and O 1s regions and related data are presented and discussed. XPS analysis reveals the preferential surface segregation of the phase-separated fluorinated block regardless of the distinctly different macromolecular architectures of the triblock copolymers.
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82.35.Jk Copolymers, phase transitions, structure
64.75.Va Phase separation and segregation in polymer blends/polymeric solutions
68.35.bm Polymers, organics
82.30.Cf Atom and radical reactions; chain reactions; molecule-molecule reactions
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Fr Polymers; organic compounds
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