SSS Nameplate
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

When viewing PDF, click on blue accession number located in the caption of each figure to download the data.

Search Issue | RSS Feeds RSS
Previous Issue

Oct 1998

Volume 5, Issue 4, pp. 257-338


Cu2O by XPS

R. P. Vasquez

Surf. Sci. Spectra 5, 257 (1998); http://dx.doi.org/10.1116/1.1247881 (5 pages) | Cited 5 times

Full Text: | Download PDF

Show Abstract
X-ray photoemission measurements of Cu2O are presented. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

CuO by XPS

R. P. Vasquez

Surf. Sci. Spectra 5, 262 (1998); http://dx.doi.org/10.1116/1.1247882 (5 pages) | Cited 7 times

Full Text: | Download PDF

Show Abstract
X-ray photoemission measurements of CuO are presented. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Cu(OH)2 by XPS

R. P. Vasquez

Surf. Sci. Spectra 5, 267 (1998); http://dx.doi.org/10.1116/1.1247883 (6 pages) | Cited 2 times

Full Text: | Download PDF

Show Abstract
X-ray photoemission measurements of Cu(OH)2 are presented. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

CuCO3 by XPS

R. P. Vasquez

Surf. Sci. Spectra 5, 273 (1998); http://dx.doi.org/10.1116/1.1247884 (6 pages)

Full Text: | Download PDF

Show Abstract
X-ray photoemission measurements of CuCO3 are presented. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

CuSO4 by XPS

R. P. Vasquez

Surf. Sci. Spectra 5, 279 (1998); http://dx.doi.org/10.1116/1.1247885 (6 pages)

Full Text: | Download PDF

Show Abstract
X-ray photoemission measurements of CuSO4 are presented. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

HgBa2CaCu2O6+δ by XPS

R. P. Vasquez, M. Rupp, A. Gupta, and C. C. Tsuei

Surf. Sci. Spectra 5, 285 (1998); http://dx.doi.org/10.1116/1.1247886 (8 pages)

Full Text: | Download PDF

Show Abstract
XPS core level and valence band spectra are presented for a chemically etched epitaxial thin film of superconducting HgBa2CaCu2O6+δ (Tc = 123 K) on a SrTiO3 (100) substrate. These data exhibit lower levels of high binding energy contaminant signals in the O 1s and alkaline earth core level regions compared to studies in the literature, and a clear Fermi edge in the valence band region, evidence of a high quality surface. © 1999 American Vacuum Society.
Show PACS
74.72.-h Cuprate superconductors
74.78.-w Superconducting films and low-dimensional structures
74.25.Jb Electronic structure (photoemission, etc.)

TlBa2CaCu2O7−δ by XPS

R. P. Vasquez and M. P. Siegal

Surf. Sci. Spectra 5, 293 (1998); http://dx.doi.org/10.1116/1.1247887 (11 pages)

Full Text: | Download PDF

Show Abstract
XPS core level and valence band spectra are presented for chemically etched epitaxial thin films of superconducting TlBa2CaCu2O7−δ, one of which is as-grown overdoped (superconducting transition temperature [Tc] = 74.5 K) and two which are annealed (Tc = 86.5 K and 87.5 K). The core levels measured from the annealed films are shifted to higher binding energies relative to those from the as-grown overdoped film, consistent with a doping-induced change in the chemical potential. © 1999 American Vacuum Society.
Show PACS
74.72.-h Cuprate superconductors
79.60.Dp Adsorbed layers and thin films
74.25.Jb Electronic structure (photoemission, etc.)

Tl2Ba2CuO6+δ by XPS

R. P. Vasquez, Z. F. Ren, and J. H. Wang

Surf. Sci. Spectra 5, 304 (1998); http://dx.doi.org/10.1116/1.1247875 (9 pages)

Full Text: | Download PDF

Show Abstract
XPS core level and valence band spectra are presented for chemically etched epitaxial thin films of superconducting Tl2Ba2CuO6+δ on SrTiO3(100) substrates which are as-grown overdoped (superconducting transition temperature [Tc]=11 K) and annealed (Tc=63 K). The core levels measured from the annealed film are shifted to higher binding energies relative to those from the as-grown overdoped film, consistent with a doping-induced change in the chemical potential. © 1999 American Vacuum Society.
Show PACS
74.72.-h Cuprate superconductors
74.78.-w Superconducting films and low-dimensional structures
79.60.Bm Clean metal, semiconductor, and insulator surfaces
74.25.Jb Electronic structure (photoemission, etc.)

