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Oct 1996

Volume 4, Issue 4, pp. 297-386


Characterization of Perfluorinated Polyether (PFPE) Disk Drive Lubricants

B. H. Augustine, C. E. Bryson, and L. A. Vasilyev

Surf. Sci. Spectra 4, 297 (1996); http://dx.doi.org/10.1116/1.1247833 (15 pages)

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We report the XPS characterization of perfluorinated polyether (PFPE) samples used as lubricants for magnetic disk drive heads. Survey and high resolution C, O, and F spectra were obtained for eight different polyether formulations using a monochromatic Al Kα source. Sample charging was evident in the samples, and was minimized throughout by the use of thin films of the samples and data collection under a metallic screen. © 1998 American Vacuum Society. XPS; PFPE; perfluorinated polyether; disk drive lubricants; fluorinated oils
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Fr Polymers; organic compounds
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
85.70.Li Other magnetic recording and storage devices (including tapes, disks, and drums)

Poly(bisphenol A carbonate) During XPS Measurements

Ch. Girardeaux and J.-J. Pireaux

Surf. Sci. Spectra 4, 312 (1996); http://dx.doi.org/10.1116/1.1247830 (4 pages)

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We present XPS measurements of poly(bisphenol A carbonate) [C16O3H14]n (Polysciences Europe GmbH). This polymer is a constituent of polymer blends (PC + PMMA) studied for their superficial composition versus blend composition. © 1998 American Vacuum Society. x-ray photoelectron spectroscopy; polymer; poly(bisphenol A carbonate)
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79.60.Fr Polymers; organic compounds
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy

Catherine S. Lawson, Brian J. Tielsch, and Julia E. Fulghum

Surf. Sci. Spectra 4, 316 (1996); http://dx.doi.org/10.1116/1.1247829 (29 pages)

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XPS spectra have been obtained from six metals in the first row of transition elements using a Kratos AXIS HS x-ray photoelectron spectrometer. The six metals analyzed include Cu, Ni, Zn, V, Ge, and Fe. Each sample was Ar+ ion etched before XPS analysis to remove the majority of C and O contamination. The spectra include standard survey scans and high-resolution scans of the photoelectron peaks, as well as x-ray induced Auger peaks. Each spectrum was collected using a monochromatic Al Kα x-ray source operated at 300 W (20 mA, 15 kV). Survey scans were collected using an 80 eV pass energy, while high resolution scans were recorded using a 20 eV pass energy unless indicated otherwise. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.05.Bx Metals, semimetals, and alloys
71.20.Be Transition metals and alloys

Characterization of the Surface of FeO Powder by XPS

A. N. Mansour and Robert A. Brizzolara

Surf. Sci. Spectra 4, 345 (1996); http://dx.doi.org/10.1116/1.1247831 (6 pages)

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We report x-ray photoemission spectra of the surface of iron oxide (FeO) particles. The research grade high purity FeO sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg Kα x-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1s and 2s, and Fe 2p and 3p photoemission lines, valence band region as well as the Fe LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of FeO powdered material consists mainly of Fe2O3 with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy; wustite; iron(II) oxide; FeO; surface
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
81.65.Kn Corrosion protection

Characterization of the Surface of γ-Fe2O3 Powder by XPS

A. N. Mansour and Robert A. Brizzolara

Surf. Sci. Spectra 4, 351 (1996); http://dx.doi.org/10.1116/1.1247832 (6 pages)

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We report x-ray photoemission spectra of the surface of iron (III) oxide (γ-Fe2O3) particles. The research grade high purity (99.0%) (γ-Fe2O3) sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg Kα x-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1s and 2s, and Fe 2p and 3p photoemission lines, valence band region as well as the Fe LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of (γ-Fe2O3) powdered material consists mainly of its bulk chemistry with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy; iron(III) oxide; maghemite; γ-Fe2O3; surface
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
81.65.Kn Corrosion protection

Characterization of the Surface of α-FeOOH Powder by XPS

A. N. Mansour and Robert A. Brizzolara

Surf. Sci. Spectra 4, 357 (1996); http://dx.doi.org/10.1116/1.1247825 (6 pages)

