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Surface Science Spectra / Volume 17 / Issue 1

Surf. Sci. Spectra 17, 68 (2010); http://dx.doi.org/10.1116/11.20081001 (8 pages)

Ni3Al and NiAl by XPS

Naofumi Ohtsu1, Akiko Nomura2, and Toetsu Shishido2

1Instrumental Analysis Center, Kitami institute of Technology, 165 Koen-cho, Kitami, Hokkaido 090-8507, Japan
2Institute for Materials Research, Tohoku University, 2-1-1 Katahira Aoba-ku, Sendai, Miyagi 980-8577, Japan

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(Published online 23 November 2011)

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Core- and valence-band levels XPS spectra of Ni3Al and NiAl including the energy loss parts were obtained for an in-situ fractured surface. Polycrystalline Ni3Al and NiAl were prepared by arc melting under argon atmosphere; this was followed by annealing at pressures less than 2.0 × 10−3 Pa.

© 2011 American Vacuum Society

ACKNOWLEDGMENTS

The XPS measurement was performed at Advanced Research Center of Metallic Glasses, Institute for Materials Research, Tohoku University.

Article Outline

  1. INTRODUCTION
  2. SPECIMEN DESCRIPTION (Accession #01184, 1 of 2)
  3. SPECIMEN DESCRIPTION (Accession #01185, 2 of 2)
  4. INSTRUMENT DESCRIPTION
  5. INSTRUMENT PARAMETERS COMMON TO ALL SPECTRA
    1. Spectrometer
    2. Geometry
  6. DATA ANALYSIS METHOD

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KEYWORDS and PACS

Keywords

aluminium alloys, annealing, core levels, melt processing, nickel alloys, valence bands, X-ray photoelectron spectra, Ni3Al and NiAl, XPS, in-situ fracturing, arc melting

PACS

  • 79.60.Bm

    Clean metal, semiconductor, and insulator surfaces

  • 81.40.Gh

    Other heat and thermomechanical treatments

  • 82.80.Pv

    Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

  • 73.20.At

    Surface states, band structure, electron density of states

History
Received 25 October 2010
Accepted 14 April 2011
Published online 23 November 2011
Digital Object Identifier
http://dx.doi.org/10.1116/11.20081001

PUBLICATION DATA

ISSN

1055-5269 (print)  
1520-8575 (online)

Publisher

American Vacuum Society

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