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Top 20 Most Read Articles
December 2011
The 20 articles with the most full-text downloads during the month, in descending order.
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High Resolution Spectra of Poly(cis-isoprene) Surf. Sci. Spectra 5, 318 (1998); http://dx.doi.org/10.1116/1.1247877 (6 pages)
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X-ray photoelectron spectroscopy was used to analyze poly(cis-isoprene). The polymer was centrifugally spin cast on a silicon wafer. We find that the cis spectrum can be described by five Voigt profiles. The parameters of the lines with standard deviations are found by least-square fitting. © 1999 American Vacuum Society. |
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Characterization of NiO by XPS Surf. Sci. Spectra 3, 231 (1994); http://dx.doi.org/10.1116/1.1247751 (8 pages)
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We report x‐ray photoemission spectra (XPS) of nickelous oxide (NiO). XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as the Ni LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The research grade high purity NiO sample was obtained commercially from Atomergic Chemetals Corporation. © 1996 American Vacuum Society |
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Surf. Sci. Spectra 5, 60 (1998); http://dx.doi.org/10.1116/1.1247858 (7 pages)
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The XPS spectra of aluminum phosphate were collected with a VSW HA150 using monochromatic Al Kα x-radiation. Monochromatic radiation provides a distinct clarity to the rich peak structure in the valence band of aluminum phosphate due to the absence of interfering x-ray satellites from the intense O 2s region. The valence band region shows the characteristic phosphate peaks at 13.79 eV and 10.69 eV. The valence band, survey, and the Al 2s, Al 2p, O 1s, and C 1s core levels are reported. © 1998 American Vacuum Society. |
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CuxO - TiO2 Composites (x=1, 2) Studied by X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 16, 1 (2009); http://dx.doi.org/10.1116/11.20110101 (12 pages) Online Publication Date: 18 April 2011
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CuxO - TiO2 (x=1, 2) nanocomposites were synthesized by an innovative Chemical Vapor Deposition (CVD) strategy, based on the initial growth of CuxO matrices (1) and on the subsequent dispersion of TiO2 nanoparticles (2). Cu(hfa)2•TMEDA (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; TMEDA=N,N,N',N'-tetramethylethylenediamine) and Ti(O-iPr)2(dpm)2 (O-iPr = isopropoxide; dpm=2,2,6,6-tetramethyl-3,5-heptanedionate) were used as copper and titanium molecular sources, respectively. The syntheses were carried out under O2+H2O atmospheres on Si(100) substrates. In step (1), pure and homogeneous single-phase Cu2O/CuO nanosystems were obtained at 400/550 °C, with total pressures of 3.0/10.0 mbar, respectively. Interestingly, the obtained nanocomposites were characterized by the surface formation of Cu(I)-Cu(II) mixtures, due to the occurrence of interactions between CuxO and TiO2. This work is dedicated to the characterization of two representative samples by X-ray Photoelectron Spectroscopy (XPS), focusing in particular on the analysis on the O 1s, Cu 2p and Ti 2p core levels.
