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Oct 1993

Volume 2, Issue 4, pp. 271-348


Study of the First Row Transition Metals by AES

Eric S. Lambers

Surf. Sci. Spectra 2, 271 (1993); http://dx.doi.org/10.1116/1.1247709 (34 pages)

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AES spectra have been obtained from metals in the first row of transition elements using a Perkin Elmer PHI Model 660 scanning Auger electron microprobe. The goal was to obtain spectra which represented what would normally be obtained under typical operating conditions. Auger spectra were taken from Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, and Ge samples under identical conditions. Each elemental spectrum was obtained using electron beam energies of 3, 5, 10, and 20 keV and 50 nA beam currents. Data from the LMM peak from a Cu sample was used to calculate the signal‐to‐noise ratio and to check instrumental calibration. The signal‐to‐noise ratio before and after analysis was the same and equal to 25, 48, 45, and 45 for 3, 5, 10, and 20 keV beams, respectively. The instrumental resolution used for all spectra was 0.6%.
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79.20.Fv Electron impact: Auger emission
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
68.35.Dv Composition, segregation; defects and impurities

AES Study of the First Row of Transition Metals

Jorge Duarte and M. A. Ray

Surf. Sci. Spectra 2, 305 (1993); http://dx.doi.org/10.1116/1.1247710 (38 pages)

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AES spectra were obtained from elements of the first row of the transition metals using a Perkin Elmer 595 Scanning Auger Microprobe. The goal was to obtain spectra which represented what would normally be obtained under typical operating conditions. Auger spectra were take from Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, and Ge samples under identical conditions. Each elemental spectrum was obtained with electron beam energies 3, 5, and 10 keV using a 1 μA electron beam. A Cu sample was also used to obtain data in calculating the signal‐to‐noise ratio and in checking instrument calibration. Signal‐to‐noise ratios were obtained using the primary Cu LMM peak located at 916 eV. The signal‐to‐noise ratios were measured before and after analysis and were 20, 30, and 70 for electron beam energies of 3, 5, and 10 keV, respectively. The instrumental energy resolution used for all of these measurements was 0.6%±0.03%.
Show PACS
79.20.Fv Electron impact: Auger emission
68.35.Dv Composition, segregation; defects and impurities
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Characterization of Polyethylene by XPS

Azzam N. Mansour and Bruce C. Beard

Surf. Sci. Spectra 2, 343 (1993); http://dx.doi.org/10.1116/1.1247711 (6 pages)

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X‐ray photoemission spectra of the core and valence levels for high density polyethylene are presented. Low resolution (i.e., pass energy of 89.45 eV) XPS survey scan and higher resolution (i.e., pass energy of 35.75 eV) multiplexes of the C 1s, C KLL (x‐ray induced Auger lines), and valence band region were collected on a Perkin‐Elmer/Physical Electronics model ♯5400 spectrometer using non‐monochromated Mg x rays. These spectra serve as reference for identifying the chemistry and thickness of hydrocarbon contaminants present on most surfaces studied by XPS.
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79.60.Fr Polymers; organic compounds
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
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