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Top 20 Most Read Articles
September 2009
The 20 articles with the most full-text downloads during the month, in descending order.
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Surf. Sci. Spectra 3, 151 (1994); http://dx.doi.org/10.1116/1.1247777 (6 pages)
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XPS data have been obtained from a polycrystalline Ag foil supplied by AESAR. Initial data indicates a highly contaminated surface region. The foil was heated to 250° C and then sputtered with a 2 keV beam of Ar+ for 35 min. Ion scattering spectroscopy, angle‐resolved Auger electron spectroscopy, and x‐ray photoelectron spectroscopy data indicate the presence of a small amount of subsurface oxygen which could not be removed by the cleaning procedure used. These spectra will be useful in XPS studies of Ag systems such as alumina‐supported silver epoxidation catalysts. © 1995 American Vacuum Society |
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Comparison of Ti 2p Core-Level Peaks from TiO2, Ti2O3, and Ti Metal, by XPS Surf. Sci. Spectra 5, 179 (1998); http://dx.doi.org/10.1116/1.1247874 (3 pages)
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These spectra compare the Ti 2p core-level XPS line shape for atomically clean, stoichiometric samples of Ti, Ti2O3, and TiO2; the latter two are UHV-cleaved or fractured single crystals. The Ti0 and Ti4+ peaks of Ti metal and TiO2, respectively, exhibit the simple shapes expected for such core levels. The Ti3+ peaks of Ti2O3, however, are more complex, although there are no other valence states of Ti in the sample. © 1998 American Vacuum Society. |
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Surf. Sci. Spectra 6, 68 (1999); http://dx.doi.org/10.1116/1.1247890 (7 pages)
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Ru and RuO2 thin films are considered to be new electrode materials for dynamic random access memories (DRAMs) and ferroelectric nonvolatile memories because of their low resistivity and good thermal and chemical stabilities. In this study these thin films were pepared by reactively sputtering a Ru metal target (99.9% purity) in an argon and oxygen atmosphere. XPS spectra were collected with a PHI 1600 spectrometer equipped with a monochromatic Al Kα x-ray source and a multichannel detector. This report includes XPS spectra of Ru 3d and O 1s core regions for these samples. The binding energy of Ru 3d5/2 is determined as 280.0 and 280.8 eV for Ru and RuO2 films, respectively. The presence of a small amount of Ru with higher oxidation states, such as Ru6+ and Ru8+, is shown at the surface of the RuO2 thin film. © 1999 American Vacuum Society. |
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ZnO Nanoplatelets Obtained by Chemical Vapor Deposition, Studied by XPS Surf. Sci. Spectra 14, 19 (2007); http://dx.doi.org/10.1116/11.20071001 (8 pages) Online Publication Date: 6 March 2009
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Zinc oxide nanoplatelets have been successfully grown on Si(l00) by a catalyst-free Chemical Vapor Deposition (CVD) route starting from a second-generation Zn(II) molecular precursor, Zn(hfa)2⋅TMEDA (Hhfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedione; TMEDA=N,N,N',N'- tetramethylethylenediamine). The syntheses were performed under a nitrogen+wet oxygen atmosphere and the best results were obtained at deposition temperatures of 350 and 400 °C. The obtained samples were thoroughly characterized by several techniques, namely Glancing-Incidence X-ray Diffraction (GIXRD), Atomic Force Microscopy (AFM), Field Emission-Scanning Electron Microscopy (FE-SEM), Energy Dispersive X-ray Spectroscopy (EDXS), X-ray Photoelectron (XPS) and X-ray Excited Auger Electron (XE-AES) Spectroscopies. Finally, the photocatalytic performances of ZnO nanoplatelets in the decomposition of the azo-dye Orange II were also evaluated. The present contribution is specifically dedicated to the XPS and XE-AES characterization of a representative ZnO nanoplatelet sample deposited at 350 °C. Beside the wide scan spectrum, detailed spectra for the Zn 2p3/2, Zn 3p, Zn LMM, O 1s, and C 1s are also presented. The obtained results evidenced the formation of pure zinc oxide systems under the adopted synthetic conditions. |
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CVD Cu2O and CuO Nanosystems Characterized by XPS Surf. Sci. Spectra 14, 41 (2007); http://dx.doi.org/10.1116/11.20080701 (11 pages) Online Publication Date: 22 July 2009