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Third Row Transition Metals by X-ray Photoelectron Spectroscopy Surf. Sci. Spectra 7, 1 (2000); http://dx.doi.org/10.1116/1.1311915 (68 pages)
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XPS spectra have been obtained from 11 metals in the third row of transition elements using a Quantum 2000 Scanning ESCA Microprobe. The metals analyzed include La, Hf, Ta, W, Re, Ir, Pt, Au, Tl, Pb, and Bi. Each sample was Ar+ ion etched before XPS analysis to remove surface contamination and/or oxide. The spectra include standard survey scans and high-energy resolution scans of the photoelectron peaks, as well as selected x-ray induced Auger peaks. Each spectrum was collected using a 100 μm diameter monochromatic Al Kα x-ray beam scanned over a 1.5 mm × 0.2 mm area of each sample. Survey scans were collected using a 58.7 eV pass energy, while high energy resolution scans were collected using a 23.5 eV pass energy. © 2000 American Vacuum Society. |
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Introduction to Studies of Phosphorus-Oxygen Compounds by XPS Surf. Sci. Spectra 9, 62 (2002); http://dx.doi.org/10.1116/11.20030101 (5 pages) Online Publication Date: 11 September 2003
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Phosphorus is an essential element, and phosphorus oxygen compounds (normally in the form of phosphates) are an essential component in the growth of animals and plants. Most phosphates are insoluble in water, and exist in the form of solids such as vegetable and animal tissues, seeds, bones, soils, fossils, and mineral deposits. Phosphates have many important applications as fertilizers, corrosion inhibitors, and adhesion promoters. The XPS spectra of phosphates show similar P 2p spectra, but significant differences in the O 1s region as a result of the different oxygen environments possible in different forms of phosphates. The valence band region is especially valuable in the case of phosphates because the P 2s and P 2p atomic orbitals interact with O 2s and O 2p atomic orbitals to give molecular orbitals in the outer valence band region (at binding energies less than 20 eV) to give a spectrum that is often very characteristic of a particular type of phosphate. This introduction provides a summary of the data to be presented and provides an overview of the interpretation of the data in the core and valence band regions. © 2003 American Vacuum Society. |
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Characterization of Electrochemically Prepared γ‐NiOOH by XPS Surf. Sci. Spectra 3, 271 (1994); http://dx.doi.org/10.1116/1.1247756 (8 pages)
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We report x‐ray photoemission spectra (XPS) of electrochemically prepared γ‐NiOOH. XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, K, and Ni photoemission lines, valence band region, as well as Ni LMM Auger line were measured at an analyzer energy resolution of 0.54 eV. The γ–NiOOH sample was prepared by the anodic oxidation of anodically formed α‐Ni(OH)2. © 1996 American Vacuum Society |
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Magnesium Aluminate (MgAl2O4) by XPS Surf. Sci. Spectra 3, 121 (1994); http://dx.doi.org/10.1116/1.1247772 (7 pages)
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The XPS spectra of materials containing both magnesium and aluminum can exhibit a number of spectral artifacts when using a Mg Kα x‐ray source. These artifacts are easily observed in XPS spectra of magnesium aluminate (MgAl2O4, also known as magnesium aluminum oxide), which are presented in this article. For example, the Al 2p peak is overlapped by the Mg Kα x‐ray satellites from the Mg 2s peak, and the Mg Kα x‐ray induced Mg KLL Auger peak. In addition, the Mg 2p peak can be overlapped by a C 1s x‐ray ghost line caused by stray Al Kα x‐ray radiation when using a dual Mg/Al x‐ray source. Because of these artifacts, the amounts of Mg and Al in such samples should be quantified (when using a Mg Kα x‐ray source) using the Mg 2s and Al 2s peaks, respectively, which are free of these artifacts. © 1995 American Vacuum Society |
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Characterization of Slightly Hydrated Ni(OH)2 by XPS Surf. Sci. Spectra 3, 247 (1994); http://dx.doi.org/10.1116/1.1247753 (8 pages)
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We report x‐ray photoemission spectra (XPS) of slightly hydrated Ni(OH)2. XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as Ni LVV Auger lines were measured at an analzyer energy resolution of 0.54 eV. The slightly hydrated Ni(OH)2 sample was prepared by reacting stoichiometric Ni(NO3)2 with KOH in CO2 free H2O at 35 °C. © 1996 American Vacuum Society |
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Characterization of Ni2O3⋅6H2O by XPS Surf. Sci. Spectra 3, 263 (1994); http://dx.doi.org/10.1116/1.1247755 (8 pages)
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We report x‐ray photoemission spectra (XPS) of hydrated nickelic oxide (Ni2O3⋅6H2O). XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as the Ni LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The Ni2O3⋅6H2O sample was obtained commercially from Alfa. Our XPS results show that the near surface region consists of a large proportion of Ni(OH)2. In addition, the sample contains Na and Cl in small quantities. The presence of Na and Cl is probably an artifact of sample preparation procedures. © 1996 American Vacuum Society |
