SSS Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

When viewing PDF, click on blue accession number located in the caption of each figure to download the data.

Search Issue | RSS Feeds RSS
Next Issue

Jan 1993

Volume 2, Issue 1, pp. 1-88


High Resolution XPS Spectrum of Calcite (CaCO3)

D. R. Baer and J. F. Moulder

Surf. Sci. Spectra 2, 1 (1993); http://dx.doi.org/10.1116/1.1247719 (7 pages)

Full Text: | Download PDF

Show Abstract
Calcite is a common component of soil and a natural mineral sometimes found in the form of large high quality single crystals. The interactions of calcite with ions in groundwater affect their transport in the environment. Consequently, understanding the surface chemistry of calcite is important for environmental remediation research. The measurements reported here were conducted to provide high quality valence band and core level spectra of the clean calcite surface and for comparison with data collected on an older instrument with lower spatial and energy resolution. A single crystal was broken in vacuum to expose the (101̄4) plane of rhombohedral calcite (CaCO3) for XPS analysis. Survey and multiplex spectra were collected under standard operating conditions with a Perkin Elmer Physical‐Electronics 5600 spectrometer using monochromatic Al Kα x rays. An electron flood gun was used to control surface charging during the measurements.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Polytetrafluoroethylene Characterized by XPS, with Monochromatic Al Source

Bruce C. Beard and Robert A. Brizzolara

Surf. Sci. Spectra 2, 8 (1993); http://dx.doi.org/10.1116/1.1247715 (5 pages)

Full Text: | Download PDF

Show Abstract
Polytetrafluorethylene (PTFE) is a technologically important material employed for broad applications due to its exceptional properties for lubrication, insulation, and chemical inertness. With regard to surface analysis, PTFE has been found to provide a ready standard source for the x‐ray photoelectron F 1s line in a polymeric matrix. A previous submission [M. Ackeret, Surf. Sci. Spectra 1, 100 (1992)] examined the uniformity of the atomic composition over the surface layers by angle dependent XPS analysis of the C 1s and F 1s lines. In this submission we wish to present a compilation of the photoelectron, Auger, and valence band transitions excited by monochromatic Al x‐ray radiation.
Show PACS
79.60.Fr Polymers; organic compounds
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

MgO(100) by XPS

Richard P. Vasquez

Surf. Sci. Spectra 2, 13 (1993); http://dx.doi.org/10.1116/1.1247718 (7 pages)

Full Text: | Download PDF

Show Abstract
XPS measurements of the core levels, including energy losses, and the valence band of a MgO(100) crystal are presented.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
71.20.-b Electron density of states and band structure of crystalline solids

Sodium Salts of Chlorine Oxyacid Anions, Cl(+3), Chlorite, XPS Comparison Spectra

Bruce C. Beard

Surf. Sci. Spectra 2, 20 (1993); http://dx.doi.org/10.1116/1.1247720 (6 pages)

Full Text: | Download PDF

Show Abstract
High quality sodium chlorite has been analyzed as part of a series of chlorine oxyacid salts, chlorite to perchlorate. The spectra include survey and high resolution scans over the major photopeaks, the sodium Auger transitions and the valence band of the compound. Spectra for this compound were collected with the magnesium x‐ray source. Several literature references are provided as additional sources of XPS data and description of the chemistry of chlorine oxyacid anions.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Sodium Salts of Chlorine Oxyacid Anions, Cl(+5), Chlorate, XPS Comparison Spectra

Bruce C. Beard

Surf. Sci. Spectra 2, 26 (1993); http://dx.doi.org/10.1116/1.1247721 (5 pages)

Full Text: | Download PDF

Show Abstract
High quality sodium chlorate has been analyzed as part of a series of chlorine oxyacid salts, chlorite to perchlorate. The spectra include survey and high resolution scans over the major photopeaks, the sodium Auger transitions and the valence band of the compound. Spectra for this compound were collected with the magnesium x‐ray source. Several literature references are provided as additional sources of XPS data and description of the chemistry of chlorine oxyacid anions.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Native Oxide Chemistry of Amorphous Al90Fe7Ce3 Alloy by Angle Resolved XPS

Azzam N. Mansour, S. J. Poon, Y. He, and G. J. Shiflet

Surf. Sci. Spectra 2, 31 (1993); http://dx.doi.org/10.1116/1.1247722 (14 pages)

