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Surf. Sci. Spectra 5, 318 (1998); http://dx.doi.org/10.1116/1.1247877 (6 pages)
High Resolution Spectra of Poly(cis-isoprene)
X-ray photoelectron spectroscopy was used to analyze poly(cis-isoprene). The polymer was centrifugally spin cast on a silicon wafer. We find that the cis spectrum can be described by five Voigt profiles. The parameters of the lines with standard deviations are found by least-square fitting. © 1999 American Vacuum Society.
© 1999 American Vacuum Society
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