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Surf. Sci. Spectra 7, 1 (2000); http://dx.doi.org/10.1116/1.1311915 (68 pages)

Third Row Transition Metals by X-ray Photoelectron Spectroscopy

Mark Engelhard and Don Baer

PNNL Environmental Molecular Sciences Laboratory, 3335 Q Avenue, Richland, WA 99352

XPS spectra have been obtained from 11 metals in the third row of transition elements using a Quantum 2000 Scanning ESCA Microprobe. The metals analyzed include La, Hf, Ta, W, Re, Ir, Pt, Au, Tl, Pb, and Bi. Each sample was Ar+ ion etched before XPS analysis to remove surface contamination and/or oxide. The spectra include standard survey scans and high-energy resolution scans of the photoelectron peaks, as well as selected x-ray induced Auger peaks. Each spectrum was collected using a 100 μm diameter monochromatic Al Kα x-ray beam scanned over a 1.5 mm × 0.2 mm area of each sample. Survey scans were collected using a 58.7 eV pass energy, while high energy resolution scans were collected using a 23.5 eV pass energy. © 2000 American Vacuum Society.

© 2000 American Vacuum Society

KEYWORDS and PACS

PACS

  • 79.60.Bm

    Clean metal, semiconductor, and insulator surfaces

  • 82.80.Pv

    Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

  • 71.20.Be

    Transition metals and alloys

PUBLICATION DATA

ISSN

1055-5269 (print)  
1520-8575 (online)

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