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Jul 2001

Volume 8, Issue 3, pp. 163-245


Analysis of Poly(amino acids) by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Newton T. Samuel, M. S. Wagner, K. D. Dornfeld, and David G. Castner

Surf. Sci. Spectra 8, 163 (2001); http://dx.doi.org/10.1116/11.20020301 (22 pages) | Cited 4 times

Online Publication Date: 9 December 2002

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This study presents the static time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of 15 poly(amino acids), solvent or spin cast onto either mica or silicon substrates. These poly(amino acid) spectra are useful for interpreting the complex static TOF-SIMS spectra obtained from adsorbed protein films and peptide-functionalized surfaces. Previous studies have reported poly(amino acid) spectra acquired with a quadrupole SIMS instrument. The spectra obtained with a TOF-SIMS instrument in this study have significantly higher sensitivity and mass resolution, which are essential for producing good, high-quality reference spectra. © 2001 American Vacuum Society.
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82.80.Ms Mass spectrometry (including SIMS, multiphoton ionization and resonance ionization mass spectrometry, MALDI)
87.14.E- Proteins
82.35.Pq Biopolymers, biopolymerization

Characterization of the Surface of Ba(NO3)2 Powder by XPS

Peter J. Schmitz

Surf. Sci. Spectra 8, 185 (2001); http://dx.doi.org/10.1116/11.20011101 (5 pages)

Online Publication Date: 9 December 2002

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This work reports survey and core level x-ray photoemission spectra obtained from the surface of a barium nitrate powder. The high purity (99.999%) barium nitrate specimen was commercially obtained from Alfa/AESARS. The XPS spectra were measured with a Kratos Axis 165 instrument using monochromatic Al Kα radiation. The survey spectrum was measured with an 80 eV pass energy and the core level spectra (Ba 3d, N 1s, O 1s, and C 1s) were acquired using a 20 eV pass energy corresponding to analyzer resolutions of 1.12 and 0.28 eV, respectively. The data are consistent with the surface being composed of primarily barium nitrate with a small contribution from barium nitrite. Carbon was the only contaminant species observed. © 2002 American Vacuum Society.
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.05.Rm Porous materials; granular materials
79.60.Bm Clean metal, semiconductor, and insulator surfaces

Characterization of the Surface of BaCO3 Powder by XPS

Peter J. Schmitz

Surf. Sci. Spectra 8, 190 (2001); http://dx.doi.org/10.1116/11.20011102 (5 pages)

Online Publication Date: 9 December 2002

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This work reports survey and core level x-ray photoemission spectra obtained from the surface of a barium carbonate powder. The high purity (99.997%) barium carbonate specimen was commercially obtained from Alfa/AESARS. The XPS spectra were acquired with a Kratos Axis 165 instrument using monochromatic Al Kα radiation. The survey spectrum was measured with an 80 eV pass energy and the core level spectra (Ba 3d, C 1s, and O 1s) were acquired using a 20 eV pass energy corresponding to analyzer resolutions of 1.12 and 0.28 eV, respectively. The data are consistent with the surface being exclusively barium carbonate. Adventitious carbon was the only contaminant observed. © 2002 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.05.Rm Porous materials; granular materials

Characterization of the Surface of BaSO4 Powder by XPS

Peter J. Schmitz

Surf. Sci. Spectra 8, 195 (2001); http://dx.doi.org/10.1116/11.20011203 (5 pages)

Online Publication Date: 9 December 2002

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This work reports survey and core level x-ray photoemission spectra obtained from the surface of a barium sulfate powder. The high purity (99.998%) barium sulfate specimen was commercially obtained from Alfa/AESARS. The XPS spectra were acquired with a Kratos Axis 165 instrument using monochromatic Al Kα radiation. The survey spectrum was measured with an 80 eV pass energy and the core level spectra (Ba 3d, S 2p, O 1s, and C 1s) were acquired using a 20 eV pass energy corresponding to analyzer resolutions of 1.12 and 0.28 eV, respectively. The data are consistent with the surface being predominately barium sulfate. Adventitious carbon and a small nitrogen component were the only contaminants observed. © 2002 American Vacuum Society.
Show PACS
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
79.60.Bm Clean metal, semiconductor, and insulator surfaces
81.05.Rm Porous materials; granular materials

Manganese Dioxide (MnO2) by XPS

Maria C. Militello and Stephen W. Gaarenstroom

Surf. Sci. Spectra 8, 200 (2001); http://dx.doi.org/10.1116/11.20020401 (7 pages) | Cited 3 times

Online Publication Date: 9 December 2002

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XPS spectra of manganese dioxide (MnO2) powder are presented. The spectra were collected using monochromated Al Kα x-rays. Spectra include survey scan, the Mn 2p, 3p, and 3s regions, the O 1s region, and the Mn LMM Auger transitions. © 2002 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Lithium Manganese Oxide (LiMn2O4) by XPS

Maria C. Militello and Stephen W. Gaarenstroom

Surf. Sci. Spectra 8, 207 (2001); http://dx.doi.org/10.1116/11.20020402 (7 pages)