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In the present investigation, X-ray photoelectron and X-ray excited Auger electron spectroscopy analyses of the principal core levels (O 1s, Cu 2p, and Cu LMM) of Cu2O and CuO nanosystems are proposed. The samples were obtained by chemical vapor deposition starting from a novel second-generation copper(II) precursor, Cu(hfa)2⋅TMEDA (hfa=1,1,1,5,5,5-hexafluoro-2,4-pentanedionate; TMEDA=N,N,N’,N’- tetramethylethylenediamine), under a dry O2 atmosphere. The obtained route led to pure, homogeneous and single-phase Cu(I) and Cu(II) oxide nanosystems at temperatures of 300 and 500 °C, respectively, whose chemical nature could be conveniently distinguished by analyzing the Cu 2p band shape and position, as well as by evaluating the Auger parameters. The samples were characterized by O/Cu atomic ratios greater than the expected stoichiometric values, due to marked interactions with the outer atmosphere attributed to their high surface-to-volume ratio. |
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Surf. Sci. Spectra 2, 242 (1993); http://dx.doi.org/10.1116/1.1247705 (7 pages)
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XPS spectra were recorded for the Ge(111) 2×1 cleavage surface of a single crystal. For comparison, spectra were taken for samples cleaved in air (Accession ♯00113) and in situ (Accession ♯00112). The 2p, 3d, LMM, and valence band regions were measured. |
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UHV-Cleaved Single Crystal Ti2O3 (101̄2) by UPS and XPS Surf. Sci. Spectra 5, 182 (1998); http://dx.doi.org/10.1116/1.1247849 (4 pages)
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Ti2O3 is a semiconducting transition-metal oxide with a 0.1 eV bandgap at room temperature and is thus fairly conducting. The conducting nature of the oxide produces a double-peaked structure of the Ti 2p1/2 and 2p3/2 XPS core-level peaks. The sample, which exposes a (101̄2) cleavage face, contains only Ti3+ cations, so the double-peaked structure does not arise from the presence of multiple valence states on the Ti cations. Caution must thus be exercised in interpreting cation 3p core-level spectra from such oxides. [See K. E. Smith and V. E. Henrich, Phys. Rev. B 50, 1282 (1994) for a discussion of the role of final-state screening in XPS core-level line shapes. See also R. L. Kurtz and V. E. Henrich, Surf. Sci. Spectra 5, 172 (1998).] The He I and He II UPS spectra of the valence band region show the large O 2p band and the smaller Ti 3d band just below the Fermi level. The titanium oxides exhibit a wide stoichiometry range (including Magneli phases); Ti2O3 is the most stable lower oxide. © 1998 American Vacuum Society. |
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Polytetrafluoroethylene by XPS Surf. Sci. Spectra 1, 100 (1992); http://dx.doi.org/10.1116/1.1247678 (4 pages)
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X‐ray photoelectron spectroscopy was used to analyze a 1 cm2, 0.13 mm thick coupon of poly‐ tetrafluoroethylene (PTFE). The material was examined as received from the manufacturer following a cleaning with isopropyl alcohol and trichlorotrifluoroethane. The PTFE coupon was examined with a Hewlett‐Packard 5950B ESCA system. Measured atomic composition percentages closely matched the expected stoichiometry of the polymer. |
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X‐ray Photoelectron Study of TiN Surf. Sci. Spectra 1, 233 (1992); http://dx.doi.org/10.1116/1.1247644 (5 pages)
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Thin films of TiN were deposited from TiCl4, NH3, and H2 in a lamp heated single wafer ‘‘warm wall’’ low pressure chemical vapor deposition reactor. The deposition was carried out on a TiSi2/Si sample. The thickness of the films is estimated to be 100 nm. The films were analyzed by x‐ray diffraction, Rutherford backscattering spectroscopy, and x‐ray photoelectron spectroscopy. The XPS data in Ti 2p, N 1s, Ti L3M23V, and Ti L3M23M23 regions are presented. |
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Characterization of LiF Using XPS Surf. Sci. Spectra 1, 277 (1992); http://dx.doi.org/10.1116/1.1247651 (7 pages)
