Top 20 Most Read Articles
December 2010
The 20 articles with the most full-text downloads during the month, in descending order.
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Piranha Treated Titanium Compared to Passivated Titanium as Characterized by XPS Surf. Sci. Spectra 15, 23 (2008); http://dx.doi.org/10.1116/11.20070702 (8 pages) Online Publication Date: 24 August 2010
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Titanium is commonly used as an implant material because of its strength, durability, density, and ability to passivated. Two titanium surfaces were compared, one produced by passivation following the ASTM F87 standard and one produced by treating coupons with piranha. The XPS spectra of the two treated titanium surfaces were collected with a Mg Kα (1253.6 eV) x-ray source operated at 300 W and 15 kV. This report includes XPS spectra of the elements associated with the treated titanium, which consisted of carbon, oxygen, and titanium. Significantly more titanium and oxygen were seen when comparing the piranha treated titanium to the passivated titanium, while significantly more carbon was present on the passivated titanium as compared to the piranha treated titanium.
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CuO/La0.6Sr0.4Co0.2Fe0.8O3-δ Powder by XPS Surf. Sci. Spectra 15, 14 (2008); http://dx.doi.org/10.1116/11.20070802 (9 pages) Online Publication Date: 6 July 2010
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A CuO/La0.6Sr0.4Co0.2Fe0.8O3-δ supported system was obtained by depositing, by wet impregnation, 10 wt% CuO loading on the La0.6Sr0.4Co0.2Fe0.8O3-δ surface. The surface properties are investigated by means of XPS. Besides the wide scan spectrum, detailed spectra for the La 3d, Sr 3d, Co 2p, Fe 2p, Cu 2p, O 1s, and C 1s regions, and related data, are presented and discussed.
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Surf. Sci. Spectra 2, 50 (1993); http://dx.doi.org/10.1116/1.1247724 (5 pages)
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Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x‐ray photoelectron spectroscopy has been used to obtain comparison spectra of a high purity SnO2 powder. Due to rather small core level chemical shifts, it has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO using XPS [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence band peak is also characteristic of Sn oxides [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. The valence band spectrum and the valence band–Sn 4d separation reported in this work are consistent with literature data [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys., Rev. B 46, 2460 (1992); P. M. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. Auger parameter data may also prove useful for distinguishing between various tin compounds on surfaces. Thus, in addition to core level spectra, valence band and x‐ray excited Auger spectra for SnO2 are presented. Data were obtained with a Perkin‐Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation. |
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Stoichiometric and Non-Stoichiometric SnO2(110) Surfaces Surf. Sci. Spectra 4, 220 (1996); http://dx.doi.org/10.1116/1.1247793 (7 pages)
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XPS spectra are presented for two different preparations of an SnO2(110) single crystal surface. A highly oxygen-deficient surface is prepared by ion-bombardment and annealing to 1000 K in ultrahigh vacuum. In situ oxidation with N2O is used to produce a nearly stoichiometric surface. Both surfaces exhibit (1×1) LEED periodicities. In spite of the known variations in composition between these two surfaces, normal emission XPS shows only a 5% variation in the apparent compositions. © 1998 American Vacuum Society. |
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Surf. Sci. Spectra 3, 395 (1994); http://dx.doi.org/10.1116/1.1247784 (7 pages)
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X-ray photoelectron spectroscopy (XPS) spectra of palladium oxide (PdO) are presented. Clean, ground PdO powder was pressed into In foil and analyzed with a Surface Science Instruments SSX-101 M-Probe ESCA instrument using monochromatized Al Kα x rays. Spectra include a survey scan, the Pd 3d,3p,3s,4s,4p regions, the O 1s, and valence band regions, and the O KLL, Pd MNN and MNV Auger transitions. © 1997 American Vacuum Society. |
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SnO2 Nanocrystalline Thin Films by XPS Surf. Sci. Spectra 7, 81 (2000); http://dx.doi.org/10.1116/1.1288177 (5 pages)
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SnO2 nanocrystalline thin films are deposited on Al2O3 and SiO2/Si(100) by chemical vapor deposition starting from diethylaminodimethylstannane (IV) [(CH3)2Sn(N(C2H5)2)2]. X-ray photoelectron spectra of the principal core levels for the surface of a SnO2 film on SiO2/Si(100) are presented. © 2000 American Vacuum Society. |
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N2 Annealing Effect on Thermal Ta2O5 Layers on Si Studied by XPS Surf. Sci. Spectra 11, 1 (2004); http://dx.doi.org/10.1116/11.20040701 (25 pages) Online Publication Date: 4 May 2005
