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Apr 1994

Volume 3, Issue 2, pp. 93-174


Zinc Germanium Phosphide by XPS

W. Kevin Kuhn

Surf. Sci. Spectra 3, 93 (1994); http://dx.doi.org/10.1116/1.1247781 (7 pages)

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High quality single crystal ZnGeP2 has been analyzed by x‐ray photoelectron spectroscopy. This material is one of a group of pseudo‐III–V compounds that crystallize in a tetragonal chalcopyrite structure and have been shown to have very promising nonlinear optical properties. The spectra presented here include survey and high resolution scans of the photoemission peaks, the Zn and Ge Auger transitions, and the valence band of the compound. © 1995 American Vacuum Society
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Silver Gallium Sulfide by XPS

W. Kevin Kuhn

Surf. Sci. Spectra 3, 100 (1994); http://dx.doi.org/10.1116/1.1247769 (5 pages)

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High quality single crystal AgGaS2 has been analyzed by x‐ray photoelectron spectroscopy. This material is one of a group of I–III–VI2 compounds that crystallize in a tetragonal chalcopyrite structure and have been shown to have very promising nonlinear optical properties. The spectra presented here include survey and high resolution scans of the photoemission peaks and valence band spectra. © 1995 American Vacuum Society
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Sputter‐deposited Cr–Si–O Cermet Films by XPS

Imre Bertóti, Andras Tóth, and Miklos Móhai

Surf. Sci. Spectra 3, 105 (1994); http://dx.doi.org/10.1116/1.1247770 (7 pages)

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X‐ray photoelectron spectroscopy (XPS) was used to characterize thin film of Cr–Si–O cermet, rf sputter‐deposited onto a thermally oxidized Si wafer. Angle dependent spectra (θ=0° and 60°) were acquired on both the as received and the Ar+ ion sputtered states. In the as received state the topmost layer is enriched in Si and O; Si and Cr are present in both oxidized and reduced forms. After sputtering by Ar+ (2.5 keV, 6 × 1016 ions/cm2), Cr becomes reduced to Cr0, and the relative amount of Si0 increases substantially (i.e., up to about 40% of total Si). These reduced states are found to recombine to CrxSi‐type silicides. The Cr–Si–O layers are applied as precision thin film resistors of good long‐range stability with low temperature coefficient of resistivity. Heat treatment —leading to crystalline silicide phase—is used to consolidate the properties of these layers for device applications. We have shown (apparently for the first time), however, that room temperature ion impact can also create highly dispersed—nondetectable by XRD—silicide clusters, the formation of which has been deduced from the Si Auger parameter, being significantly higher for the silicide (aSi=1716.2–1716.5 eV) than for elemental Si (aSi=1716.0 eV). © 1995 American Vacuum Society
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79.60.Dp Adsorbed layers and thin films
81.15.Cd Deposition by sputtering

Natural Pumice by XPS

Antonella Rossi, Anna Maria Venezia, M. A. Floriano, and Giulio Deganello

Surf. Sci. Spectra 3, 112 (1994); http://dx.doi.org/10.1116/1.1247771 (9 pages)

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X‐ray photoelectron spectroscopy was used for characterizing pumice: it is a natural aluminosilicate with a high percentage of silica (∼70%), a low surface area (∼5 m2 g−1 as determined by the BET method) and a density of 2.3 g cm−3. It has a fine, porous physical structure which makes the material easy to machine and also determines its abrasive property. In contrast to the zeolites, pumice has an amorphous structure. Apart from its main use in the construction industry, pumice has begun to be of scientific interest when used as a support for metallic catalysts. Core and valence spectra were compared with standard Al2O3 and SiO2. The aim of this study is to examine the surface of this material. © 1995 American Vacuum Society
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82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Magnesium Aluminate (MgAl2O4) by XPS

Brian R. Strohmeier

Surf. Sci. Spectra 3, 121 (1994); http://dx.doi.org/10.1116/1.1247772 (7 pages)

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The XPS spectra of materials containing both magnesium and aluminum can exhibit a number of spectral artifacts when using a Mg Kα x‐ray source. These artifacts are easily observed in XPS spectra of magnesium aluminate (MgAl2O4, also known as magnesium aluminum oxide), which are presented in this article. For example, the Al 2p peak is overlapped by the Mg Kα x‐ray satellites from the Mg 2s peak, and the Mg Kα x‐ray induced Mg KLL Auger peak. In addition, the Mg 2p peak can be overlapped by a C 1s x‐ray ghost line caused by stray Al Kα x‐ray radiation when using a dual Mg/Al x‐ray source. Because of these artifacts, the amounts of Mg and Al in such samples should be quantified (when using a Mg Kα x‐ray source) using the Mg 2s and Al 2s peaks, respectively, which are free of these artifacts. © 1995 American Vacuum Society
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Zinc Aluminate (ZnAl2O4) by XPS

Brian R. Strohmeier

Surf. Sci. Spectra 3, 128 (1994); http://dx.doi.org/10.1116/1.1247773 (7 pages) | Cited 2 times

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Zinc aluminate (ZnAl4O4, also known as zinc aluminum oxide) is a material that has applications as a catalyst and catalyst support. This paper presents the XPS spectra of the major Zn, Al, and O photoelectron lines, and the major x‐ray induced Zn LMM Auger lines for ZnAl2O4. © 1995 American Vacuum Society
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82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Gamma‐Alumina (γ‐Al2O3) by XPS

Brian R. Strohmeier

Surf. Sci. Spectra 3, 135 (1994); http://dx.doi.org/10.1116/1.1247774 (6 pages)

