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Surf. Sci. Spectra 7, 310 (2000); http://dx.doi.org/10.1116/1.1376317 (6 pages)

Analysis of a Zirconium Diboride Single Crystal, ZrB2 (0001), by XPS

R. Singh1, M. Trenary1, and Y. Paderno2

1University of Illinois at Chicago, 845 W. Taylor St., Rm. 4500, Chicago, IL 60607
2Institute for Problems in Materials Science, Academy of Sciences, 3 Kryzanovsky St., Kiev 252680, Ukraine

X-ray photoelectron spectroscopy (XPS) was used to study the clean surface of ZrB2 (0001). The clean surface exhibits Zr 3d5/2 and Zr 3d3/2 peaks at 179.2 and 181.6 eV, respectively. However, angle resolved XPS indicated ZrO2 peaks at 183.5 and 185.7 eV at higher emission angles, indicating that further cleaning was necessary. After additional cleaning cycles, these oxide peaks were no longer observed at high emission angles. This result demonstrates the necessity to probe the near surface region with higher emission angles on very reactive surfaces, in order to completely establish the cleanliness of the surface. © 2000 American Vacuum Society.

© 2000 American Vacuum Society

KEYWORDS and PACS

PACS

  • 79.60.Bm

    Clean metal, semiconductor, and insulator surfaces

  • 82.80.Pv

    Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

  • 81.05.Je

    Ceramics and refractories (including borides, carbides, hydrides, nitrides, oxides, and silicides)

PUBLICATION DATA

ISSN

1055-5269 (print)  
1520-8575 (online)

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