Photopolymerized C60 Film by XPS

Aiko Nakao, Jun Onoe, and Kazuo Takeuchi

Surf. Sci. Spectra 5, 313 (1998); http://dx.doi.org/10.1116/1.1247876 (5 pages) | Cited 3 times

Full Text: | Download PDF

Show Abstract
We present here the changes in the valence band and the C 1s core peak and its shake-up satellite of a C60 film upon photopolymerization using x-ray photoelectron spectroscopy. It was found that the intensity of the C 1s shake-up satellite of the phototransformed C60 film decreased with increasing irradiation time of 500 W mercury lamp (0 to 200 h). On the other hand, the valence band spectra of the C60 film was almost unchanged even after 200 h of irradiation, compared with that of pristine C60 film. © 1999 American Vacuum Society.
Show PACS
79.60.Dp Adsorbed layers and thin films
81.05.ub Fullerenes and related materials
82.35.-x Polymers: properties; reactions; polymerization
82.50.-m Photochemistry

High Resolution Spectra of Poly(cis-isoprene)

Sven Mähl

Surf. Sci. Spectra 5, 318 (1998); http://dx.doi.org/10.1116/1.1247877 (6 pages)

Full Text: | Download PDF

Show Abstract
X-ray photoelectron spectroscopy was used to analyze poly(cis-isoprene). The polymer was centrifugally spin cast on a silicon wafer. We find that the cis spectrum can be described by five Voigt profiles. The parameters of the lines with standard deviations are found by least-square fitting. © 1999 American Vacuum Society.
Show PACS
79.60.Fr Polymers; organic compounds
81.15.Rs Spray coating techniques
81.05.Lg Polymers and plastics; rubber; synthetic and natural fibers; organometallic and organic materials

Thermal Stability of Ultrathin Co/Pt(111) Films Studied by AES

Jyh-Shen Tsay and Ching-Song Shern

Surf. Sci. Spectra 5, 324 (1998); http://dx.doi.org/10.1116/1.1247878 (8 pages)

Full Text: | Download PDF

Show Abstract
Rotated incommensurate Co domains are observed by LEED after applying an annealing treatment on Co/Pt(111). The thermal stability and surface composition of such a film can be obtained by monitoring the AES spectra after annealing. The specimens were ultrathin Co films grown on a Pt(111) single crystal surface at 300 K. The Pt(111) surface was clean by cycles of ion sputtering and annealing in an ultrathin vacuum chamber. All spectra were collected with a surface science instrument of VG Microtech. © 1999 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
68.60.Dv Thermal stability; thermal effects
68.35.Dv Composition, segregation; defects and impurities
81.05.Bx Metals, semimetals, and alloys

Thermal Evolution of Anodized Nb by XPS

Adriana Daccà, Gianluca Gemme, Lorenzo Mattera, and Renzo Parodi

Surf. Sci. Spectra 5, 332 (1998); http://dx.doi.org/10.1116/1.1247879 (7 pages)

Full Text: | Download PDF

Show Abstract
XPS spectra acquired on anodized niobium during a thermal treatment from 300 to 1223 K are reported. The anodization process consists of growing a layer of oxide of known thickness on the metal surface; the sample is kept in a solution of ammonia inside an electrochemical cell and a d.d.p. is applied to the electrodes. We acquired XPS spectra by using a PHI 5600 ESCA multitechnique spectrometer with an Al Kα monochromatized source. The spherical capacitor analyzer operated in the constant energy mode at a pass energy of 5.85 eV. Measurements at two emission angles, 0° and 70°, and at temperatures between 300 and 1223 K are reported. This XPS study puts in evidence the existence of a transition on the Nb surface from Nb pentoxide to Nb pure metal during the heating phase. © 1999 American Vacuum Society.
Show PACS
79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.65.Mq Oxidation
81.40.Ef Cold working, work hardening; annealing, post-deformation annealing, quenching, tempering recovery, and crystallization
Close

Your Recent History Recent History Help

Recently Viewed

  1. Characterization of the Surface of FeO Powder by XPS
  2. Hydroxyapatite Characterized by XPS
  3. Characterization of LiNiO2 by XPS
  4. Carbon (as Graphite, Buckminsterfullerene, and Diamond) by XPS
  5. SnO2 by XPS
© 2012 AVS Science & Technology of Materials, Interfaces, and Processing Help | Contact
close