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Carbon (as Graphite, Buckminsterfullerene, and Diamond) by XPS Surf. Sci. Spectra 2, 232 (1993); http://dx.doi.org/10.1116/1.1247704 (10 pages)
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XPS spectra were acquired for highly ordered pyrolytic graphite, a single crystal diamond, and a C60 film. Carbon 1s and valence band spectra are included in the electronic record. |
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Surf. Sci. Spectra 2, 50 (1993); http://dx.doi.org/10.1116/1.1247724 (5 pages)
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Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x‐ray photoelectron spectroscopy has been used to obtain comparison spectra of a high purity SnO2 powder. Due to rather small core level chemical shifts, it has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO using XPS [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence band peak is also characteristic of Sn oxides [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. The valence band spectrum and the valence band–Sn 4d separation reported in this work are consistent with literature data [see J‐M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J‐M. Gilles, Phys., Rev. B 46, 2460 (1992); P. M. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. Auger parameter data may also prove useful for distinguishing between various tin compounds on surfaces. Thus, in addition to core level spectra, valence band and x‐ray excited Auger spectra for SnO2 are presented. Data were obtained with a Perkin‐Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation. |
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Highly Oriented Pyrolytic Graphite by Core Level and Valence Band XPS Surf. Sci. Spectra 1, 253 (1992); http://dx.doi.org/10.1116/1.1247647 (6 pages)
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Both core level and valence band XPS spectra were obtained from a Union Carbide highly oriented pyrolytic graphite (HOPG) monochromator sample. Compared to Du Pont and Amoco pitch‐based carbon fibers with different modulus and some PAN‐based carbon fibers, the HOPG had much less oxygen components on the surface than the carbon fibers, except Du Pont E‐120 high modulus pitch‐based carbon fiber. [See Y. Xie and P. M. A. Sherwood, Appl. Spectrosc. 43, 1153 (1989); Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992).] No nitrogen was found on the HOPG surface, nor on any of the pitch‐based carbon fibers measured in our laboratory, but nitrogen was shown in all the PAN‐based carbon fibers. Our previously reported work [Y. Xie and P. M. A. Sherwood, Chem. Mater. 1, 427 (1989); 2, 293 (1990); Appl. Spectrosc. 44, 797 (1990); Chem. Mater. 3, 164 (1991); Appl. Spectrosc. 44, 1621 (1990); 45, 1158 (1991); Y. Xie, T. Wang, O. Franklin, and P. M. A. Sherwood, ibid. 46, 645 (1992)] showed that XPS valence band spectra were more sensitive to chemical environment on the carbon fiber surface than core level spectra and could be well interpreted by X–α calculations with model compounds. Although both HOPG and E‐120 samples had little oxygen on their surfaces (with E‐120 even less), the valence band spectra of these two samples showed that the oxygen species in the HOPG surface and E‐120 fiber surface were different because the separations between the O 2s peak and the C 2s peak in the two spectra are different. |
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Analysis of Coal by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Surf. Sci. Spectra 17, 1 (2010); http://dx.doi.org/10.1116/11.20080402 (67 pages) Online Publication Date: 7 November 2011
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Coal remains a primary fuel for power generation. Herein we present time-of-flight secondary ion mass spectra (ToF-SIMS data) taken with a Ga primary ion beam from ca. 30 coal specimens. These commercially different coal specimens were obtained from coal mining companies and/or power plants. They represent all major coal types used in power generation (bituminous coals, subbituminous coals, and lignites), and include low-rank materials (lignites and subbituminous coals), which are represented as a minor portion of the data. Often, inorganic ions (Na+, Al+, Si+, and K+) are pronounced in the spectra, overshadowing peaks from organic moieties. This reflects the high sensitivity of SIMS under our analysis conditions for these inorganic species. These results, including a previous, published chemometrics analysis of this data (L. Pei, G. Jiang, B. J. Tyler, L. L. Baxter, and M. R. Linford, Energy & Fuels 2008, 22, 1059), suggest that ToF-SIMS can be a useful method for coal analysis.
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Surf. Sci. Spectra 17, 68 (2010); http://dx.doi.org/10.1116/11.20081001 (8 pages) Online Publication Date: 23 November 2011
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Core- and valence-band levels XPS spectra of Ni3Al and NiAl including the energy loss parts were obtained for an in-situ fractured surface. Polycrystalline Ni3Al and NiAl were prepared by arc melting under argon atmosphere; this was followed by annealing at pressures less than 2.0 × 10−3 Pa.