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The effect of nitrogen annealing at 1123 K for 30 min on the structural characteristics of thin (15 nm) Ta2O5 layers on Si was examined by x-ray photoelectron spectroscopy (XPS). The results indicate that the stoichiometric Ta2O5 detected at the surface of as-deposited films is reduced to suboxides at the interface with Si. Si-O bonds in the form of SiO2 exist in a small quantity through the whole thickness of the films. The existence of excess Si was established in the interfacial transition region. The annealing improves the stoichiometry and microstructure of both the bulk oxide and the interfacial region, which manifests as a reduced amount of suboxides. The interfacial region is a composite oxide of suboxides of Ta and Si before and after N2 treatment but the annealing process reduces the excess Si and decreases the width of the interface. Thus, a trend to more abrupt interface is observed. © 2005 American Vacuum Society. |
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Whitlockite (β-Ca3(PO4)2) Characterization by XPS: An Environmentally Important Mineral Surf. Sci. Spectra 6, 219 (1999); http://dx.doi.org/10.1116/1.1247924 (9 pages)
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Whitlockite (β-Ca3(PO4)2) is an environmentally important secondary phosphate mineral. It is of significance geochemically around ore bodies, and in soil, sedimentary, and waste systems. We have used XPS to study the binding energy of primary photoelectrons from air-exposed rhombohedral whitlockite crystals. The sample is from Groton, New Hampshire and is part of the Harvard University Mineralogical Museum’s collection. General survey and high-resolution spectra were collected using a Perkin Elmer Physical Electronics 5200C spectrometer. Adventitious carbon was used for energy referencing. Charge corrected binding energies for the photoelectrons present in whitlockite (Ca 2p3/2, Ca 2p1/2, P 2p3/2, P 2p1/2, P 2s, and O 1s) are reported. Additionally, charge corrected binding energies for the photoelectrons of other elements present in the natural sample are reported (Pb 4f7/2, Pb 4f5/2, and Si 2p). The Pb is likely an isomorphic substitution for Ca in the whitlockite, and the Si is from the host quartz. The reported binding energies are useful in identifying environmentally important calcium-phosphate minerals such as whitlockite in ore bodies, soils, sediments, and phosphate-stabilized waste systems. © 2000 American Vacuum Society. |
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Characterization of NiO by XPS Surf. Sci. Spectra 3, 231 (1994); http://dx.doi.org/10.1116/1.1247751 (8 pages)
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We report x‐ray photoemission spectra (XPS) of nickelous oxide (NiO). XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as the Ni LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The research grade high purity NiO sample was obtained commercially from Atomergic Chemetals Corporation. © 1996 American Vacuum Society |
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Surf. Sci. Spectra 6, 31 (1999); http://dx.doi.org/10.1116/1.1247888 (8 pages)
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Manganese compounds have many applications in areas such as catalysis, electrochemistry, and metallurgy, among others. Distinguishing between the various chemical states of manganese is an important aspect of research in many of these areas. It has been shown that the different chemical states of manganese can be identified with XPS through the Mn 2p3/2 peak positions, Mn 2p1/2 satellite–Mn 2p1/2 peak separations, Mn 3s multiplet splittings, or Mn Auger parameters. To date, however, all of these values have not been available in a single reference. In this study, XPS has been used to obtain core level, Auger, and valence band spectra for a commercial, high purity MnO2 powder. This submission provides a reference that contains all of the Mn XPS data necessary for the identification of MnO2 and also provides information that may be useful for the analysis of other Mn compounds. © 1999 American Vacuum Society. |
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Surf. Sci. Spectra 5, 257 (1998); http://dx.doi.org/10.1116/1.1247881 (5 pages)
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X-ray photoemission measurements of Cu2O are presented. © 1999 American Vacuum Society. |
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ZnO Nanoplatelets Obtained by Chemical Vapor Deposition, Studied by XPS Surf. Sci. Spectra 14, 19 (2007); http://dx.doi.org/10.1116/11.20071001 (8 pages) Online Publication Date: 6 March 2009