Online Publication Date: 9 December 2002

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XPS spectra of lithium manganese oxide (LiMn2O4) are presented. The spectra were collected using monochomated Al Kα x-rays. Spectra include survey scan, the Li 1s region, the Mn 2p, 3p, and 3s regions, the O 1s region, and the Mn LMM Auger transitions. © 2002 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

γ-Al2O3 by Au 4f7/2-referenced XPS and XAES

A. Lippitz, O. Boese, E. Kemnitz, and W. E. S. Unger

Surf. Sci. Spectra 8, 214 (2001); http://dx.doi.org/10.1116/11.20020305 (6 pages)

Online Publication Date: 9 December 2002

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Powder x-ray diffraction (XRD) defined γ-Al2O3 has been investigated by x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XAES). The Au 4f7/2 orbital is used for static charge referencing. This feature originates from well-defined and chemically inert 20 nm highly dispersed gold particles deposited on the sample surface. The particles, with a narrow particle size distribution, were obtained from a highly purified colloidal solution (sodium concentration below 1 mg/l). This procedure allows a determination of gold-referenced XPS and XAES data sets. © 2001 American Vacuum Society.
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82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
81.20.Ev Powder processing: powder metallurgy, compaction, sintering, mechanical alloying, and granulation
79.60.Jv Interfaces; heterostructures; nanostructures

Ni2P (0001) by XPS

Daisuke Kanama, S. Ted Oyama, Shigeki Otani, and David F. Cox

Surf. Sci. Spectra 8, 220 (2001); http://dx.doi.org/10.1116/11.20020303 (5 pages)

Online Publication Date: 9 December 2002

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XPS spectra are reported for a well-ordered Ni2P (0001) surface. These are the first reported photoemission spectra for this transition metal phosphide in single crystal form. Ion bombardment and annealing produces an ordered surface. © 2002 American Vacuum Society.
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79.60.Bm Clean metal, semiconductor, and insulator surfaces
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

CrO2 by XPS: Comparison of CrO2 Powder to CrO2 Films on TiO2(110) Single Crystal Surfaces

Heather A. Bullen and Simon J. Garrett

Surf. Sci. Spectra 8, 225 (2001); http://dx.doi.org/10.1116/11.20020308 (9 pages) | Cited 1 time

Online Publication Date: 9 December 2002

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Chromium dioxide is a ferromagnetic metallic oxide utilized in data storage applications. Here, the XP spectrum of CrO2 bulk powder is compared to a CrO2(110) film grown on a TiO2(110) single crystal surface by chemical vapor deposition. The spectra compare the Cr 2p and O 1s regions for the two materials. In both materials, the Cr 2p region (2p3/2 = 576.4 ± 0.1 eV and Cr 2p1/2 = 578.6 ± 0.1 eV) is asymmetric and broadened to the high binding energy side, consistent with metallic material. The O 1s envelope for both materials consists of two components. The lower BE component, at 529.2 ± 0.1 eV, has been assigned to the oxide and the higher binding energy component, at ∼531.5 eV, is believed to be associated with an adsorbed water or hydroxide layer. © 2001 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
79.60.Ht Disordered structures
75.50.Dd Nonmetallic ferromagnetic materials
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Y2O3 Thin Films Characterized by XPS

Davide Barreca, Giovanni A. Battiston, Davide Berto, Rosalba Gerbasi, and Eugenio Tondello

Surf. Sci. Spectra 8, 234 (2001); http://dx.doi.org/10.1116/11.20020404 (6 pages)

Online Publication Date: 9 December 2002

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Y2O3 thin films were synthesized by chemical vapor deposition (CVD) using Y(acac)3.xH2O (Hacac= 2,4-pentanedione) as precursor. This work is focused on the x-ray photoelectron spectroscopy (XPS) characterization of an Y2O3 thin film deposited on glass substrate at 450 °C in N2+O2 atmosphere and subsequently annealed in air at 1000 °C. Besides the wide scan spectrum, charge corrected binding energies for the Y 3d5/2, O 1s, and C 1s surface photoelectron signals are reported. © 2001 American Vacuum Society.
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79.60.Dp Adsorbed layers and thin films
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

Chemical Vapor Deposited Fe2O3 Thin Films Analyzed by XPS

Davide Barreca, Giovanni A. Battiston, Davide Berto, Rosalba Gerbasi, and Eugenio Tondello

Surf. Sci. Spectra 8, 240 (2001); http://dx.doi.org/10.1116/11.20020302 (6 pages) | Cited 1 time

Online Publication Date: 9 December 2002

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In the present study, x-ray photoelectron spectroscopy (XPS) was employed to investigate the principal core levels of a Fe2O3 thin film. The sample was deposited on glass in a N2+O2 atmosphere by chemical vapor deposition (CVD), using Fe(acac)3 (Hacac = 2,4-pentanedione) as the source compound. XPS surface data for the Fe 2p3/2, O 1s, and C 1s photoelectrons, obtained by an Al Kα monochromatized excitation source, are reported. Deconvolution of the O 1s signal revealed the presence of –OH groups along with the major component ascribed to lattice oxygen. The relatively high carbon content in the film indicated an incomplete decomposition of the used precursor. © 2001 American Vacuum Society.
Show PACS
79.60.Dp Adsorbed layers and thin films
81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.)
82.80.Pv Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)
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