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We report x-ray photoemission spectra of the surface of iron (III) oxyhydroxide (α-FeOOH) particles. Research grade purity (99.0%) α-FeOOH sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electronics Model 5400 X-ray Photoelectron Spectrometer using unmonochromated Mg Kα x-rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1s and 2s, Fe 2p and 3p photoemission lines, valence band region as well as the Fe L3VV Auger line were measured at an analyzer energy resolution of 0.54 eV. The XPS spectra indicate that the surface of α-FeOOH powdered material consists mainly of its bulk chemistry with small quantities of oxidized carbon and hydrocarbon as contaminants. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy; iron(III) oxyhydroxide; goethite; α-FeOOH; surface
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
82.65.+r Surface and interface chemistry; heterogeneous catalysis at surfaces
81.65.Kn Corrosion protection

Characterization of Polystyrene (1 kDa) with a Perfluorinated Endgroup by TOF-SIMS: Effects of Sample Preparation

A. M. Belu, M. O. Hunt, and R. W. Linton

Surf. Sci. Spectra 4, 363 (1996); http://dx.doi.org/10.1116/1.1247826 (7 pages) | Cited 1 time

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TOF-SIMS measurements of a thick film 1 kDa polystyrene functionalized with a perfluoroalkyl endgroup are presented. Characteristic fragment signals in the low mass range are observed. The thick film of 1 kDa functionalized polystyrene is also analyzed with an overlayer of silver. This modification in sample preparation allows intact oligomer signals to be generated from the surfaces of thick films (i.e., in bulk form) of low molecular weight polymers. © 1998 American Vacuum Society. SIMS; polymer; silver cationization; thick film
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82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
61.41.+e Polymers, elastomers, and plastics

Characterization of Polystyrenes (5 and 40 kDa) Functionalized with a Perfluorinated Endgroup by TOF-SIMS: Effects of Molecular Weight

A. M. Belu, M. O. Hunt, J. M. DeSimone, and R. W. Linton

Surf. Sci. Spectra 4, 370 (1996); http://dx.doi.org/10.1116/1.1247828 (11 pages)

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TOF-SIMS measurements of 5 and 40 kDa polystyrene functionalized with a perfluoroalkyl endgroup are presented. Fragment signals in the low mass range are observed for both 5 and 40 kDa samples, using monolayer sample preparation on a silver substrate. Additionally for the 5 kDa sample, intact oligomer signals in the high mass range and chain cleavage signals in the intermediate mass range are generated. The successful functionalization of the polystyrene with the perfluoroalkyl endgroup can be confirmed by the masses at which the intact oligomer signals arise. © 1998 American Vacuum Society. SIMS; polymer; endgroup; functionalized
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82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials
61.41.+e Polymers, elastomers, and plastics

Characterization of Polystyrene (1 kDa) Functionalized with a Dimethyl- phenylsilane Endgroup by TOF-SIMS: Effect of Post-Ionization Using a Nonresonant Multiphoton Technique

A. M. Belu, M. O. Hunt, J. M. DeSimone, and R. W. Linton

Surf. Sci. Spectra 4, 381 (1996); http://dx.doi.org/10.1116/1.1247827 (6 pages)

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TOF-SIMS measurements of 1 kDa polystyrene functionalized with a dimethylphenylsilane endgroup are presented and compared with measurements made by multiphoton ionization sputtered neutral mass spectrometry (MPI-SNMS). Silver cationized intact oligomer signals are obtained by TOF-SIMS and non-silver cationized intact oligomer signals are generated with MPI-SNMS. The Mn values from both methods are in good agreement. © 1998 American Vacuum Society. SIMS; polymer; endgroup; functionalized; post-ionization
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61.41.+e Polymers, elastomers, and plastics
33.15.Ta Mass spectra
82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
33.80.Rv Multiphoton ionization and excitation to highly excited states (e.g., Rydberg states)
33.80.Eh Autoionization, photoionization, and photodetachment
36.20.Kd Electronic structure and spectra
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