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Zinc oxide nanoplatelets have been successfully grown on Si(l00) by a catalyst-free Chemical Vapor Deposition (CVD) route starting from a second-generation Zn(II) molecular precursor, Zn(hfa)2⋅TMEDA (Hhfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedione; TMEDA=N,N,N',N'- tetramethylethylenediamine). The syntheses were performed under a nitrogen+wet oxygen atmosphere and the best results were obtained at deposition temperatures of 350 and 400 °C. The obtained samples were thoroughly characterized by several techniques, namely Glancing-Incidence X-ray Diffraction (GIXRD), Atomic Force Microscopy (AFM), Field Emission-Scanning Electron Microscopy (FE-SEM), Energy Dispersive X-ray Spectroscopy (EDXS), X-ray Photoelectron (XPS) and X-ray Excited Auger Electron (XE-AES) Spectroscopies. Finally, the photocatalytic performances of ZnO nanoplatelets in the decomposition of the azo-dye Orange II were also evaluated. The present contribution is specifically dedicated to the XPS and XE-AES characterization of a representative ZnO nanoplatelet sample deposited at 350 °C. Beside the wide scan spectrum, detailed spectra for the Zn 2p3/2, Zn 3p, Zn LMM, O 1s, and C 1s are also presented. The obtained results evidenced the formation of pure zinc oxide systems under the adopted synthetic conditions. |
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CVD Cu2O and CuO Nanosystems Characterized by XPS Surf. Sci. Spectra 14, 41 (2007); http://dx.doi.org/10.1116/11.20080701 (11 pages) Online Publication Date: 22 July 2009
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In the present investigation, X-ray photoelectron and X-ray excited Auger electron spectroscopy analyses of the principal core levels (O 1s, Cu 2p, and Cu LMM) of Cu2O and CuO nanosystems are proposed. The samples were obtained by chemical vapor deposition starting from a novel second-generation copper(II) precursor, Cu(hfa)2⋅TMEDA (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; TMEDA=N,N,N’,N’- tetramethylethylenediamine), under a dry O2 atmosphere. The obtained route led to pure, homogeneous and single-phase Cu(I) and Cu(II) oxide nanosystems at temperatures of 300 and 500 °C, respectively, whose chemical nature could be conveniently distinguished by analyzing the Cu 2p band shape and position, as well as by evaluating the Auger parameters. The samples were characterized by O/Cu atomic ratios greater than the expected stoichiometric values, due to marked interactions with the outer atmosphere attributed to their high surface-to-volume ratio. |
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Surf. Sci. Spectra 2, 45 (1993); http://dx.doi.org/10.1116/1.1247723 (5 pages)
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Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x‐ray photoelectron spectroscopy has been used to obtain comparison spectra of a SnO powder. The SnO powder was generated by grinding ∼150 μm granules of SnO in a mortar and pestle. Grinding is necessary because surface oxidation of the SnO granules occurs producing a SnO2 shell. It has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence peak is also characteristic of Sn oxides [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. In the present study, identification of the powder as SnO after grinding was verified by comparison of the measured XPS valence band spectrum with published spectra [J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)] and by the XPS Sn:O atomic ratio. The valence band–Sn 4d separation is also consistent with that determined for SnO [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992)]. Core level, valence band and x‐ray excited Auger spectra for the SnO powder are presented. Data were obtained with a Perkin‐Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation. |
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From La2O3 To LaCoO3: XPS Analysis Surf. Sci. Spectra 15, 1 (2008); http://dx.doi.org/10.1116/11.20061006 (13 pages) Online Publication Date: 7 May 2010
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Nanostructured LaCoO3 powder was prepared by a new approach: cobalt oxide nanoparticles were deposited, by wet impregnation, on the La2O3 surface. The La2O3 support was prepared by precipitation from a basic solution of La(NO3)3⋅6H2O. The precipitate was dried at 353 K for 2 h and calcined at 923 K for 6 h in air. Nanostructured LaCoO3 was obtained by wet impregnation of La2O3 with aqueous solutions of Co(NO3)2⋅6H2O: [Co/La]nomimal = 1.0 (nominal atomic ratio is obtained from the precursors weighed quantities). The obtained suspension was maintained under stirring for two days and then kept in rest for one day. Water was evaporated in air and the obtained solid was dried at 353 K for 2 h and at 923 K for 6 h in air. The thermal treatment in air promotes a solid state reaction between La-O and Co-O and then the formation of LaCoO3. |
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Surf. Sci. Spectra 4, 227 (1996); http://dx.doi.org/10.1116/1.1247794 (5 pages)
