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Jan 2001

Volume 8, Issue 1, pp. 1-86


β-AlF3 by Au 4f7/2-referenced XPS and XAES

A. Lippitz, O. Boese, E. Kemnitz, and W. E. S. Unger

Surf. Sci. Spectra 8, 1 (2001); http://dx.doi.org/10.1116/11.20000403 (7 pages)

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Powder x-ray diffraction (XRD) defined β-AlF3 has been investigated by x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XAES). The Au 4f7/2 orbital is used for static charge referencing. This feature originates from well-defined and chemically inert 20 nm highly dispersed gold particles deposited on the sample surface. The particles, with a narrow particle size distribution, were obtained from a highly purified colloidal solution (sodium concentration below 1 mg/l). This procedure allows a determination of gold-referenced XPS and XAES data sets. © 2001 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.05.Bx Metals, semimetals, and alloys

Study of β-Al2TiO5 Thin Films by XPS

Lidia Armelao, Alessandro Martucci, and Plinio Innocenzi

Surf. Sci. Spectra 8, 8 (2001); http://dx.doi.org/10.1116/11.20001102 (6 pages)

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β-Al2TiO5 thin films were prepared by dip-coating on silicon substrates via sol-gel processing. Acid catalyzed sols of aluminum and titanium alkoxides were used as precursors, described in work published previously. The composition of the films and their behavior toward crystallization were studied by x-ray photoelectron spectroscopy and x-ray diffraction as a function of the firing time and temperature. The films were amorphous up to 600 °C and crystalline β-Al2TiO5 was formed at 700 °C. From 800 up to 1200 °C, titania (anatase and rutile) phases were also detected, without decomposition of the metastable β-Al2TiO5 phase. The formation of β-Al2TiO5 at low temperatures is attributed to a diffusion-limited crystallization process, which takes place in the conditions of high homogeneity at molecular level reached in the sol-gel synthesis. © 2001 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
68.55.Nq Composition and phase identification
81.30.Hd Constant-composition solid-solid phase transformations: polymorphic, massive, and order-disorder

Sol-Gel and CVD Co3O4 Thin Films Characterized by XPS

Lidia Armelao, Davide Barreca, Silvia Gross, and Eugenio Tondello

Surf. Sci. Spectra 8, 14 (2001); http://dx.doi.org/10.1116/11.20010601 (10 pages) | Cited 2 times

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The present investigation is focused on x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XE-AES) analysis of the main core levels (O 1s, Co 2p, and Co LVV) of nanocrystalline Co3O4 coatings. The samples were obtained by CVD and sol-gel routes. Co(dpm)2 (Hdpm = 2,2-6,6-tetramethyl-3,5-heptanedione) was chosen as CVD precursor thanks to its appreciable volatility, the absence of direct Co–C bonds and the presence of thermally labile Co–O moieties. The preparation of the sol-gel films was accomplished starting from methanolic solutions of Co(OCOCH3)24H2O due to the clean conversion of cobalt acetate into cobalt oxides. The obtained Co3O4 films were bluish-brown, homogenous, crack-free, and adhered well to the substrates. The microstructural analyses revealed the formation of single-phase nanostructured layers with average crystallite dimensions ranging between 15 and 26 nm. © 2001 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
81.10.Dn Growth from solutions
81.10.Fq Growth from melts; zone melting and refining
81.15.Lm Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)

LaCoO3 Nanopowders by XPS

Lidia Armelao, Marco Bettinelli, Gregorio Bottaro, Davide Barreca, and Eugenio Tondello

Surf. Sci. Spectra 8, 24 (2001); http://dx.doi.org/10.1116/11.20010701 (8 pages) | Cited 1 time

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Mixed oxide materials belonging to the perovskite family (ABO3, LaCoO3) have come under intense scrutiny for their possible applications in different scientific and technological fields, such as heterogeneous catalysis, oxygen sensors, solid oxide fuel cells and magnetic media. The growing interest in such mixed oxide systems relies on a detailed investigation of structure-properties relationships that can lead to the optimization of their performances with respect to different applications, e.g., catalysis, sensors, etc. Similar solid state devices would require high surface area thin films in order to optimize the full potential of these oxide materials; specifically, nanostructured systems with a high defect content (oxygen vacancies and local lattice disorder) are expected to show superior properties with respect to the conventional ones. The possibility to tailor these features as a function of the surface area and grain size appears thus as a powerful tool in order to optimize the material properties for functional applications. In particular the present investigation is focused on x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XE-AES) analysis of the main core levels (O 1s, Co 2p, Co LMM, La 3d, and La 4d) of LaCoO3 nanophasic powders obtained by combustion synthesis. The formation of LaCoO3 was ascertained by the position and shape of La 3d and Co 2p photopeaks. © 2001 American Vacuum Society.
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.07.Wx Nanopowders
81.05.Je Ceramics and refractories (including borides, carbides, hydrides, nitrides, oxides, and silicides)