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This article presents the main core lines and the valence band x‐ray photoelectron (XPS) spectra obtained for a commercial gamma‐alumina (γ‐Al2O3) powder. The electronic record includes the Al 2p, Al 2s, O 1s, O 2s, C 1s, and valence band spectra. Although it is usually difficult to distinguish among the various forms of aluminum oxide [Al2O3], oxyhydroxide [AlO(OH)] and hydroxide [Al(OH)3] based on the core XPS binding energies, the valence band spectra for many of these materials are unique. The valence band spectrum for γ‐Al2O3 shows two broad distinct peaks that are separated by about 3.3 eV. © 1995 American Vacuum Society
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82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Characterization of an Activated Alumina Claus Catalyst by XPS

Brian R. Strohmeier

Surf. Sci. Spectra 3, 141 (1994); http://dx.doi.org/10.1116/1.1247775 (6 pages)

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In this study, the surface composition of a fresh, commercial, alumina Claus catalyst (Alcoa S‐100) was examined by x‐ray photoelectron spectroscopy (XPS). This article presents the main XPS core lines and the valence band spectra obtained for the Claus catalyst. The electronic record includes the Al 2p, Al 2s, O 1s, O 2p, C 1s, and valence band spectra. © 1995 American Vacuum Society
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82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Boron Chemical Shifts in B6O

M. Belyansky, M. Trenary, and C. Ellison

Surf. Sci. Spectra 3, 147 (1994); http://dx.doi.org/10.1116/1.1247776 (4 pages) | Cited 3 times

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The XPS spectrum of the boron suboxide, B6O, is reported. The spectra were obtained on a powder sample that was prepared and characterized at the Diamond Technology Center, Norton Company. It was characterized with x‐ray diffraction and was prepared by established methods. The B 1s peak is split into two components of approximately equal area corresponding to the equal numbers of boron atoms at the two inequivalent sites of the B6O structure. The two B 1s components have binding energies of 187.4 and 189.2 eV. © 1995 American Vacuum Society
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Ag Foil by XPS

Gar B. Hoflund, Jason F. Weaver, and William S. Epling

Surf. Sci. Spectra 3, 151 (1994); http://dx.doi.org/10.1116/1.1247777 (6 pages) | Cited 3 times

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XPS data have been obtained from a polycrystalline Ag foil supplied by AESAR. Initial data indicates a highly contaminated surface region. The foil was heated to 250° C and then sputtered with a 2 keV beam of Ar+ for 35 min. Ion scattering spectroscopy, angle‐resolved Auger electron spectroscopy, and x‐ray photoelectron spectroscopy data indicate the presence of a small amount of subsurface oxygen which could not be removed by the cleaning procedure used. These spectra will be useful in XPS studies of Ag systems such as alumina‐supported silver epoxidation catalysts. © 1995 American Vacuum Society
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Ag2O XPS Spectra

Gar B. Hoflund, Jason F. Weaver, and William S. Epling

Surf. Sci. Spectra 3, 157 (1994); http://dx.doi.org/10.1116/1.1247778 (6 pages) | Cited 3 times

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XPS data have been obtained from a pressed Ag2O powder obtained from AESAR. The Ag2O sample was annealed in vacuum at 300 °C for 30 min. This resulted in a surface primarily composed of Ag2O with a small amount of Ag metal present also. The anneal temperature is above that which results in the decomposition of AgO to Ag2O and below the temperature which results in complete reduction. These spectra will be helpful in XPS studies of O/Ag systems such as alumina‐supported silver epoxidation catalysts. © 1995 American Vacuum Society
Show PACS
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

AgO XPS Spectra

Gar B. Hoflund, Jason F. Weaver, and William S. Epling

Surf. Sci. Spectra 3, 163 (1994); http://dx.doi.org/10.1116/1.1247779 (6 pages) | Cited 3 times

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XPS data have been obtained from a pressed AgO powder sample obtained from AESAR. Obtaining high‐quality XPS data from a single oxide state is difficult because multiple oxide states, hydroxides, and other contaminants are usually present. The AgO sample was annealed in vacuum at 100 °C for 30 min to reduce the amounts of contaminants present. The primary contaminant on this sample is a bicarbonate species that was significantly reduced during the anneal. The anneal temperature is below that which results in decomposition of AgO and Ag2O. These spectra will be useful in XPS studies of O/Ag systems such as alumina‐supported silver epoxidation catalysts. © 1995 American Vacuum Society
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82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Purple Membrane by X‐ray Photoelectron Spectroscopy

Robert A. Brizzolara, Jennifer L. Boyd, Rose E. Thorne, and Ann E. Tate

Surf. Sci. Spectra 3, 169 (1994); http://dx.doi.org/10.1116/1.1247780 (6 pages)

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Purple membrane is a constituent of the cell membrane of Halobacterium halobium. It is of technological interest due to the very fast, efficient electrical response to light of its integral protein, bacteriorhodopsin. Dried films of purple membrane are of importance for the fabrication of devices from this material. In this article, x‐ray photoelectron spectroscopy (XPS) spectra of purple membrane fragments dried on SiO2 are presented. To remove excess lipid from the substrate surface, the samples were washed with distilled water subsequent to the purple membrane drying step. The presence of purple membrane fragments on the substrate surface was verified by atomic force microscopy prior to XPS analysis. © 1995 American Vacuum Society  
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87.16.-b Subcellular structure and processes
87.64.kd X-ray and EXAFS
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