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The surfaces of titanium oxide belong to the most-studied oxide systems in the surface science literature. This is in part because TiO2 surfaces and interfaces play a major role in several technological applications, e.g., as promoters in catalysis, as photocatalysts, and as gas sensors. TiO2 is a reducible oxide, i.e., several phases with different stoichiometries exist. Because Ti is highly reactive towards oxygen, titanium oxides are formed readily when Ti is exposed to an atmosphere containing water or oxygen. The oxidation behavior of the metal is of interest for the properties of protective coatings. Although accurate knowledge of the XPS binding energies of different oxidation states is necessary for XPS investigations of titanium oxides, a recent review of the 16 literature data of the binding energy of Ti 2p3/2 from Ti4+ showed wide scatter of the reported values with a mean of 458.7 eV and a standard deviation of 1.3 eV [J. Mayer, E. Garfunkel, T. E. Madey, and U. Diebold, J. Electron Spectrosc. Relat. Phenom. 73, 1 (1995)]. TiO2 is easy to handle experimentally. Although it has a bulk band gap of 3 eV, no charging problems occur during surface spectroscopies after single-crystalline samples are reduced by heating in UHV (1000 K, 45 min). This treatment causes loss of bulk oxygen and results in n-type doping. A stochiometric TiO2 surface can reproducibly be prepared through sputtering and annealing in oxygen (2 × 10−4 Pa, 900 K). Our XPS core level spectra are measured from a bulk-reduced titanium dioxide (rutile) (110) surface using a VSW hemispherical analyzer. The binding energy of Ti 2p3/2 is determined as 459.3 eV, and the binding energy of O 1s as 530.4 eV.© 1998 American Vacuum Society. |
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Stoichiometric and Non-Stoichiometric Cu2O(111) Single Crystal Surfaces Surf. Sci. Spectra 4, 279 (1996); http://dx.doi.org/10.1116/1.1247798 (9 pages)
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X-ray photoelectron spectroscopy (XPS) was used to investigate a non-polar Cu2O(111) single-crystal surface following two different preparations. The first surface, prepared by Ar-ion bombardment and annealing to 1000 K in vacuum, is nearly stoichiometric and exhibits a (1 × 1) LEED periodicity. Exposure to large doses of dissociated hydrogen gas produces the second oxygen-deficient surface which exhibits a ( × ) R30° LEED periodicity associated with 1/3 of an atomic layer of oxygen vacancies. There are no significant differences observed in normal emission XPS, in agreement with simulations that suggest the observed compositional changes should be smaller than the associated experimental error.© 1998 American Vacuum Society. |
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Characterization of the Surface of γ-Fe2O3 Powder by XPS Surf. Sci. Spectra 4, 351 (1996); http://dx.doi.org/10.1116/1.1247832 (6 pages)
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We report x-ray photoemission spectra of the surface of iron (III) oxide (γ-Fe2O3) particles. The research grade high purity (99.0%) (γ-Fe2O3) sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg Kα x-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1s and 2s, and Fe 2p and 3p photoemission lines, valence band region as well as the Fe LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of (γ-Fe2O3) powdered material consists mainly of its bulk chemistry with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy; iron(III) oxide; maghemite; γ-Fe2O3; surface |
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Introduction to Studies of Aluminum and its Compounds by XPS Surf. Sci. Spectra 5, 1 (1998); http://dx.doi.org/10.1116/1.1247880 (3 pages)
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Aluminum is a very important element because of its many practical applications, and XPS provides an attractive method for the investigation of, and distinguishing between, aluminum and its compounds. The Al 2p core XPS spectra shows a substantial shift (about 2 eV) between the metal peak and compound peaks, and the metal peak width is much less than the width of the compound peaks. This fact has been used in numerous studies where the Al 2p spectrum can be easily curve fitted to identify a percentage area due to the metal and due to aluminum compounds. Several measurements of this kind, representing aluminum metal and 11 of its compounds, have been collected in a special issue of Surface Science Spectra. This Introduction summarizes the data to be presented and provides an overview of the use of and interpretation of XPS studies of aluminum and its compounds. © 1998 American Vacuum Society. |
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Surf. Sci. Spectra 5, 4 (1998); http://dx.doi.org/10.1116/1.1247850 (7 pages)
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The XPS spectra of argon ion etched aluminum metal were collected with a VSW HA150. This spectrometer is equipped with monochromatic Al Kα x-radiation, a 16 channel multichannel detector, and an electrostatic hemispherical analyzer with a radius of 150 mm providing an instrument with exceptional capabilities. We report the Al 2p core level with resolved 2p1/2 and 2p3/2 spin-orbit split components. The peak to valley separation on the high binding energy side between the spin orbit components was determined to be 0.18 eV and the separation between these components was 0.44 eV. The valence band, survey, and the Al 2s, O 1s, and C 1s core levels are also reported. © 1998 American Vacuum Society. |
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