CF3(CF2)7(CH2)2SH Self-Assembled on Au and Subsequent Degradation Under the Influence of Ionizing Radiation as Measured by XPS

Anthony J. Wagner, Chad D. Vecitis, and D. Howard Fairbrother

Surf. Sci. Spectra 8, 32 (2001); http://dx.doi.org/10.1116/11.20000703 (7 pages) | Cited 1 time

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X-ray photoelectron spectra are shown for a semifluorinated self-assembled monolayer basd on 1H,1H,2H,2H-perfluorodecanethiol [CF3(CF2)7(CH2)2SH] absorbed on a polycrystalline gold substrate. The effect of x-ray irradiation on the defluorination of the film, studied by following the time dependent variation in the C 1s spectral region, is also shown. This information has been used to elucidate the mechanism and kinetics of the elementary reaction steps that comprise defluorination. © 2001 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
79.60.Fr Polymers; organic compounds
82.50.Kx Processes caused by X-rays or γ-rays

Brushite (CaHPO42H2O) by XPS

Charles C. Chusuei and D. Wayne Goodman

Surf. Sci. Spectra 8, 39 (2001); http://dx.doi.org/10.1116/11.20010501 (6 pages)

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Dibasic calcium phosphate dihydrate (CaHPO42H2O, DCPD) is the least thermodynamically stable calcium phosphate phase according to Ostwald’s step rule and is an important biomineral involved in the growth of hydroxyapatite [Ca10(PO4)6(OH)2, HAP], the principal component of bone and teeth. DCPD is one of the first calcium phosphate phases that form at the onset of nucleation and growth of HAP crystals. X-ray photoelectron spectra (XPS) of the Ca 2p, P 2p, and O 1s lines from DCPD are presented. Since DCPD is sensitive to phase transformation, its identity was verified by x-ray diffraction prior to XPS scans. © 2001 American Vacuum Society.
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
87.85.J- Biomaterials
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Core Level XPS Spectra of Silicon Carbide Using Zirconium and Magnesium Radiations

A. R. Chourasia

Surf. Sci. Spectra 8, 45 (2001); http://dx.doi.org/10.1116/11.20010602 (11 pages) | Cited 1 time

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Core levels of silicon and carbon in the hexagonal form of silicon carbide have been studied by x-ray photoelectron spectroscopy. For this purpose, zirconium Lα (energy = 2042.4 eV) and magnesium Kα (energy = 1253.6 eV) radiations have been employed. The XPS data in the silicon 1s, 2s, 2p, and Auger KLL, and carbon 1s and Auger KLL regions are presented. The data set will serve as a source of valuable information for analyzing spectra associated with silicon and carbon in the insulating sample of silicon carbide. © 2001 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.05.Je Ceramics and refractories (including borides, carbides, hydrides, nitrides, oxides, and silicides)
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

A Study of Potassium Dihydrogen Phosphate (KDP) Crystal Surfaces by XPS

Mark Engelhard, Cheryl Evans, T. A. Land, and A. J. Nelson

Surf. Sci. Spectra 8, 56 (2001); http://dx.doi.org/10.1116/11.20010702 (25 pages) | Cited 1 time

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Potassium dihydrogen phosphate KH2PO4 (KDP) is a transparent dielectric material best known for its nonlinear optical and electro-optical properties (Refs. 1 and 2). Because of its nonlinear optical properties, it has been incorporated into various laser systems for harmonic generation and optoelectrical switching. In addition, KDP is particularly suitable for use in large-aperture laser systems such as that located at the National Ignition Facility (NIF) because it can be grown as a single crystal to large size (Refs. 3 and 4). Despite the importance of this material, surface composition and surface electronic structure data were found to be nonexistent. X-ray photoemission spectroscopy was thus used to characterize the composition and surface structure of (100) and (101) native crystals. © 2001 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
68.35.Dv Composition, segregation; defects and impurities
42.70.Mp Nonlinear optical crystals

The Ti LMM Auger Spectrum of a Titanium Hydride Film

Wojciech Lisowski and Albert H. J. van den Berg

Surf. Sci. Spectra 8, 81 (2001); http://dx.doi.org/10.1116/11.20010401 (6 pages)

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We present Auger spectra of titanium hydride (TiHy) and titanium films, covered by ultrathin gold layers. The TiHy films were obtained due to hydrogen interaction with the Ti film deposited in situ onto a Pyrex glass substrate under UHV conditions. Both Ti and TiHy films were then covered in situ by a nanoscale Au layer. The Auger analyses were performed in separate systems. Analysis of the features of the Ti Auger spectra during the sputter profile measurements allow the TiHy to be distinguished and characterized in the bulk region of the Au/TiHy layer. © 2001 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.05.Bx Metals, semimetals, and alloys
79.20.Fv Electron impact: Auger emission
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