Full Text: | Download PDF

Show Abstract
X‐ray photoemission spectra of the core and valence band levels for an amorphous Al90Fe7Ce3 ribbon are presented. Survey scan and high resolution multiplexes of the C 1s, O 1s, F 1s, Al 2p, Al 2s, Fe 2p, and Ce 3d photoelectron lines and the valence band region were collected on a Perkin‐Elmer/Physical Electronics model ♯5400 photoelectron spectrometer using monochromatized Al x rays. Angle resolved spectra of the O 1s, Al 2p, and Al 2s photoelectron lines for emission angles of 5°, 15°, 25°, 35°, 45°, 55°, 60°, 65°, 70°, 75°, 78°, and 80° relative to sample normal were also collected to aid in identifying the chemistry of the native oxide. The material, 25 μm thick amorphous ribbon, was prepared by rapid solidification of the metallic components from the liquid phase using the melt‐spinning method. The material is of technological importance due to its extremely high strength, low density, and anticipated high corrosion resistance. Analysis of XPS data reveals the following conclusions: (i) the chemistry of the native oxide is similar to that of an aluminum oxyhydroxide chemistry namely, AlOx(OH)y, (ii) the oxygen 2s line consists of low (∼531.2 eV) and high (∼532.4 eV) binding energy peaks corresponding to ionic O and OH chemistries in AlOx(OH)y, respectively, with the ratio of the mole fraction of OH to that of O decreasing with decrease in electron emission angle, (iii) both the aluminum 2p and 2s lines consist of low and high binding energy peaks corresponding to Al in AlOx(OH)y and Al in Al90Fe7Ce3, respectively, (iv) both Fe and Ce are present in metallic forms as in Al90Fe7Ce3 with no indication of any segregation of oxidized species into the native oxide region, (v) F is present in small quantities as a surface impurity, and (vi) the presence of a native oxide coating of AlOx(OH)y may enhance the corrosion resistance of such a class of amorphous alloys.
Show PACS
79.60.Ht Disordered structures
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

SnO by XPS

Michael A. Stranick and Anthony Moskwa

Surf. Sci. Spectra 2, 45 (1993); http://dx.doi.org/10.1116/1.1247723 (5 pages) | Cited 7 times

Full Text: | Download PDF

Show Abstract
Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x‐ray photoelectron spectroscopy has been used to obtain comparison spectra of a SnO powder. The SnO powder was generated by grinding ∼150 μm granules of SnO in a mortar and pestle. Grinding is necessary because surface oxidation of the SnO granules occurs producing a SnO2 shell. It has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence peak is also characteristic of Sn oxides [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. In the present study, identification of the powder as SnO after grinding was verified by comparison of the measured XPS valence band spectrum with published spectra [J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)] and by the XPS Sn:O atomic ratio. The valence band–Sn 4d separation is also consistent with that determined for SnO [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992)]. Core level, valence band and x‐ray excited Auger spectra for the SnO powder are presented. Data were obtained with a Perkin‐Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation.
Show PACS
79.60.-i Photoemission and photoelectron spectra
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

SnO2 by XPS

Michael A. Stranick and Anthony Moskwa

Surf. Sci. Spectra 2, 50 (1993); http://dx.doi.org/10.1116/1.1247724 (5 pages) | Cited 9 times

Full Text: | Download PDF

Show Abstract
Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x‐ray photoelectron spectroscopy has been used to obtain comparison spectra of a high purity SnO2 powder. Due to rather small core level chemical shifts, it has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO using XPS [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence band peak is also characteristic of Sn oxides [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. The valence band spectrum and the valence band–Sn 4d separation reported in this work are consistent with literature data [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys., Rev. B 46, 2460 (1992); P. M. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. Auger parameter data may also prove useful for distinguishing between various tin compounds on surfaces. Thus, in addition to core level spectra, valence band and x‐ray excited Auger spectra for SnO2 are presented. Data were obtained with a Perkin‐Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation.
Show PACS
79.60.-i Photoemission and photoelectron spectra
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Copper by XPS

A. C. Miller and G. W. Simmons

Surf. Sci. Spectra 2, 55 (1993); http://dx.doi.org/10.1116/1.1247725 (6 pages) | Cited 1 time

Full Text: | Download PDF

Show Abstract
High energy resolution spectra of high purity Cu foil that was scraped in situ are presented. The experimental width (16%–84% measurement) of the Fermi level of nickel obtained under identical experimental conditions was 0.32 ± 0.02 eV. The binding energy scale calibration is based on the position of the Au 4f7/2 line which is taken to be 83.98 eV [see M. T. Anthony and M. P. Seah, Surf. Interface Anal. 6, 95 (1984)]. The Auger spectra are presented primarily to provide information on the detailed structure of the line at high energy resolution and accurate measurements of the relative separations between the transitions contained within the line. Since the kinetic energy of a photoelectron depends upon the photon energy and the kinetic energy of an Auger electron does not, the position of the Auger electron on the binding energy scale is a function of the photon energy. For nonmonochromatic x‐ray excitation, the positions of the photoelectron lines and Auger lines are fixed relative to one another because the natural x‐ray line has a defined centroid. However, for monochromatic Al Ksubα radiation, the exact photon energy can deviate from the centroid energy by as much as 0.3 eV. Thus, there can be systematic deviations in the binding energies of the Auger lines as recorded with instruments using monochromatic radiation as compared to those using nonmonochromatic x‐ray sources. Comparison of the L3M4,5M4,5 line position with other published work [see M. P. Seah, G. C. Smith, and M. T. Anthony, Surf. Interface. Anal. 15, 293 (1990)] suggests that our photon energy is 1486.73 eV, and that all of the Auger line positions recorded in the table are systematically displaced by 0.15 eV.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
71.20.-b Electron density of states and band structure of crystalline solids