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From La2O3 To LaCoO3: XPS Analysis Surf. Sci. Spectra 15, 1 (2008); http://dx.doi.org/10.1116/11.20061006 (13 pages) Online Publication Date: 7 May 2010
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Nanostructured LaCoO3 powder was prepared by a new approach: cobalt oxide nanoparticles were deposited, by wet impregnation, on the La2O3 surface. The La2O3 support was prepared by precipitation from a basic solution of La(NO3)3⋅6H2O. The precipitate was dried at 353 K for 2 h and calcined at 923 K for 6 h in air. Nanostructured LaCoO3 was obtained by wet impregnation of La2O3 with aqueous solutions of Co(NO3)2⋅6H2O: [Co/La]nomimal = 1.0 (nominal atomic ratio is obtained from the precursors weighed quantities). The obtained suspension was maintained under stirring for two days and then kept in rest for one day. Water was evaporated in air and the obtained solid was dried at 353 K for 2 h and at 923 K for 6 h in air. The thermal treatment in air promotes a solid state reaction between La-O and Co-O and then the formation of LaCoO3. |
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Poly(ethylene imine) (PEI) XPS Reference Core Level and Energy Loss Spectra Surf. Sci. Spectra 12, 54 (2005); http://dx.doi.org/10.1116/11.20050911 (5 pages) Online Publication Date: 18 December 2006
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XPS measurements of poly(ethylene imine) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of carbon and nitrogen peaks are analyzed. This is part of a contract work aiming to record spectra in the very same conditions of some 40 different polymers. © 2006 American Vacuum Society. x-ray photoelectron spectroscopy; XPS; surface; polymer; poly(ethylene imine); PEI 00802 |
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Surf. Sci. Spectra 6, 68 (1999); http://dx.doi.org/10.1116/1.1247890 (7 pages)
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Ru and RuO2 thin films are considered to be new electrode materials for dynamic random access memories (DRAMs) and ferroelectric nonvolatile memories because of their low resistivity and good thermal and chemical stabilities. In this study these thin films were pepared by reactively sputtering a Ru metal target (99.9% purity) in an argon and oxygen atmosphere. XPS spectra were collected with a PHI 1600 spectrometer equipped with a monochromatic Al Kα x-ray source and a multichannel detector. This report includes XPS spectra of Ru 3d and O 1s core regions for these samples. The binding energy of Ru 3d5/2 is determined as 280.0 and 280.8 eV for Ru and RuO2 films, respectively. The presence of a small amount of Ru with higher oxidation states, such as Ru6+ and Ru8+, is shown at the surface of the RuO2 thin film. © 1999 American Vacuum Society. |
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Characterization of the Surface of FeO Powder by XPS Surf. Sci. Spectra 4, 345 (1996); http://dx.doi.org/10.1116/1.1247831 (6 pages)
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We report x-ray photoemission spectra of the surface of iron oxide (FeO) particles. The research grade high purity FeO sample was commercially obtained from Alfa/AESAR. The XPS spectra were measured with the Physical Electroncs Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg Kα x-rays at two pass energy settings corresponding to analyzer resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C 1s, O 1s and 2s, and Fe 2p and 3p photoemission lines, valence band region as well as the Fe LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The XPS data indicate that the surface of FeO powdered material consists mainly of Fe2O3 with small quantities of FeOOH, oxidized carbon, and hydrocarbon as contaminants. © 1998 American Vacuum Society. XPS; ESCA; x-ray photoelectron spectroscopy; wustite; iron(II) oxide; FeO; surface |
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Hydroxyapatite Characterized by XPS Surf. Sci. Spectra 4, 9 (1996); http://dx.doi.org/10.1116/1.1247808 (5 pages)
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Hydroxyapatite [Ca10(PO4)6(OH)2] is commonly used as a coating material on orthopedic and dental implants. Hydroxyapatite is the major inorganic component of bone and is biocompatible with tissues when used on implants. Quality control tests are critical for the proper calcium to phosphorous ratio and also for checking for the presence of impurities. Being an important surface analytical tool used in the field of biomaterials, x-ray photoelectron spectroscopy was used to examine as-received hydroxyapatite pressed powders.© 1997 American Vacuum Society. x-ray photoelectron spectroscopy; hydroxyapatite; calcium phosphate hydroxide |
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