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A commercial LiF powder sample was investigated using x‐ray photoelectron spectroscopy. Sample preparation included washing in acetone and methanol, pressing into indium foil and gold decoration for charge correction. Measured binding energies were very similar to those previously reported. [See W. E. Morgan, J. R. Van Wazer, and W. J. Stec, J. Amer. Chem. Soc. 95, 751 (1973); K. Hamrin, G. Johansson, U. Gelius, C. Nordling, and K. Siegbahn, Phys. Scr. 1, 277 (1970); C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder, and G. E. Muilenberg, Handbook of X‐ray Photoelectron Spectroscopy (Physics Electronics Division, Perkin Elmer, Eden Prarie, MN, 1979).] Because F is commonly used as a reference element for tabulated sensitivity factors, data in this paper are useful in evaluating empirical relative sensitivity factors for a specific instrument, in this instance, a Perkin Elmer‐Physical Electronics Model 5400 XPS. |
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Single Crystal CuInSe2 Analysis by High Resolution XPS Surf. Sci. Spectra 1, 393 (1992); http://dx.doi.org/10.1116/1.1247638 (5 pages)
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Copper indium selenide (CIS) is a material commonly used in photovoltaic devices. High resolution XPS spectra are obtained from a freshly fractured single crystal CIS sample. Spectra include Cu 2p, In 3d and Se 3d core lines along with valence band and survey spectra. |
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Surf. Sci. Spectra 2, 67 (1993); http://dx.doi.org/10.1116/1.1247712 (4 pages)
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X‐ray photoelectron spectroscopy was used to analyze a thin film of polystyrene. Spin casting from a 2% by weight solution of polystyrene in toluene was utilized. Film thickness was determined to be 60 nm by ellipsometry. The thin film was examined with a Hewlett Packard 5950A ESCA spectrometer. |
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Nickel Mg Kα XPS Spectra from the Physical Electronics Model 5400 Spectrometer Surf. Sci. Spectra 3, 211 (1994); http://dx.doi.org/10.1116/1.1247749 (10 pages)
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Nickel by Mg Kα XPS Nickel spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer (XPS) using unmonochromatized Mg Kα x rays and four pass energy settings corresponding to analyzer energy resolutions of 1.34, 0.54, 0.27, and 0.13 eV. The specimen is a high purity (99.95%) 4 μm thick nickel foil that was obtained from the Goodfellow Corporation and was sputter‐cleaned by 3 keV Ar ions for 5 min. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.35 eV. Multiplexes of the Ni 2p (845–895 eV), Ni 3p (55–88 eV), Ni 3s (100–130 eV), Ni 2s (995–1025 eV), valence band region (−5–20 eV), and Ni LVV Auger lines (378–428 eV) were measured at analyzer energy resolutions of 0.54, 0.27, and 0.13 eV. © 1996 American Vacuum Society |
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Analysis of Polystyrene (PS) by XPS Surf. Sci. Spectra 4, 130 (1996); http://dx.doi.org/10.1116/1.1247812 (4 pages)
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We report x-ray photoemission spectra of polystyrene (PS). XPS spectra were measured with the SSI, SSX-100 model, using monochromated Al Kα x-rays. We present the survey spectrum (binding energy range of 0–1100 eV) and a narrow spectrum of C 1s. The polymer is used as a reference to study the influence of PS surface modification by rf plasma for biochemical applications.© 1997 American Vacuum Society. x-ray photoelectron spectroscopy; surface; polymer; PS; polystyrene |
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Gamma-Alumina (γ-Al2O3) by XPS Surf. Sci. Spectra 5, 18 (1998); http://dx.doi.org/10.1116/1.1247852 (7 pages)
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The XPS spectra of gamma-alumina were collected with a VSW HA150 using monochromatic Al Kα x-radiation. Monochromatic radiation provides a distinct clarity to the peak structure in the valence band of gamma-alumina due to the absence of interfering x-ray satellites from the intense O 2s region. Variations in the intensities and peak separation of the two-peak structure in the valence bands of the oxides, hydroxides, and oxyhydroxides of aluminum allow one to distinguish between these compounds. The valence band, survey, and the Al 2s, Al 2p, O 1s, and C 1s core levels are reported. © 1998 American Vacuum Society. |
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Surface Phonon Spectra of V6O13(001) in the Metallic and Semiconducting Phase Surf. Sci. Spectra 5, 248 (1998); http://dx.doi.org/10.1116/1.1247844 (4 pages)