Si by XPS

Kazuhiro Nakajima, Sean P. McGinnis, and Michael A. Kelly

Surf. Sci. Spectra 2, 61 (1993); http://dx.doi.org/10.1116/1.1247726 (6 pages)

Full Text: | Download PDF

Show Abstract
X‐ray photoemission spectra from Si which has been chemically etched in HF (hydrofluoric acid) are presented. The data include measurements of the valence band region, Si 2p region, Si 2s region, and O 1s region. These data are useful for comparison to the oxidized Si.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.65.-b Surface treatments
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Polystyrene by XPS

Wayne K. Way, Scott W. Rosencrance, Nicholas Winograd, and David A. Shirley

Surf. Sci. Spectra 2, 67 (1993); http://dx.doi.org/10.1116/1.1247712 (4 pages)

Full Text: | Download PDF

Show Abstract
X‐ray photoelectron spectroscopy was used to analyze a thin film of polystyrene. Spin casting from a 2% by weight solution of polystyrene in toluene was utilized. Film thickness was determined to be 60 nm by ellipsometry. The thin film was examined with a Hewlett Packard 5950A ESCA spectrometer.
Show PACS
79.60.Fr Polymers; organic compounds
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
71.20.Rv Polymers and organic compounds

Polymethylmethacrylate by XPS

Scott W. Rosencrance, Wayne K. Way, Nicholas Winograd, and David A. Shirley

Surf. Sci. Spectra 2, 71 (1993); http://dx.doi.org/10.1116/1.1247740 (5 pages)

Full Text: | Download PDF

Show Abstract
X‐ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.
Show PACS
79.60.Fr Polymers; organic compounds
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Characterization of W84.9Ni9.5Fe5.6 Superalloy by XPS

Azzam N. Mansour and K. L. Vasanth

Surf. Sci. Spectra 2, 76 (1993); http://dx.doi.org/10.1116/1.1247713 (9 pages)

Full Text: | Download PDF

Show Abstract
X‐ray photoemission spectra of the core and valence levels for crystalline W–Ni–Fe superalloy are presented. Tungsten alloys are referred to as oquotessuperalloyscquotes because of their high density and strength and are important engineering materials for numerous military and industrial applications [see D. J. Jones and P. Munnery, Powder Metall. 10, 156 (1967)]. These alloys are prepared by liquid phase sintering [see P. N. Jones, Proceedings of the Second International Tungsten Symposium, San Francisco, CA, 1982 (unpublished), pp. 81–90] resulting in tungsten particles being cemented together by a solid solution of W–Ni–Fe with W being present in small quantities in the solid solution. The bulk composition of 84.9 W, 9.5 Ni, and 5.6 Fe at. % or 98.4 W, 3.4 Ni, and 1.9 Fe wt % [see K. L. Vasanth and C. M. Dacres, Proceedings of the 1987 Tri‐Service Conference on Corrosion, WP AFB, OH, 1987 (unpublished), AFWAL‐TR‐87‐4139, Vol. II, p. 165] was determined by EDAX analysis in a scanning electron microscope. XPS low resolution survey scan and higher resolution scans of the C 1s, O 1s, Si 2p, Fe 2p, Ni 2p, Ni L3VV, W 4f, and valence band region were collected on a Perkin Elmer/Physical Electronics model ♯ 5400 spectrometer using nonmonochromated Mg x rays. Analysis of XPS data reveals the following chemistries in the near surface region: (i) Fe is present in the form of Fe3O4, a highly oxygen deficient form of Fe2O3, and/or Fe2O3, (ii) Ni is mainly present as in Ni(OH)2, and (iii) the W metallic particles are covered with thin native oxide films of both WO2 and WO3. The excellent corrosion resistance of both nickel and tungsten metals is due, respectively, to the presence of Ni(OH)2 and WO2 and WO3 coatings on their surfaces.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Polytetrafluoroethylene Characterized by XPS, with Mg Source

Bruce C. Beard and Robert A. Brizzolara

Surf. Sci. Spectra 2, 85 (1993); http://dx.doi.org/10.1116/1.1247714 (4 pages)

Full Text: | Download PDF

Show Abstract
Polytetrafluorethylene (PTFE) is a technologically important material employed for broad applications due to its exceptional properties for lubrication, insulation, and chemical inertness. With regard to surface analysis, PTFE has been found to provide a ready standard source for the x‐ray photoelectron F 1s line in a polymeric matrix. A previous submission [M. Ackeret, Surf. Sci. Spectra 1, 100 (1992)] examined the uniformity of the atomic composition over the surface layers by angle dependent XPS analysis of the C 1s and F 1s lines. In this submission we wish to present the photoelectron transitions by Mg Kα radiation.
Show PACS
79.60.Fr Polymers; organic compounds
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
Close

© 2013 AVS Science & Technology of Materials, Interfaces, and Processing Help | Contact
close