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V6O13 is known as the most important lower oxide of V2O5 and as such is assumed to play a primordial role in the catalytic activity of the latter. Like many other transition metal oxides, it exhibits a phase transition, situated at about 150 K, from metallic behavior at room temperature to semiconducting at low temperature. In view of its catalytic applications, the vibrational properties of single crystal V6O13(001) above and below 150 K were examined using HREELS, with an instrumental resolution of 2.8 meV. A clean (001) surface was obtained by annealing the sample in O2 and subsequently in UHV. At room temperature, the energy loss spectrum was found to exhibit surface phonon losses superposed upon a free electron background, due to inefficient electron screening. Upon LN2 cooling below 150 K, the spectrum displayed considerable changes in both loss structure and electronic background. © 1998 American Vacuum Society. |
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Epitaxial TiN(001) Grown and Analyzed In situ by XPS and UPS. I. Analysis of As-deposited Layers Surf. Sci. Spectra 7, 193 (2000); http://dx.doi.org/10.1116/1.1365617 (11 pages)
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X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS) were used to characterize as-deposited epitaxial TiN(001) layers grown in situ. The films were deposited by ultrahigh vacuum reactive magnetron sputtering on MgO(001) at 850 °C in pure N2 discharges maintained at a pressure of 5 mTorr (0.67 Pa). Mg Kα and monochromatic Al Kα x-ray sources were used to obtain the XPS spectra, while the UPS data was generated by He I and He II UV radiation. The spectra show that the TiN(001) surfaces are free of O and C. The films were found to be stoichiometric in agreement with Rutherford backscattering spectroscopy (RBS) results, yielding a N/Ti ratio of 1.02±0.02. © 2000 American Vacuum Society. |
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Epitaxial CrN(001) Grown and Analyzed In situ by XPS and UPS. I. Analysis of As-deposited Layers Surf. Sci. Spectra 7, 250 (2000); http://dx.doi.org/10.1116/1.1367617 (12 pages)
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X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS) were used to characterize as-deposited epitaxial CrN(001) layers grown in situ. The films were deposited on MgO(001) at 650 °C in pure N2 discharges maintained at a pressure of 5 mTorr (0.67 Pa). Mg Kα and monochromatic Al Kα sources were used to obtain the XPS spectra, while the UPS data was generated by He I and He II UV radiation. Analysis of the results show that the CrN(001) surfaces are free of O and C. A distinct splitting of the Cr 2p3/2 line is also observed. The films were found to be stoichiometric with Rutherford backscattering spectroscopy (RBS) results, yielding a N/Cr ratio of 1.04±0.02. However, composition determined by XPS (N/Cr=0.73) show an excess of chromium. © 2000 American Vacuum Society. |
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A Mineral TiO2(001) Anatase Crystal Examined by XPS Surf. Sci. Spectra 9, 21 (2002); http://dx.doi.org/10.1116/11.20020701 (9 pages) Online Publication Date: 22 May 2003
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X-ray photoelectron spectroscopy measurements with Al Kα radiation of the Ti 2p, Ti 3p, O 1s, and O 2s core levels of a mineral anatase TiO2(001) crystal are presented. The weak Ti 3p and O 2s photopeaks were measured with two resolutions. The valence band is also presented. © 2003 American Vacuum Society. |
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Surf. Sci. Spectra 9, 260 (2002); http://dx.doi.org/10.1116/11.20020802 (6 pages) Online Publication Date: 12 March 2004
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Silane monolayers on silica, prepared from mono-, di-, and trichlorosilanes, are widely used in industry for surface functionalization and modification. However, unlike di- and trichlorosilanes, monochlorosilanes are particularly easy to work with because they can dimerize, but not polymerize, upon reaction with water. Typically, an organic solvent is used when depositing a silane monolayer. Here we show XPS spectra of monolayers of (Tridecafluoro-1,1,2,2-tetrahydrooctyl)-1-dimethylchlorosilane on silicon oxide (silicon wafer) prepared using a rapid, solvent-free approach. Reaction conditions are 60 °C for 10 min using the neat (pure) compound, and no inert atmosphere or special treatment of the compound is required. © 2004 American Vacuum Society. |
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